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Peter F RoperFairfield, CT

Peter Roper Phones & Addresses

Fairfield, CT   

Hoboken, NJ   

10 Spring St, Camden, ME 04843    207-2360074    207-2364906   

13 Spring St, Camden, ME 04843    207-2364398   

10 Spring St, Camden, ME 04843    207-2360074   

Work

Position: Professional/Technical

Education

Degree: Associate degree or higher

Mentions for Peter F Roper

Peter Roper resumes & CV records

Resumes

Peter Roper Photo 32

Peter Roper

Location:
United States
Peter Roper Photo 33

Peter Roper

Location:
United States

Publications & IP owners

Us Patents

Elimination Of Photo-Induced Electrochemical Dissolution In Chemical Mechanical Polishing

US Patent:
6251787, Jun 26, 2001
Filed:
Feb 28, 2000
Appl. No.:
9/514867
Inventors:
Daniel C. Edelstein - New Rochelle NY
Wilma J. Horkans - Ossining NY
Stephen E. Luce - Underhill VT
Naftall E. Lustig - Croton on Hudson NY
Keith R. Pope - Danbury CT
Peter D. Roper - Clinton Corners NY
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H01L 2100
US Classification:
438692
Abstract:
Eliminating exposure of PN junctions to light capable of invoking a photovoltaic effect and/or inhibiting the oxidation and reduction reactions induced by the photovoltaic effect prevents the electrochemical dissolution of metal components on semiconductor devices by electrolysis. A darkened enclosure for use on tools for wafer CMP, brush cleaning, unloading, and rinsing will eliminate exposure. Alternatively, illumination of a semiconductor wafer can be limited to wavelengths of light that do not provide enough energy to induce a photovoltaic effect. An inhibitor in the CMP slurry and/or post-CMP water rinse blocks the oxidation and/or reduction reactions. A blocking agent, such as a high molecular weight surfactant, will interfere with both the oxidation and reduction reactions at the metal surface. Also, a poisoning agent will impede the reduction portion of electrolysis.

Indoor And Outdoor Cloth Farm

US Patent:
4713909, Dec 22, 1987
Filed:
Mar 29, 1982
Appl. No.:
6/363292
Inventors:
Peter Roper - Bronx NY
George Spector - New York NY
International Classification:
A01G 902
US Classification:
47 17
Abstract:
A farm structure for growing plants or crop in a small area or increasing an area for farming, composed of several tiers of cloth, one above another, each cloth supporting a quantity of earth in which plants are growing; water used in watering plants on the uppermost tier, dripping downward successively through at the tiers, so to water the plants in each tier; extra layers of cloth snapped under any tier for greater water retention, flood lights under each tier, giving light to plants in a tier therebelow and warming a soil thereabove, and an elevator mechanism for lowering the tiers of a large outdoor model, so that harvesting can be done more efficiently at a ground level.

Elimination Of Photo-Induced Electrochemical Dissolution In Chemical Mechanical Polishing

US Patent:
6153043, Nov 28, 2000
Filed:
Feb 6, 1998
Appl. No.:
9/020010
Inventors:
Daniel C. Edelstein - New Rochelle NY
Wilma J. Horkans - Ossining NY
Stephen E. Luce - Underhill VT
Naftali E. Lustig - Croton on Hudson NY
Keith R. Pope - Danbury CT
Peter D. Roper - Clinton Corners NY
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
C23F 102
US Classification:
156345
Abstract:
Eliminating exposure of PN junctions to light capable of invoking a photovoltaic effect and/or inhibiting the oxidation and reduction reactions induced by the photovoltaic effect prevents the electrochemical dissolution of metal components on semiconductor devices by electrolysis. A darkened enclosure for use on tools for wafer CMP, brush cleaning, unloading, and rinsing will eliminate exposure. Alternatively, illumination of a semiconductor wafer can be limited to wavelengths of light that do not provide enough energy to induce a photovoltaic effect. An inhibitor in the CMP slurry and/or post-CMP water rinse blocks the oxidation and/or reduction reactions. A blocking agent, such as a high molecular weight surfactant, will interfere with both the oxidation and reduction reactions at the metal surface. Also, a poisoning agent will impede the reduction portion of electrolysis.

Isbn (Books And Publications)

Applications Of Reference Materials In Analytical Chemistry

Author:
Peter Roper
ISBN #:
0854044485

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