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Richard A Skogman, 7512584 County Road B, Lco Commercial Cent, WI 54843

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12584 County Road B, Hayward, WI 54843    715-6349147   

17110 13Th St, Plymouth, MN 55447    715-6349147    763-4731692    952-4731692   

Minneapolis, MN   

11510 Norway St NW, Minneapolis, MN 55448   

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Richard A Skogman

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Company: Stay at home mom Position: Retired

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Degree: High school graduate or higher

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Richard Skogman Photo 10

Richard Skogman

Location:
Minneapolis, MN
Work:
Stay at Home Mom
Retired

Publications & IP owners

Us Patents

Electron Beam Pumped Semiconductor Laser Screen And Associated Fabrication Method

US Patent:
6556602, Apr 29, 2003
Filed:
Dec 5, 2000
Appl. No.:
09/730286
Inventors:
Robert Rex Rice - Simi Valley CA
Neil F. Ruggieri - St. Louis MO
J. Stanley Whiteley - Maryland Heights MO
Robert A. Morgan - Plymouth MN
Richard A. Skogman - Plymouth MN
Assignee:
The Boeing Company - Seattle WA
International Classification:
H01S 500
US Classification:
372 43, 372 45
Abstract:
An electron beam pumped semiconductor laser screen and an associated fabrication method are described which provide a display screen that has a relatively long operating lifetime, is less expensive to produce, and operates at lower electron voltages and near room temperature conditions. The laser screen includes a multi quantum well active gain region having quantum wells of GaInP and barrier layers of (Al Ga )InP, thereby permitting operation in the visible, red spectrum. Moreover, the first layer epitaxially grown on the sacrificial substrate is an etch stop layer of (Ga Al ) In P that acts as an etch stop during the subsequent etching of the sacrificial substrate and may also be used to adjust the cavity length to the correct resonance condition. The laser screen also includes an output mirror having alternating layers of two different compositions of Ga Al As that are epitaxially grown on the multi quantum well active gain region. The output mirror can also include a thin, final layer of GaAs to cap the structure and prevent degradation of the Ga Al As layers.

Electron Beam Pumped Semiconductor Laser Screen And Associated Fabrication Method

US Patent:
6757312, Jun 29, 2004
Filed:
Feb 24, 2003
Appl. No.:
10/373174
Inventors:
Robert Rex Rice - Seattle WA, 98124-2007
Neil F. Ruggieri - Seattle WA, 98124-2007
J. Stanley Whiteley - Seattle WA, 98124-2007
Robert A. Morgan - Plymouth MN, 55447
Richard A. Skogman - Plymouth MN, 55447
International Classification:
H01S 500
US Classification:
372 43, 372 98, 372 99, 438 29, 438 46
Abstract:
An electron beam pumped semiconductor laser screen and an associated fabrication method are described which provide a display screen that has a relatively long operating lifetime, is less expensive to produce, and operates at lower electron voltages and near room temperature conditions. The laser screen includes a multi quantum well active gain region having quantum wells of GaInP and barrier layers of (Al Ga )InP, thereby permitting operation in the visible, red spectrum. Moreover, the first layer epitaxially grown on the sacrificial substrate is an etch stop layer of (Ga Al ) In P that acts as an etch stop during the subsequent etching of the sacrificial substrate and may also be used to adjust the cavity length to the correct resonance condition. The laser screen also includes an output mirror having alternating layers of two different compositions of Ga Al As that are epitaxially grown on the multi quantum well active gain region. The output mirror can also include a thin, final layer of GaAs to cap the structure and prevent degradation of the Ga Al As layers.

Method And Apparatus For Producing Vcsels With Dielectric Mirrors And Self-Aligned Gain Guide

US Patent:
6975661, Dec 13, 2005
Filed:
Jun 14, 2001
Appl. No.:
09/881167
Inventors:
Richard A. Skogman - Plymouth MN, US
Assignee:
Finisar Corporation - Sunnyvale CA
International Classification:
H01S005/00
US Classification:
372 46, 372 43, 372 44, 372 45
Abstract:
The invention includes a method of fabricating a laser device, that includes: depositing a photoresist on epitaxially grown layers, patterning said photoresist to form an aperture area, depositing a dielectric material on said patterned photoresist, depositing a liftoff layer on said dielectric material, removing portions of said dielectric material and liftoff layer that border said aperture area, implanting regions of the epitaxially grown layers bordering said aperture area, and depositing a metal layer on said dielectric material. The invention also includes a device including: a substrate comprising epitaxial layers and an aperture area, a dielectric mirror formed on top of said aperture area and an implanted region within said epitaxial layers, said implanted region bordering said aperture area.

Cadmium Tellurite Thin Films

US Patent:
4040927, Aug 9, 1977
Filed:
Nov 19, 1975
Appl. No.:
5/633532
Inventors:
John H. Chaffin - Minnetonka MN
Richard A. Skogman - Inver Grove Heights MN
Assignee:
Honeywell Inc. - Minneapolis MN
International Classification:
C23C 1500
US Classification:
204192S
Abstract:
Cadmium tellurite with a composition CdTeO. sub. 3 is formed by reactive sputtering of a cadmium telluride target in an oxygen atmosphere.

Production Of Inhomogeneous Films By Sequential Layers Of Homogeneous Films

US Patent:
4176208, Nov 27, 1979
Filed:
Nov 24, 1978
Appl. No.:
5/963550
Inventors:
Thomas J. Moravec - Eden Prairie MN
Richard A. Skogman - Minneapolis MN
Assignee:
Honeywell Inc. - Minneapolis MN
International Classification:
G02B 110
B05D 136
US Classification:
427160
Abstract:
The present invention directed to antireflective coatings presents a new method for producing graded index films from alternating very thin layers of two materials with proper but differing indices. During deposition the thickness of each of the many layer pairs deposited can remain fairly uniform while the layer thickness of the two materials making up each pair is adjusted so that the resulting average index matches the index of the desired profile for that part of the total thickness. A two source evaporation deposition system is used and the two materials may be, for example, thallium iodide and lead fluoride.

Non-Birefringent Thallium Iodide Thin Films For Surface Protection Of Halide Optical Elements

US Patent:
4176207, Nov 27, 1979
Filed:
Oct 19, 1978
Appl. No.:
5/952764
Inventors:
Thomas J. Moravec - Eden Prairie MN
Richard A. Skogman - Minneapolis MN
Assignee:
Honeywell Inc. - Minneapolis MN
International Classification:
G02B 110
B05D 136
US Classification:
427160
Abstract:
A method of providing non-birefringent cubic thallium iodide thin films on potassium chloride optical elements. The method of this invention is to deposit thin film alternating layers of thallium iodide and a buffer material such that a composite coating is obtained. The optic buffer material may be lead fluoride. The thallium iodide film made by the method of this invention is highly transparent, insoluble and non-scattering.

Tunable Cut-Off Uv Detector Based On The Aluminum Gallium Nitride Material System

US Patent:
4614961, Sep 30, 1986
Filed:
Oct 9, 1984
Appl. No.:
6/658961
Inventors:
M. Asif Khan - Burnsville MN
Richard G. Schulze - Hopkins MN
Richard A. Skogman - Plymouth MN
Assignee:
Honeywell Inc. - Minneapolis MN
International Classification:
H01L 2714
H01L 3100
US Classification:
357 30
Abstract:
A method of preparing a UV detector of Al. sub. x Ga. sub. 1-x N. Metal organic chemical vapor deposition (MOCVD) is utilized to grow AlN and then Al. sub. x Ga. sub. 1-x N on a sapphire substrate. A photodetector structure is fabricated on the AlGaN.

Preparation Of Low Absorption Transparent Thallium Iodide Films On Potassium Chloride

US Patent:
4110489, Aug 29, 1978
Filed:
Jun 8, 1977
Appl. No.:
5/804665
Inventors:
John H. Chaffin - Minnetonka MN
Richard A. Skogman - Inver Grove Heights MN
Assignee:
Honeywell Inc. - Minneapolis MN
International Classification:
G02B 110
US Classification:
427164
Abstract:
A protective layer is prepared for water soluble optical elements. A process for obtaining clear thallium iodide (TlI) films of 1 to 2 micron thickness on potassium chloride (KCl) substrate. The high index of refraction (2. 34 - 2. 46 at 10. 6 microns) makes this coating material attractive as a component in an antireflection system of coatings.

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