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Qing Liu, 382930 Roma Ct, Santa Clara, CA 95051

Related to:
Jack P Liu 58 Jing Li 41

Qing Liu Phones & Addresses

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Baltimore, MD   

Dallas, TX   

Richardson, TX   

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Career records & work history

Medicine Doctors

Qing Liu

Specialties:
Internal Medicine
Work:
IPC Healthcare
111 Continental Dr STE 406, Newark, DE 19713
302-3682630 (phone) 302-3681271 (fax)
Site
Education:
Medical School
University of Illinois, Chicago College of Medicine
Graduated: 2000
Languages:
English
Description:
Dr. Liu graduated from the University of Illinois, Chicago College of Medicine in 2000. He works in Newark, DE and specializes in Internal Medicine. Dr. Liu is affiliated with Christiana Hospital, Saint Francis Healthcare and Wilmington Hospital.

Qing Liu

Specialties:
Anesthesiology
Work:
East Manhattan Anesthesia Partners
310 E 14 St, New York, NY 10003
212-9794464 (phone) 212-6148233 (fax)
Site
Education:
Medical School
Cornell University Weill Medical College
Graduated: 2001
Languages:
Chinese, English, Russian, Spanish
Description:
Dr. Liu graduated from the Cornell University Weill Medical College in 2001. She works in New York, NY and specializes in Anesthesiology. Dr. Liu is affiliated with New York Eye & Ear Infirmary Of Mount Sinai.
Qing Liu Photo 1

Qing Yan Liu

Qing Liu Photo 2

Qing Liu

Specialties:
Internal Medicine
Hospitalist
Education:
Shanghai First Medical College (1988)

License Records

Qing Mei Liu

Licenses:
License #: PTC.021858 - Expired
Issued Date: Sep 10, 2014
Expiration Date: Mar 10, 2016
Type: Pharmacy Technician Candidate

Qing An Liu

Licenses:
License #: FMC03892 - Expired
Category: Food Safety
Issued Date: Apr 26, 1996
Expiration Date: Jan 31, 1999
Type: Certified Food Safety Mgr

Qing Liu resumes & CV records

Resumes

Qing Liu Photo 34

Qing Liu - Columbia, MD

Work:
Leibniz Institute for Catalysis at the University of Rostock (LIKAT Rostock) for Henkel Projects Apr 2014 to 2000
Research Group Leader and Coordinator Henkel Adhesive PD group - Mentor, OH Feb 2013 to Dec 2013
Technical Management Intern
Education:
University of Maryland - College Park, MD 2012
Ph. D. in Chemistry Nankai University Jun 2008
B.S. in Polymer Chemistry
Qing Liu Photo 35

Qing Liu - Farmingdale, NY

Work:
Self-Employed Apr 2011 to Present Bank of China - New York, NY Apr 2010 to Apr 2011
Temporary Clerk, Compliance, New Accounts Bank of China - Qingdao, CN Jun 2009 to Aug 2009
Risk Management Assistant/Intern Insurance Services - Monterey Park, CA Jun 2007 to Aug 2007
Office Assistant Recursion Software, Inc - Frisco, TX Sep 2003 to Dec 2003
Associate Programmer/Intern
Education:
Claremont Graduate University - Claremont, CA 2010
M.S. in Financial Engineering University of Texas at Dallas - Richardson, TX 2004
B.S. in Computer Science
Skills:
Microsoft Office, Word, Excel, Powerpoint, HTML, C/C++, Crystal Report

Publications & IP owners

Us Patents

Methods For Characterizing Dielectric Properties Of Parts

US Patent:
7777500, Aug 17, 2010
Filed:
Sep 29, 2008
Appl. No.:
12/240414
Inventors:
Jaehyun Kim - Fremont CA, US
Arthur H. Sato - San Jose CA, US
Keith Comendant - Fremont CA, US
Qing Liu - Austin TX, US
Feiyang Wu - San Francisco CA, US
Assignee:
Lam Research Corporation - Fremont CA
International Classification:
G01R 27/26
US Classification:
324663, 324639
Abstract:
Characterizing dielectric properties of a part includes placing a full-sized part within a dielectric property measurement apparatus. In one embodiment, the full-sized part is a dielectric part of a plasma processing system. The dielectric property measurement apparatus is operated to determine a dielectric constant value of the full-sized part and a loss tangent value of the full-sized part. The determined dielectric constant and loss tangent values are affixed to the full-sized part.

Methods For Measuring Dielectric Properties Of Parts

US Patent:
7911213, Mar 22, 2011
Filed:
Sep 29, 2008
Appl. No.:
12/240375
Inventors:
Jaehyun Kim - Fremont CA, US
Arthur H. Sato - San Jose CA, US
Keith Comendant - Fremont CA, US
Qing Liu - Austin TX, US
Feiyang Wu - San Francisco CA, US
Assignee:
Lam Research Corporation - Fremont CA
International Classification:
G01R 27/26
US Classification:
324671, 324663
Abstract:
A method is disclosed for calibrating a capacitance of an apparatus for measuring dielectric properties of a part. The apparatus includes an electrically grounded chamber, a lower electrode disposed within the chamber and connected to a radiofrequency (RF) transmission rod, an electrically grounded upper electrode disposed within the chamber above the lower electrode, and a variable capacitor connected to control transmission of RF power through the RF transmission rod to the lower electrode. A method is also disclosed for determining a capacitance of a part through use of the apparatus. A method is also disclosed for determining a dielectric constant of a part through use of the apparatus. A method is also disclosed for determining a loss tangent of a part through use of the apparatus.

Methods For Measuring Dielectric Properties Of Parts

US Patent:
7973539, Jul 5, 2011
Filed:
Feb 17, 2011
Appl. No.:
13/030015
Inventors:
Jaehyun Kim - Fremont CA, US
Arthur H. Sato - San Jose CA, US
Keith Comendant - Fremont CA, US
Qing Liu - Austin TX, US
Feiyang Wu - San Francisco CA, US
Assignee:
Lam Research Corporation - Fremont CA
International Classification:
G01R 35/00
G01R 31/00
US Classification:
324601, 32475002
Abstract:
A method is disclosed for calibrating a capacitance of an apparatus for measuring dielectric properties of a part. The apparatus includes an electrically grounded chamber, a lower electrode disposed within the chamber and connected to a radiofrequency (RF) transmission rod, an electrically grounded upper electrode disposed within the chamber above the lower electrode, and a variable capacitor connected to control transmission of RF power through the RF transmission rod to the lower electrode. A method is also disclosed for determining a capacitance of a part through use of the apparatus. A method is also disclosed for determining a dielectric constant of a part through use of the apparatus. A method is also disclosed for determining a loss tangent of a part through use of the apparatus.

Apparatus For Measuring Dielectric Properties Of Parts

US Patent:
8269510, Sep 18, 2012
Filed:
Sep 29, 2008
Appl. No.:
12/240291
Inventors:
Jaehyun Kim - Fremont CA, US
Arthur H. Sato - San Jose CA, US
Keith Comendant - Fremont CA, US
Qing Liu - Austin TX, US
Feiyang Wu - San Francisco CA, US
Assignee:
Lam Research Corporation - Fremont CA
International Classification:
G01R 27/26
US Classification:
324671, 324663
Abstract:
A chamber formed from an electrically conductive material is connected to a ground potential. A hot electrode formed from an electrically conductive material is disposed within the chamber in a substantially horizontal orientation and is physically separated from the chamber. The hot electrode includes a top surface defined to support a part to be measured. A radiofrequency (RF) transmission rod is connected to extend from a bottom surface of the hot electrode through an opening in a bottom of the chamber and be physically separated from the chamber. The RF transmission rod is defined to transmit RF power from a conductor plate in an electrical components housing to the hot electrode. An upper electrode formed from an electrically conductive material is disposed within the chamber in a substantially horizontal orientation. The upper electrode is electrically connected to the chamber and is defined to be movable in a vertical direction.

Electrode For Use In Measuring Dielectric Properties Of Parts

US Patent:
8519724, Aug 27, 2013
Filed:
Sep 29, 2008
Appl. No.:
12/240329
Inventors:
Jaehyun Kim - Fremont CA, US
Arthur H. Sato - San Jose CA, US
Keith Comendant - Fremont CA, US
Qing Liu - Austin TX, US
Feiyang Wu - San Francisco CA, US
Assignee:
Lam Research Corporation - Fremont CA
International Classification:
G01R 27/26
US Classification:
324663, 324637, 324639, 324601, 15634529, 15634547, 438 17
Abstract:
A plate of substantially uniform thickness is formed from an electrically conductive material. The plate has a top surface defined to support a part to be measured. The plate has a bottom surface defined to be connected to a radiofrequency (RF) transmission rod such that RF power can be transmitted through the RF transmission rod to the plate. The plate is defined to have a number of holes cut vertically through the plate at a corresponding number of locations that underlie embedded conductive material items in the part to be measured when the part is positioned on the top surface of the plate.

Electrode For Use In Measuring Dielectric Properties Of Parts

US Patent:
2013024, Sep 19, 2013
Filed:
Apr 22, 2013
Appl. No.:
13/867961
Inventors:
Arthur H. Sato - San Jose CA, US
Keith Comendant - Fremont CA, US
Qing Liu - Austin TX, US
Feiyang Wu - San Francisco CA, US
Assignee:
Lam Research Corporation - Fremont CA
International Classification:
G01N 27/04
US Classification:
324693
Abstract:
A plate of substantially uniform thickness is formed from an electrically conductive material. The plate has a top surface defined to support a part to be measured. The plate has a bottom surface defined to be connected to a radiofrequency (RF) transmission rod such that RF power can be transmitted through the RF transmission rod to the plate. The plate is defined to have a number of holes cut vertically through the plate at a corresponding number of locations that underlie embedded conductive material items in the part to be measured when the part is positioned on the top surface of the plate.

Wireless Pairing And Communication Between Devices Using Biometric Data

US Patent:
2014006, Mar 6, 2014
Filed:
Aug 31, 2012
Appl. No.:
13/601829
Inventors:
Chang Zhang - San Jose CA, US
Qing Liu - Mountain View CA, US
Assignee:
Apple Inc. - Cupertino CA
International Classification:
G06F 21/00
US Classification:
726 5
Abstract:
In a first implementation, a host determines to pair with a device and transmits biometric data for a user to the device. The device receives the transmitted biometric data and compares such to device biometric data to determine whether or not to pair with the host and/or what data stored by the device to allow the host to access. The host then accesses data of the device to which the device has allowed access. In another implementation, a device determines to pair with a host and transmits biometric data for a user to the host. The host receives the transmitted biometric data and compares such to device biometric data to determine whether or not to pair with the device and/or what data stored by the host to allow the device to access. The device then accesses data of the host to which the host has allowed access.

Battery Charging With Reused Inductor For Boost

US Patent:
2018010, Apr 12, 2018
Filed:
Dec 6, 2017
Appl. No.:
15/833577
Inventors:
- Cupertino CA, US
Qing Liu - Cupertino CA, US
William C. Athas - Cupertino CA, US
International Classification:
H02J 7/00
H02M 3/158
G06F 1/26
Abstract:
The disclosed embodiments provide a system that manages use of a battery in a portable electronic device. During operation, the system provides a charging circuit for converting an input voltage from a power source into a set of output voltages for charging the battery and powering a low-voltage subsystem and a high-voltage subsystem in the portable electronic device. Upon detecting discharging of the battery in a low-voltage state, the system uses the charging circuit to directly power the low-voltage subsystem from a battery voltage of the battery and up-convert the battery voltage to power the high-voltage subsystem.

Isbn (Books And Publications)

Algebraic Geometry And Arithmetic Curves

Author:
Qing Liu
ISBN #:
0198502842

Algebraic Geometry And Arithmetic Curves

Author:
Qing Liu
ISBN #:
0199202494

Rough Sets, Fuzzy Sets, Data Mining, And Granular Computing: 9Th International Conference, Rsfdgrc 2003, Chongqing, China, May 26-29, 2003 Proceedings

Author:
Qing Liu
ISBN #:
3540140409

Possible Relatives

Cynthia S Liu  David Y Liu  Dean Liu  Da J Liu  Debbie Y Liu  Deborah Y Liu  Dan Liu  Qing Li  Qing C Lin  Qing L Mack 

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