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Robyn R Carlson DeceasedPlano, TX

Known as:
Robyn Reid Carlson Robyn R Pierce Robyn Carolson
Related to:
Charlene C Cassimere 70

Robyn Carlson Phones & Addresses

Plano, TX   

Richardson, TX   

821 Allen St, Dallas, TX 75204    214-8267683   

1122 Jackson St, Dallas, TX 75202    214-8267683   

907 Emerson Dr, Allen, TX 75002    972-7275221   

Wilkes Barre, PA   

Leesport, PA   

821 Allen St APT 241, Dallas, TX 75204    214-6329897   

Social networks

Robyn R Carlson

Linkedin

Work

Company: Texas instruments Jun 1997 to Dec 2007 Position: Failure analysis technician/ supervisor

Education

School / High School: Texas A&M University 1988 to 1991

Awards

Awarded U.S. Patent: 6642518- Assembly and Method for Improved Scanning Electron Microscope Analysis of Semiconductor Devices. Filed June 21, 2002

Ranks

Licence: Virginia - Authorized to practice law Date: 1999

Interests

new technology, research and development, cooking, reading novels, and learning to build websites

Industries

Semiconductors
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Mentions for Robyn R Carlson

Career records & work history

Lawyers & Attorneys

Robyn Carlson Photo 1

Robyn Carlson - Lawyer

ISLN:
914283315
Admitted:
1999
University:
Carleton College, B.A.
Law School:
University of Richmond, J.D.
Robyn Carlson Photo 2

Robyn Suzanne Thayer Carlson - Lawyer

Licenses:
Virginia - Authorized to practice law 1999

Robyn Carlson resumes & CV records

Resumes

Robyn Carlson Photo 46

Semiconductors Professional

Location:
Dallas/Fort Worth Area
Industry:
Semiconductors
Work:
Texas Instruments Jun 1997 - Dec 2007
Failure Analysis Technician/ Supervisor Texas Instruments Feb 1995 - Jun 1997
Failure Analysis Technician Texas Instruments Sep 1994 - Feb 1995
CMP Operator in SPDC fabrication lab
Education:
Texas A&M University 1988 - 1991
Interests:
new technology, research and development, cooking, reading novels, and learning to build websites
Honor & Awards:
Awarded U.S. Patent: 6642518- Assembly and Method for Improved Scanning Electron Microscope Analysis of Semiconductor Devices. Filed June 21, 2002

Publications & IP owners

Us Patents

Assembly And Method For Improved Scanning Electron Microscope Analysis Of Semiconductor Devices

US Patent:
6642518, Nov 4, 2003
Filed:
Jun 21, 2002
Appl. No.:
10/176873
Inventors:
Fred Y. Clark - Rowlett TX
James D. Krouse - Lewisville TX
Ping Jiang - Plano TX
Robyn R. Carlson - Dallas TX
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
H01J 3710
US Classification:
250307, 250311
Abstract:
An assembly and method for improved scanning electron microscope analysis of semiconductor devices include a structure including a first layer and a second layer, the second layer shrinking substantially when the structure is examined with a scanning electron microscope having a beam energy of at least 1. 5 KeV, and at least part of the surface of the structure coated with a material composed of Iridium, wherein the coating is of sufficient thickness to reduce shrinkage of the second layer to approximately a predetermined amount when the structure is examined with a scanning electron microscope having a beam energy of at least 1. 5 KeV.

Possible Relatives

Cynthia D Carlson  David Carlson  Dawn K Carlson  Dayle E Carlson  Dean L Carlson  Deann M Carlson  Daisy M Carlson  Robyn S Johnson  Robyn W Johnston  Robyn T White 

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