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Naveen V NairLansing, MI

Known as:
Naveen Nair

Naveen Nair Phones & Addresses

Lansing, MI   

East Lansing, MI   

Okemos, MI   

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Naveen Nair resumes & CV records

Resumes

Naveen Nair Photo 31

Post Doctoral Research Associate At Michigan State University

Location:
Lansing, Michigan Area
Industry:
Research
Naveen Nair Photo 32

Global Technology And Operations Director And Chief Of Staff To The Chief Technology Officer

Location:
Chicago, IL
Industry:
Oil & Energy
Work:
ANSYS, Inc. since Dec 2012
Senior R&D Engineer Michigan State University May 2010 - Nov 2012
Post Doctoral Research Associate Michigan State University - Department of Electrical and Computer Engineering Jan 2012 - May 2012
Instructor ECE 835 Michigan State University May 2003 - Sep 2010
Graduate Research Assistant Michigan State University May 2007 - Aug 2007
Instructor
Education:
Michigan State University 2003 - 2009
PhD, Electrical anc Computer Engineering Indian Institute of Technology, Madras 1998 - 2003
B.Tech, Mechanical Engineering Indian Institute of Technology, Madras 1998 - 2003
M.Tech, Mechanical Engineering (Heat Transfer)
Skills:
Matlab, Fortran, Numerical Analysis, Electromagnetics, Signal Processing, Algorithms, Integral Equations, Numerical Modeling, Surface Reconstructions, Inverse Problems, Mathematical Modeling, Pattern Recognition, Latex, Simulations, Experimentation, Comsol, Sensors, Ndt, Functional Analysis, Cfd, Machine Learning, C++, Research and Development, C, Applied Mathematics, Research, Testing
Interests:
Grooming
Diffusion Problems
Western Pleasure
Reining
Horse Training
Working Cow Horse
Fast Methods For Multi Body Problems
Diffusion Problems Horse Training
Integral Equations
Computational Electromagnetics
Inverse Problems
Languages:
Hindi
Naveen Nair Photo 33

Volunteer

Work:

Volunteer

Publications & IP owners

Us Patents

Eddy Current Inspection System

US Patent:
2010004, Feb 25, 2010
Filed:
Jan 24, 2008
Appl. No.:
12/011208
Inventors:
Satish Udpa - Okemos MI, US
Lalita Udpa - Okemos MI, US
Naveen V. Nair - East Lansing MI, US
Vikram Reddy Melapudi - East Lansing MI, US
Assignee:
Board of Trustees of Michigan State University - East Lansing MI
International Classification:
G01R 33/18
G01R 33/02
US Classification:
324209, 324248
Abstract:
An innovative method is provided for assessing structural integrity of a sample. The method comprises: capturing a signal indicative of magnetic flux density caused by an Eddy current flowing in the sample; extracting an envelope of the captured signal using a demodulation scheme; sampling the envelope at a frequency that is lower than the frequency of the excitation current signal which generated the Eddy current; and examining the sampled envelope to assess structural integrity of the sample.

Possible Relatives

A Nair  Daniel K Nair  Girish Nair  Heather D Nair  Jalaja M Nair  Kesavan K Nair  Lekshmi S Nair  Naveen C Rao  Naveen K Dewan  Naveen K Gupta 

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