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Peter M Calandra, 855 Maplevale Rd, East Kingston, NH 03827

Peter Calandra Phones & Addresses

5 Maplevale Rd, East Kingston, NH 03827    603-3475015   

Fort Pierce, FL   

16 Harvard Way, Newbury, MA 01951   

126 Merrimac St, Newburyport, MA 01950   

North Reading, MA   

Beverly, MA   

Andover, MA   

Needham, MA   

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Peter Calandra

Peter Calandra is a New York City based composer and pianist. He played piano and conducted the original Off Broadway version of Little Shop Of Horrors, played

Us Patents

System And Method For Automatically Purifying Solvents

US Patent:
2005002, Feb 3, 2005
Filed:
Jul 28, 2003
Appl. No.:
10/629027
Inventors:
Peter Calandra - Hampton Falls NH, US
International Classification:
B01D011/00
US Classification:
210634000, 095001000, 096240000, 210143000, 210257100, 210406000, 210497010
Abstract:
A system for automatically purifying solvents has a solvent holding portion having at least one solvent stored therein, a filter holding portion having at least one filter tube located therein, a peripheral device, and a computer. The computer has a memory and a processor, and the processor is configured by the memory to perform the steps of: receiving an electronic selection of a solvent to be automatically purified; automatically causing the flow of the electronically selected solvent from the solvent holding portion to the at least one filter tube; and automatically filling a collection vessel with the purified solvent.

Angle Dispersive X-Ray Spectrometer

US Patent:
5923720, Jul 13, 1999
Filed:
Jun 17, 1997
Appl. No.:
8/877736
Inventors:
Scott W. Barton - Newburyport MA
Peter M. Calandra - Newburyport MA
Assignee:
Molecular Metrology, Inc. - Newburyport MA
International Classification:
G21K 106
US Classification:
378 84
Abstract:
An x-ray spectrometer is provided comprising an X-ray source, a curved crystal monochromator which focuses a monochromatic x-ray beam onto a sample surface, the curved crystal monochromator comprising a shape which is substantially identical to a logarithmic spiral, and a position-sensitive x-ray detector. A method of measuring diffraction intensities from oriented samples in real time including providing an x-ray spectrometer comprising an X-ray source, a curved crystal monochromator which focuses a monochromatic x-ray beam onto a sample surface, the curved monochromator comprising the shape of a logarithmic spiral, and a position-sensitive x-ray detector; and providing a crystallographically oriented sample, exposing the sample to the focused x-ray beam of the x-ray spectrometer; and measuring the diffraction intensity at the position-sensitive detector.

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