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Paul LarsonInglewood, FL

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Jennifer L Katzenberger 52 Elissa Marie Larson 43 Jane J Larson 83 Jared Michael Larsen 43 Natalie Gayle French 58

Paul Larson Phones & Addresses

Englewood, FL   

Forest Lake, MN   

Forest Lake, MN   

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Career records & work history

Real Estate Brokers

Paul Larson Photo 1

Paul Larson, Wayzata MN - Agent

Work:
Coldwell Banker Burnet
Wayzata, MN
612-7231000 (Phone)

Medicine Doctors

Paul S. Larson

Specialties:
Surgery , Neurological
Work:
University Of California San Francisco Medical Center Neurosurgery Center
400 Parnassus Ave STE A808, San Francisco, CA 94143
415-3537500 (phone) 415-3532889 (fax)
UCSF Neurological Surgery
505 Parnassus Ave STE M779, San Francisco, CA 94143
415-3533904 (phone) 415-3533907 (fax)
Education:
Medical School
University of Arizona College of Medicine at Tucson
Graduated: 1995
Procedures:
Craniotomy, Spinal Cord Surgery
Conditions:
Intracranial Injury, Intervertebral Disc Degeneration
Languages:
English
Description:
Dr. Larson graduated from the University of Arizona College of Medicine at Tucson in 1995. He works in San Francisco, CA and 1 other location and specializes in Surgery , Neurological. Dr. Larson is affiliated with UCSF Medical Center Parnassus.

Paul Larson

Specialties:
Family Medicine
Work:
New Kensington Family Health Center
301 11 St STE C, New Kensington, PA 15068
724-3343640 (phone)
Education:
Medical School
University of Massachusetts Medical School
Graduated: 2002
Procedures:
Circumcision, Arthrocentesis, Vaccine Administration
Conditions:
Acute Upper Respiratory Tract Infections, Chronic Bronchitis, Gastroesophageal Reflux Disease (GERD), Migraine Headache, Overweight and Obesity, Acute Pharyngitis, Alopecia Areata, Bell's Palsy, Bipolar Disorder, Breast Disorders, Bronchial Asthma, Constipation, Contact Dermatitis, Diabetes Mellitus (DM), Disorders of Lipoid Metabolism, Diverticulitis, Gastritis and Duodenitis, Genital HPV, Hypertension (HTN), Hyperthyroidism, Hypothyroidism, Irritable Bowel Syndrome (IBS), Obstructive Sleep Apnea, Osteoarthritis, Otitis Media, Rheumatoid Arthritis, Skin and Subcutaneous Infections, Substance Abuse and/or Dependency, Urinary Tract Infection (UT)
Languages:
English, Spanish
Description:
Dr. Larson graduated from the University of Massachusetts Medical School in 2002. He works in New Kensington, PA and specializes in Family Medicine. Dr. Larson is affiliated with Childrens Hospital Of Pittsburgh Of UPMC, Magee Womens Hospital Of UPMC and UPMC St Margaret.

Paul D. Larson

Specialties:
Internal Medicine
Work:
Fairview Physician AssociatesFairview Northland Clinic
919 Northland Dr, Princeton, MN 55371
763-3893344 (phone) 763-3896577 (fax)
Site
Education:
Medical School
University of Minnesota Medical School at Minneapolis
Graduated: 2001
Conditions:
Diabetes Mellitus (DM), Disorders of Lipoid Metabolism, Hypertension (HTN), Substance Abuse and/or Dependency, Abdominal Hernia, Acute Bronchitis, Acute Pharyngitis, Acute Sinusitis, Acute Upper Respiratory Tract Infections, Anemia, Anxiety Dissociative and Somatoform Disorders, Anxiety Phobic Disorders, Atrial Fibrillation and Atrial Flutter, Benign Polyps of the Colon, Benign Prostatic Hypertrophy, Bronchial Asthma, Calculus of the Urinary System, Chronic Renal Disease, Constipation, Contact Dermatitis, Diabetic Peripheral Neuropathy, Erectile Dysfunction (ED), Esophagitis, Fractures, Dislocations, Derangement, and Sprains, Gastroesophageal Reflux Disease (GERD), Glaucoma, Gout, Hearing Loss, Heart Failure, Hemorrhoids, Herpes Zoster, Hypothyroidism, Iron Deficiency Anemia, Irritable Bowel Syndrome (IBS), Ischemic Heart Disease, Menopausal and Postmenopausal Disorders, Migraine Headache, Multiple Sclerosis (MS), Osteoarthritis, Osteoporosis, Peripheral Nerve Disorders, Phlebitis and Thrombophlebitis, Prostatitis, Psoriasis, Pulmonary Embolism, Restless Leg Syndrome, Rheumatoid Arthritis, Skin and Subcutaneous Infections, Tension Headache, Urinary Incontinence, Varicose Veins, Venous Embolism and Thrombosis, Vitamin D Deficiency
Languages:
English, Spanish
Description:
Dr. Larson graduated from the University of Minnesota Medical School at Minneapolis in 2001. He works in Princeton, MN and specializes in Internal Medicine. Dr. Larson is affiliated with Fairview Northland Medical Center and Maple Grove Hospital.

Paul R. Larson

Specialties:
Child & Adolescent Psychiatry
Work:
Behavioral Medicine Center
721 American Ave STE 501, Waukesha, WI 53188
262-9282396 (phone) 262-9285096 (fax)
Education:
Medical School
University of South Dakota Sanford School of Medicine
Graduated: 1996
Conditions:
Anxiety Dissociative and Somatoform Disorders, Anxiety Phobic Disorders, Attention Deficit Disorder (ADD), Autism, Bipolar Disorder, Depressive Disorders, Obsessive-Compulsive Disorder (OCD), Post Traumatic Stress Disorder (PTSD)
Languages:
English, Spanish
Description:
Dr. Larson graduated from the University of South Dakota Sanford School of Medicine in 1996. He works in Waukesha, WI and specializes in Child & Adolescent Psychiatry. Dr. Larson is affiliated with Oconomowoc Memorial Hospital and Waukesha Memorial Hospital.

Paul A. Larson

Specialties:
Radiology, Diagnostic Radiology
Work:
Radiology Associates Of The Fox Valley SC
430 E Division St, Fond du Lac, WI 54935
920-8867525 (phone) 920-7227454 (fax)
Radiology Associates Of Fox Valley
333 N Commercial St STE 100, Neenah, WI 54956
920-9671000 (phone) 920-7227454 (fax)
Education:
Medical School
University of Connecticut School of Medicine
Graduated: 1982
Languages:
English
Description:
Dr. Larson graduated from the University of Connecticut School of Medicine in 1982. He works in Fond Du Lac, WI and 1 other location and specializes in Radiology and Diagnostic Radiology. Dr. Larson is affiliated with Mercy Medical Center, Saint Elizabeth Hospital, St Agnes Hospital and Theda Care Regional Medical Center.

Paul C. Larson

Specialties:
Diagnostic Radiology
Work:
Radiology Associates Of Southwest Louisiana
3704 North Blvd STE 1, Alexandria, LA 71301
318-4459700 (phone) 318-4730003 (fax)
Education:
Medical School
Louisiana State University School of Medicine at New Orleans
Graduated: 1980
Languages:
English
Description:
Dr. Larson graduated from the Louisiana State University School of Medicine at New Orleans in 1980. He works in Alexandria, LA and specializes in Diagnostic Radiology. Dr. Larson is affiliated with Christus Saint Francis Cabrini Hospital and Rapides Regional Medical Center.

License Records

Paul D Larson

Licenses:
License #: E-6434 - Expired
Category: Engineering Intern

Paul A Larson

Licenses:
License #: 30879 - Expired
Category: Dual Towing Operator(IM)/VSF Employee
Expiration Date: Jun 9, 2016

Paul Douglas Larson

Licenses:
License #: 9709 - Expired
Category: Nursing
Issued Date: May 19, 2016
Effective Date: Jul 19, 2016
Expiration Date: Jul 19, 2016
Type: Registered Nurse - Temporary

Paul Larson

Licenses:
License #: EMT16657 - Active
Category: Emergency Medical Services
Issued Date: Aug 12, 2015
Expiration Date: Dec 31, 2018
Type: Emergency Medical Technician

Paul S. Larson

Phone:
502-6295510 (Work)
Licenses:
License #: 32221 - Expired
Category: Neurological Surgery
Type: Resident/Fellow

Paul Larson resumes & CV records

Resumes

Paul Larson Photo 56

Paul Larson - Wenatchee, WA

Work:
Confluence Health Aug 2013 to 2000
Family Nurse Practitioner Fairview Express Care - Elk River, MN Mar 2007 to Jul 2013
Family Nurse Practitioner North Memorial Urgent Care - Roseville, MN Mar 2000 to Jul 2013
Family Nurse Practitioner Quello Clinic - Bloomington, MN Apr 1996 to Mar 2000
Family Nurse Practitioner Bloomington Care Center - Bloomington, MN Jan 1991 to Aug 1994
Certified Nursing Assistant Arthritis Foundation-Minnesota Chapter - Minneapolis, MN Sep 1990 to Sep 1991
Health Educator
Education:
University of Tennessee at Knoxville - Knoxville, TN Aug 1994 to Dec 1995
MSN Luther College - Decorah, IA Aug 1986 to May 1990
Bachelor of Arts in Health Education
Paul Larson Photo 57

Paul Larson - Minneapolis, MN

Work:
Independent Dec 2010 to Present
Sr. Consultant US Bank Oct 2007 to Dec 2010
Manager Loose Change, Inc Jun 2005 to Sep 2007
Co-owner Information Management Specialist, Federal Highway Administration - Minneapolis, MN Oct 2002 to Jul 2005 Concept Group, Inc - Saint Paul, MN Jun 2001 to Apr 2002
Interactive Department Manager Anderson Consulting - Minneapolis, MN Oct 2000 to Mar 2001
Senior Project Manager techies.com - Minneapolis, MN May 1998 to Oct 2000
Senior Producer, Lead Interactive Architect Merrill Corporation - Saint Paul, MN Apr 1992 to May 1998
Project Manager, Print and e-docs
Skills:
Strategic Marketing Analysis, User Centered Design, Department Management, Planning, Interactive Design, Information Architecture, Prototyping
Paul Larson Photo 58

Paul Larson - Hudson, WI

Work:
Wells Fargo 2009 to 2000
contractor for Systems Integration Solutions Unisys Corporation - Eagan, MN 2006 to 2009
NetBackup Storage Engineer - Global Outsourcing and Infrastructure Services EMC Corporation - Eagan, MN 2005 to 2006
contractor at U.S. Postal Service Veritas Software Corporation - Roseville, MN 2001 to 2005
Software Certification Engineer NCR CORPORATION 1996 to 2000
System Engineer NCR CORPORATION 1996 to 2000
Certification Engineer NCR CORPORATION 1980 to 1996
Senior Engineering Technician SPERRY UNIVAC - Roseville, MN 1977 to 1980
System Test Engineer
Education:
Northeast Metro Technical College - White Bear Lake, MN
Associates in Electro-Mechanical Technician

Publications & IP owners

Us Patents

Nondestructive Characterization Of Thin Films Using Measured Basis Spectra

US Patent:
6800852, Oct 5, 2004
Filed:
Dec 27, 2002
Appl. No.:
10/330383
Inventors:
Paul E. Larson - Bloomington MN
David G. Watson - Eden Prairie MN
John F. Moulder - Bloomington MN
Assignee:
ReVera Incorporated - Sunnyvale CA
International Classification:
G01N 2300
US Classification:
250305, 438 50
Abstract:
The present invention provides for characterization of a film (e. g. , thickness determination for a silicon oxynitride film) using a comparison process (e. g. , a fitting process) to compare measured peak shapes for elemental and/or chemical species (e. g. , Si peak shapes previously measured for a particular process to be monitored) to collected spectral data (e. g. , using a non-linear least squares fitting algorithm).

Nondestructive Characterization Of Thin Films Based On Acquired Spectrum

US Patent:
6891158, May 10, 2005
Filed:
Dec 27, 2002
Appl. No.:
10/330317
Inventors:
Paul E. Larson - Bloomington MN, US
David G. Watson - Eden Prairie MN, US
Assignee:
ReVera Incorporated - Sunnyvale CA
International Classification:
G01B015/02
US Classification:
250305, 250307, 250306, 378 50
Abstract:
The present invention provides for characterization of a film (e. g. , thickness determination for a silicon oxynitride film) using collected spectral data. For example, an acquired spectrum may be cumulatively integrated and the geometric properties of the integrated spectrum may be used to determine component concentration information. Thickness measurements for the film may be provided based on the component concentration information.

System And Method For Depth Profiling And Characterization Of Thin Films

US Patent:
7449682, Nov 11, 2008
Filed:
Oct 24, 2002
Appl. No.:
10/493492
Inventors:
Paul E. Larson - Bloomington MN, US
John F. Moulder - Bloomington MN, US
David G. Watson - Eden Prairie MN, US
David S. Perloff - Los Altos Hills CA, US
Assignee:
Revera Incorporated - Sunnyvale CA
International Classification:
H01J 49/00
US Classification:
250281, 250309, 378 45
Abstract:
Characterization of a sample, e. g. , a depth profile, may be attained using one or more of the following parameters in an electron spectroscopy method or system. The one or more parameters may include using low ion energy ions for removing material from the sample to expose progressively deeper layers of the sample, using an ion beam having a low ion angle to perform such removal of sample material, and/or using an analyzer positioned at a high analyzer angle for receiving photoelectrons escaping from the sample as a result of x-rays irradiating the sample. Further, a correction algorithm may be used to determine the concentration of components (e. g. , elements and/or chemical species) versus depth within the sample, e. g. , thin film formed on a substrate. Such concentration determination may include calculating the concentration of components (e.

Sample Holder Apparatus To Reduce Energy Of Electrons In An Analyzer System And Method

US Patent:
8071942, Dec 6, 2011
Filed:
Feb 12, 2010
Appl. No.:
12/705261
Inventors:
David G. Watson - Eden Prairie MN, US
Paul E. Larson - Bloomington MN, US
Dennis F. Paul - Eden Prairie MN, US
Ronald E. Negri - Minnetonka MN, US
Assignee:
Physical Electronics USA, Inc. - Chanhassen MN
International Classification:
H01J 49/44
H01J 49/06
G21K 1/00
US Classification:
250305, 250310, 250396 R, 2505051, 25044011, 7386491
Abstract:
A sample holder apparatus and method for reducing the energy of charged particles entering an annular-acceptance analyzer includes use of an electrically isolated sample support member having a sample receiving surface configured to receive a sample and electrically connect the sample to the sample support member (e. g. , wherein the sample support member is configured for application of a retarding bias potential). A grounded sample aperture member defining an aperture relative to the sample support member but electrically isolated therefrom is provided such that the aperture is proximate the sample receiving surface to expose at least a portion of a surface of a sample received thereon to be analyzed (e. g. , wherein applying a retarding bias potential to the sample support member produces an electrical retarding field about the aperture that reduces the energy of emitted particles from a sample before they enter an annular-acceptance analyzer).

System And Method For Characterization Of Thin Films

US Patent:
2003008, May 1, 2003
Filed:
Oct 26, 2001
Appl. No.:
10/003224
Inventors:
Paul Larson - Bloomington MN, US
John Moulder - Bloomington MN, US
David Watson - Eden Prairie MN, US
David Perloff - Los Altos Hills CA, US
Assignee:
Physical Electronics, Inc. - Eden Prairie MN
International Classification:
G01N023/227
US Classification:
250/306000, 250/307000
Abstract:
Characterization of a sample, e.g., determination of a component's concentration in a thin film, may be attained by providing calibration information representative of surface spectrum measurements for a plurality of samples correlated with depth profile information for the plurality of samples. The plurality of samples are formed under a same set of process conditions. One or more surface spectrum measurements are provided for a sample to be characterized that also was formed under the same set of process conditions. At least one characteristic of the sample to be characterized (e.g., concentration of a component) is determined based on the one or more surface spectrum measurements for the sample to be characterized and the calibration information.

System And Method For Depth Profiling

US Patent:
2003008, May 1, 2003
Filed:
Oct 26, 2001
Appl. No.:
10/075571
Inventors:
David Watson - Eden Prairie MN, US
Paul Larson - Bloomington MN, US
Assignee:
Physical Electronics, Inc. - Eden Prairie MN
International Classification:
G01N023/227
US Classification:
250/306000, 250/307000
Abstract:
Characterization of a sample, e.g., a depth profile, may be attained using one or more of the following parameters in an electron spectroscopy method or system. The one or more parameters may include using low ion energy ions for removing material from the sample to expose progressively deeper layers of the sample, using an ion beam having a low ion angle to perform such removal of sample material, and/or using an analyzer positioned at a high analyzer angle for receiving photoelectrons escaping from the sample as a result of x-rays irradiating the sample. Further, a correction algorithm may be used to determine the concentration of components (e.g., elements and/or chemical species) versus depth within the sample, e.g., thin film formed on a substrate. Such concentration determination may include calculating the concentration of components (e.g, elements and/or chemical species) at each depth of a depth profile by removing from depth profile data collected at a particular depth (i.e., the depth for which concentration is to be calculated) concentration contributions attributable to deeper depths of the sample.

Apparatus And Method For Locating Target Area For Electron Microanalysis

US Patent:
5118941, Jun 2, 1992
Filed:
Apr 23, 1991
Appl. No.:
7/690870
Inventors:
Paul E. Larson - Bloomington MN
Assignee:
The Perkin-Elmer Corporation - Norwalk CT
International Classification:
H01J 37256
US Classification:
250310
Abstract:
Target area on a specimen surface is located in an electron microanalyzer system that includes an electron energy analyzer and an analyzer detector. An electron gun impinges a rastering beam of incident electrons across the surface, a secondary electron detector provides corresponding signals for producing a scanning electron microscope image of the surface. Backscattered electrons effected from the incident electrons are passed through the analyzer for producing a further image that is superimposed on the SEM image to locate the target area to be subject to a separate microanalysis. Particularly for an electrically insulating specimen surface, the images are produced in a single frame of rastering, and surface area and beam current are sufficient to produce the images without substantial charge buildup.

Control Of Surface Potential Of Insulating Specimens In Surface Analysis

US Patent:
5990476, Nov 23, 1999
Filed:
Nov 12, 1997
Appl. No.:
8/968454
Inventors:
Paul E. Larson - Bloomington MN
Michael A. Kelly - Portola Valley CA
Assignee:
Physical Electronics Inc - Eden Prairie MN
International Classification:
H05H 300
H01J 3726
US Classification:
250251
Abstract:
An apparatus effects a uniform surface potential on an insulating specimen in an x-ray photoelectron or a secondary ion emission instrument in which there is positive charging of an irradiation region. An area of the specimen including the irradiation region is flooded with a beam of low energy electrons to neutralize the positive charging, causing negative charging of the flooding area. Positive ions are directed onto the flooding area to neutralize the negative charging. The electron beam has an energy less than about 2 eV and an energy spread less than about 0. 5 eV. The ratio of the beam distance to its diameter is less than about 10. The ions have an energy less than 10 eV.

Isbn (Books And Publications)

An American Musical Dynasty: A Biography Of The Wolle Family Of Bethlehem, Pennsylvania

Author:
Paul Larson
ISBN #:
0934223688

St. Paul'S Architecture: A History

Author:
Paul Clifford Larson
ISBN #:
0816635900

Cap Wigington: An Architectural Legacy In Ice And Stone

Author:
Paul Clifford Larson
ISBN #:
0873514157

The Stationary Tower: Notes On A Course Given By W. Hugh Woodin

Author:
Paul B. Larson
ISBN #:
0821836048

Possible Relatives

Cynthia M Larson  David Larson  Davin M Larson  Dawn Larson  Dawne D Larson  Dayna J Larson  Deanna M Larson  Paul M Johnson  Paul Stamps  Paul B Stanaway 

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