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Ronald Jean Allen DeceasedBullhead City, AZ

Known as:
Ronald J Allen Ronal D Allen

Ronald Allen Phones & Addresses

Bullhead City, AZ   

Coyote, CA   

Medford, OR   

Pomona, CA   

Laughlin, NV   

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Career records & work history

Lawyers & Attorneys

Ronald Allen Photo 1

Ronald Jason Allen - Lawyer

Licenses:
Texas - Eligible To Practice In Texas 2006
Education:
Texas A&M University School of Law
Texas A&M University School of Law
Specialties:
Probate - 34%
Business - 33%
Real Estate - 33%
Ronald Allen Photo 2

Ronald G. Allen - Lawyer

Licenses:
Texas - Eligible To Practice In Texas 1979
Education:
University of Puget Sound School of LawDegree Doctor of Jurisprudence/Juris Doctor (J.D.)Graduated 1979
Specialties:
Intellectual Property - 50%
Administrative Law - 25%
International Law - 25%
Ronald Allen Photo 3

Ronald Allen - Lawyer

Specialties:
Environmental
ISLN:
909480989
Admitted:
1968
University:
George Washington University, 1973; University of Alabama, B.A., 1965
Law School:
University of Alabama, J.D., 1968
Ronald Allen Photo 4

Ronald Allen - Lawyer

Specialties:
Government, Labor and Employment, Litigation, Collective Bargaining, Employment Discrimination, Labor Arbitration
ISLN:
917722668
Admitted:
2005
University:
Middlebury College, A.B., 1999
Law School:
Northeastern University School of Law, J.D., 2004
Ronald Allen Photo 5

Ronald J. Allen - Lawyer

Office:
Ronald J. Allen, P.C.
Specialties:
Personal Injury, Probate, Insurance, Negligence, Products Liability, Negligence Law Section, Probate & Estate Planning Section, Master Lawyers Section
ISLN:
909481054
Admitted:
1973
University:
Western Michigan University, B.B.A.
Law School:
Ohio Northern University, J.D.

Medicine Doctors

Ronald D. Allen

Specialties:
Ophthalmology
Work:
Portland ClinicThe Portland Clinic
800 SW 13 Ave, Portland, OR 97205
503-2210161 (phone) 503-2211914 (fax)
Site
Portland ClinicThe Portland Clinic

503-6460161 (phone) 503-6437459 (fax)
Site
Portland ClinicThe Portland Clinic
6640 SW Redwood Ln STE 100, Portland, OR 97224
503-6207358 (phone) 503-6246144 (fax)
Site
Portland ClinicThe Portland Clinic
1115 SW Taylor St, Portland, OR 97205
503-2270354 (phone) 503-2272025 (fax)
Site
Education:
Medical School
Western Univ of Health Sciences College of Osteopathic Medicine of the Pacific
Graduated: 1997
Procedures:
Lens and Cataract Procedures
Conditions:
Acute Conjunctivitis, Cataract, Glaucoma, Keratitis, Macular Degeneration
Languages:
English, Polish
Description:
Dr. Allen graduated from the Western Univ of Health Sciences College of Osteopathic Medicine of the Pacific in 1997. He works in Portland, OR and 3 other locations and specializes in Ophthalmology. Dr. Allen is affiliated with Legacy Emanuel Medical Center, Legacy Good Samaritan Hospital & Medical Center and Providence Saint Vincent Medical Center.

Ronald V. Allen

Specialties:
Otolaryngology, Allergy
Work:
Ear Nose Throat/Allergy AssociatesEar Nose Throat & Allergy Associates Of South Georgia
2910 N Patterson St, Valdosta, GA 31602
229-2442562 (phone) 229-2490000 (fax)
Site
Education:
Medical School
Medical College of Georgia School of Medicine
Graduated: 1990
Procedures:
Tonsillectomy or Adenoidectomy, Allergen Immunotherapy, Allergy Testing, Hearing Evaluation, Inner Ear Tests, Myringotomy and Tympanotomy, Rhinoplasty, Sinus Surgery, Skull/Facial Bone Fractures and Dislocations, Tracheostomy, Tympanoplasty
Conditions:
Acute Pharyngitis, Acute Sinusitis, Acute Upper Respiratory Tract Infections, Allergic Rhinitis, Benign Paroxysmal Positional Vertigo, Chronic Sinusitis, Deviated Nasal Septum, Hearing Loss, Labyrinthitis, Laryngeal Cancer, Otitis Media
Languages:
English, Spanish
Description:
Dr. Allen graduated from the Medical College of Georgia School of Medicine in 1990. He works in Valdosta, GA and specializes in Otolaryngology and Allergy. Dr. Allen is affiliated with South Georgia Medical Center.

Ronald L. Allen

Specialties:
Psychologist
Work:
Child & Adult Clinical Associates
9217 Park West Blvd STE D1, Knoxville, TN 37923
865-6912425 (phone) 865-5318440 (fax)
Languages:
English
Description:
Dr. Allen works in Knoxville, TN and specializes in Psychologist. Dr. Allen is affiliated with Physicians Regional Medical Center.

License Records

Ronald S. Allen

Licenses:
License #: 8886 - Active
Issued Date: Nov 20, 1984
Renew Date: Dec 1, 2015
Expiration Date: Nov 30, 2017
Type: Certified Public Accountant

Ronald Allen

Licenses:
License #: 129394 - Expired
Issued Date: May 1, 1986
Expiration Date: Aug 2, 1990
Type: Broker

Ronald Allen

Licenses:
License #: 52560 - Expired
Issued Date: May 1, 1984
Expiration Date: Aug 2, 1986
Type: Salesperson

Ronald Wayne Allen

Licenses:
License #: 8002 - Expired
Category: Emergency Medical Care
Issued Date: Dec 31, 1997
Effective Date: Nov 9, 2009
Expiration Date: Dec 31, 2009
Type: EMT

Ronald Wayne Allen

Licenses:
License #: 3034 - Expired
Category: Emergency Medical Care
Issued Date: Dec 31, 1997
Effective Date: Mar 8, 1999
Type: EMT A/D

Ronald Wayne Allen

Licenses:
License #: 5502 - Expired
Category: Emergency Medical Care
Issued Date: May 15, 1995
Effective Date: Mar 8, 1999
Type: EMT-Defibrillator

Ronald Allen

Licenses:
License #: RS150127A - Expired
Category: Real Estate Commission
Type: Real Estate Salesperson-Standard

Ronald G Allen

Licenses:
License #: RS145284A - Expired
Category: Real Estate Commission
Type: Real Estate Salesperson-Standard

Ronald Allen resumes & CV records

Resumes

Ronald Allen Photo 56

Independent Associate Of Legalshield Inc

Position:
Manager at Legalshield inc.
Location:
Rochester, New York
Industry:
Legal Services
Work:
Legalshield inc. - Rochester,N.Y. since Dec 2007
Manager SouthWest Area Neighborhood Association - Rochester,N.Y. Jan 2002 - Apr 2013
Board of Director's Member Rochester City School District - Edison Technical & Industrial High school Feb 2002 - Mar 2012
School Safety Officer
Education:
State University of New York College at Brockport 1976 - 1983
Bachelor's degree, Recreation and Leisure Studies
Ronald Allen Photo 57

Ronald Allen

Location:
United States
Ronald Allen Photo 58

Independent Electrical Engineer / Consultant

Location:
Broken Arrow, Oklahoma
Industry:
Oil & Energy
Education:
Oklahoma State University 1967 - 1971
Bachelor of Science, Electrical Engineering
Ronald Allen Photo 59

Ronald Allen

Position:
Regional Director at GPS Logic
Location:
United States
Industry:
Information Technology and Services
Work:
GPS Logic since 2010
Regional Director
Ronald Allen Photo 60

Ronald Allen

Location:
United States
Ronald Allen Photo 61

Ronald Allen - Muskogee, OK

Work:
Cherokee Nation Businesses Oct 2013 to 2000
Safety Coordinator I Cherokee Nation Businesses - Catoosa, OK Jan 2013 to Oct 2013
Safety Coordinator Intern BDS Marketing - Irvine, CA Apr 2010 to Feb 2013
Merchandise Specialist Mosaic Sales Solutions - Irving, TX Jan 2006 to Jul 2012
Field Training Specialist Green Country Lanes - Muskogee, OK Oct 2001 to May 2010
Shift Manager
Education:
Northeastern State University - Tahlequah, OK 2011 to 2013
BS in Environmental Health and Safety Management Connors State College - Muskogee, OK May 2004 to May 2011
A.S. in Biological Science Connors State College - Muskogee, OK 2004 to 2011
A.A. in General Studies
Ronald Allen Photo 62

Ronald Allen - Bullhead City, AZ

Work:
America's Mart & Cafe' - North Las Vegas, NV Mar 2013 to Oct 2014
Customer Service Representative and Cashier Dunton Motor's (Auto Sales & Leasing) - Bullhead City, AZ 2011 to 2013
Auto Detailer Carquest . - Las Vegas, NV 2010 to 2011
Stocker/Picker Action Enterprises of Arizona - Bullhead City, AZ Jul 2007 to Feb 2010
Office Manager/Sales Lee's Carpet Cleaner - Bullhead City, AZ Mar 2008 to Sep 2009
Carpet Cleaner
Education:
Mohave Accelerated Learning Center - Bullhead City, AZ 2002 to 2006
High School Diploma in General Studies
Skills:
Superior Customer Service, Exquisite Communication skills, and the ability to resolve problems/situations with a swift and clever solution.
Ronald Allen Photo 63

Ronald Allen

Location:
United States

Publications & IP owners

Us Patents

Windows Configurable To Be Coupled To A Process Tool Or To Be Disposed Within An Opening In A Polishing Pad

US Patent:
6866559, Mar 15, 2005
Filed:
Feb 4, 2003
Appl. No.:
10/358107
Inventors:
Kurt Lehman - Menlo Park CA, US
Charles Chen - Sunnyvale CA, US
Ronald L. Allen - San Jose CA, US
Robert Shinagawa - Cupertino CA, US
Anantha Sethuraman - Palo Alto CA, US
Christopher F. Bevis - Los Gatos CA, US
Thanassis Trikas - Redwood City CA, US
Haiguang Chen - Millbrae CA, US
Ching Ling Meng - Fremont CA, US
Assignee:
KLA-Tencor Technologies - Milpitas CA
International Classification:
B24B049/12
US Classification:
451 8, 451 6, 451 41
Abstract:
Windows configurable to be coupled to a process tool or to be disposed within an opening in a polishing pad are provided. One window includes a first portion and a second portion. The first portion includes a first material, and the second portion includes a second material different than the first. Another window includes a substantially transparent gel. In some instances, the gel includes a triblock copolymer and a plasticizing oil. An additional window includes an upper window, a housing, and a diaphragm. The housing may allow a fluid to flow into and out of a space between the housing and the diaphragm. In another embodiment, a window includes a layer of material coupled to lateral surfaces of the window. In some cases, the window may be disposed within an opening in a polishing pad, and movement of the window within the polishing pad may compress the layer of material.

Systems And Methods For Characterizing A Polishing Process

US Patent:
6884146, Apr 26, 2005
Filed:
Feb 4, 2003
Appl. No.:
10/358105
Inventors:
Kurt Lehman - Menlo Park CA, US
Charles Chen - Sunnyvale CA, US
Ronald L. Allen - San Jose CA, US
Robert Shinagawa - Cupertino CA, US
Anantha Sethuraman - Palo Alto CA, US
Christopher F. Bevis - Los Gatos CA, US
Thanassis Trikas - Redwood City CA, US
Haiguang Chen - Millbrae CA, US
Ching Ling Meng - Fremont CA, US
Assignee:
KLA-Tencor Technologies Corp. - Milpitas CA
International Classification:
B24D049/00
US Classification:
451 5, 451 6, 451 8, 451 9, 451 41, 451285, 451286, 451287, 451288, 438 14, 438 15, 438 16, 438 17
Abstract:
Systems and methods for characterizing a polishing process are provided. One method includes scanning a specimen with two or more measurement devices during polishing. In one embodiment, the two or more measurement devices may include a reflectometer and a capacitance probe. In another embodiment, the two or more measurement devices may include an optical device and an eddy current device. An additional embodiment relates to a measurement device for scanning a specimen during polishing. The device includes a light source and a scanning assembly. The scanning assembly is configured to scan light from the light source across the specimen during polishing. Another measurement device includes a laser light source coupled to a first fiber optic bundle and a detector coupled to a second fiber optic bundle. An additional method includes scanning a specimen with different measurement devices during different steps of a polishing process.

Methods And Systems For Generating A Two-Dimensional Map Of A Characteristic At Relative Or Absolute Locations Of Measurement Spots On A Specimen During Polishing

US Patent:
6935922, Aug 30, 2005
Filed:
Feb 4, 2003
Appl. No.:
10/358106
Inventors:
Kurt Lehman - Menlo Park CA, US
Charles Chen - Sunnyvale CA, US
Ronald L. Allen - San Jose CA, US
Robert Shinagawa - Cupertino CA, US
Anantha Sethuraman - Palo Alto CA, US
Christopher F. Bevis - Los Gatos CA, US
Thanassis Trikas - Redwood City CA, US
Haiguang Chen - Millbrae CA, US
Ching Ling Meng - Fremont CA, US
Assignee:
KLA-Tencor Technologies Corp. - Milpitas CA
International Classification:
B24D049/00
US Classification:
451 5, 451 6, 451 8, 451 9, 451 41, 451285, 451286, 451287, 451288, 438 14, 438 15, 438 16, 438 17
Abstract:
Methods and systems for generating a two-dimensional map of a characteristic at relative or absolute locations of measurement spots on a specimen during polishing are provided. One method includes scanning a specimen with a measurement device during polishing to generate output signals at measurement spots on the specimen. The method may also include determining a characteristic of polishing at the measurement spots from the output signals. In addition, the method may include determining relative or absolute locations of the measurement spots on the specimen. The method may further include generating a two-dimensional map of the characteristic at the relative or absolute locations of the measurement spots on the specimen. In some embodiments, the relative locations of the measurement spots may be determined from a representative scan path of the measurement device and an average spacing between starting points on individual scans.

Methods And Systems For Monitoring A Parameter Of A Measurement Device During Polishing, Damage To A Specimen During Polishing, Or A Characteristic Of A Polishing Pad Or Tool

US Patent:
7030018, Apr 18, 2006
Filed:
Feb 4, 2003
Appl. No.:
10/358101
Inventors:
Kurt Lehman - Menlo Park CA, US
Charles Chen - Sunnyvale CA, US
Ronald L. Allen - San Jose CA, US
Robert Shinagawa - Cupertino CA, US
Anantha Sethuraman - Palo Alto CA, US
Christopher F. Bevis - Los Gatos CA, US
Thanassis Trikas - Redwood City CA, US
Haiguang Chen - Millbrae CA, US
Ching Ling Meng - Fremont CA, US
Assignee:
KLA-Tencor Technologies Corp. - Milpitas CA
International Classification:
H01L 21/302
US Classification:
438692, 438 8, 438689
Abstract:
Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, a characteristic of a polishing pad, or a characteristic of a polishing tool are provided. One method includes scanning a specimen with a measurement device during polishing of a specimen to generate output signals at measurement spots on the specimen. The method also includes determining if the output signals are outside of a range of output signals. Output signals outside of the range may indicate that a parameter of the measurement device is out of control limits. In a different embodiment, output signals outside of the range may indicate damage to the specimen. Another method includes scanning a polishing pad with a measurement device to generate output signals at measurement spots on the polishing pad. The method also includes determining a characteristic of the polishing pad from the output signals.

Methods And Systems For Detecting A Presence Of Blobs On A Specimen During A Polishing Process

US Patent:
7052369, May 30, 2006
Filed:
Feb 4, 2003
Appl. No.:
10/358104
Inventors:
Kurt Lehman - Menlo Park CA, US
Charles Chen - Sunnyvale CA, US
Ronald L. Allen - San Jose CA, US
Robert Shinagawa - Cupertino CA, US
Anantha Sethuraman - Palo Alto CA, US
Christopher F. Bevis - Los Gatos CA, US
Thanassis Trikas - Redwood City CA, US
Haiguang Chen - Millbrae CA, US
Ching Ling Meng - Fremont CA, US
Assignee:
KLA-Tencor Technologies Corp. - Milpitas CA
International Classification:
B24B 49/00
US Classification:
451 9, 451 5
Abstract:
Systems and methods for detecting a presence of blobs on a specimen are provided. One method may include scanning measurement spots across a specimen during polishing of the specimen. The method may also include determining if the blobs are present on the specimen at the measurement spots. Each of the blobs may include unwanted material disposed upon a contiguous portion of the measurement spots. In some instances, the blobs may include copper. In some embodiments, scanning the measurement spots may include measuring an optical property and/or an electrical property of the specimen at the measurement spots. Another embodiment includes dynamically determining a signal threshold distinguishing a presence of the blobs from an absence of the blobs. An additional embodiment includes determining an endpoint of polishing if, for example, blobs are not determined to be present on the specimen.

Methods And Systems For Determining A Characteristic Of Polishing Within A Zone On A Specimen From Combined Output Signals Of An Eddy Current Device

US Patent:
7175503, Feb 13, 2007
Filed:
Feb 4, 2003
Appl. No.:
10/358069
Inventors:
Kurt Lehman - Menlo Park CA, US
Charles Chen - Sunnyvale CA, US
Ronald L. Allen - San Jose CA, US
Robert Shinagawa - Cupertino CA, US
Anantha Sethuraman - Palo Alto CA, US
Christopher F. Bevis - Los Gatos CA, US
Thanassis Trikas - Redwood City CA, US
Haiguang Chen - Millbrae CA, US
Ching Ling Meng - Fremont CA, US
Assignee:
KLA-Tencor Technologies Corp. - Milpitas CA
International Classification:
B24B 49/00
B24B 51/00
US Classification:
451 5, 451 8, 451 41, 451 6, 438 17
Abstract:
Systems and methods for characterizing polishing of a specimen are provided. One method includes scanning a specimen with an eddy current device during polishing to generate output signals at measurement spots across the specimen. The method also includes combining a portion of the output signals generated at the measurement spots located within a zone on the specimen. In addition, the method includes determining a characteristic of polishing within the zone from the combined portion of the output signals. In some instances, a zone may include a predetermined range of radial and azimuthal positions on the specimen. In one embodiment, the method may include determining a characteristic of polishing within more than one zone on the specimen. Some embodiments may include determining an additional characteristic of polishing from the characteristic of polishing within more than one zone on the specimen.

Methods And Systems For Monitoring A Parameter Of A Measurement Device During Polishing, Damage To A Specimen During Polishing, Or A Characteristic Of A Polishing Pad Or Tool

US Patent:
7332438, Feb 19, 2008
Filed:
Feb 14, 2006
Appl. No.:
11/353899
Inventors:
Kurt Lehman - Menlo Park CA, US
Charles Chen - Sunnyvale CA, US
Ronald L. Allen - San Jose CA, US
Robert Shinagawa - Cupertino CA, US
Anantha Sethuraman - Palo Alto CA, US
Christopher F. Bevis - Los Gatos CA, US
Thanassis Trikas - Redwood City CA, US
Haiguang Chen - Millbrae CA, US
Ching Ling Meng - Fremont CA, US
Assignee:
KLA-Tencor Technologies Corp. - Milpitas CA
International Classification:
H01L 21/302
US Classification:
438692, 216 85, 216 88, 451 6, 451 28, 438 7, 438 16
Abstract:
Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, a characteristic of a polishing pad, or a characteristic of a polishing tool are provided. One method includes scanning a specimen with a measurement device during polishing of a specimen to generate output signals at measurement spots on the specimen. The method also includes determining if the output signals are outside of a range of output signals. Output signals outside of the range may indicate that a parameter of the measurement device is out of control limits. In a different embodiment, output signals outside of the range may indicate damage to the specimen. Another method includes scanning a polishing pad with a measurement device to generate output signals at measurement spots on the polishing pad. The method also includes determining a characteristic of the polishing pad from the output signals.

Methods And Systems For Monitoring A Parameter Of A Measurement Device During Polishing, Damage To A Specimen During Polishing, Or A Characteristic Of A Polishing Pad Or Tool

US Patent:
8010222, Aug 30, 2011
Filed:
Feb 15, 2008
Appl. No.:
12/032112
Inventors:
Kurt Lehman - Menlo Park CA, US
Charles Chen - Sunnyvale CA, US
Ronald L. Allen - San Jose CA, US
Robert Shinagawa - Cupertino CA, US
Anantha Sethuraman - Palo Alto CA, US
Christopher F. Bevis - Los Gatos CA, US
Thanassis Trikas - Redwood City CA, US
Haiguang Chen - Millbrae CA, US
Ching Ling Meng - Fremont CA, US
Assignee:
KLA-Tencor Technologies Corp. - Milpitas CA
International Classification:
G06F 19/00
US Classification:
700121, 700164, 438692
Abstract:
Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, a characteristic of a polishing pad, or a characteristic of a polishing tool are provided. One method includes scanning a specimen with a measurement device during polishing of a specimen to generate output signals at measurement spots on the specimen. The method also includes determining if the output signals are outside of a range of output signals. Output signals outside of the range may indicate that a parameter of the measurement device is out of control limits. In a different embodiment, output signals outside of the range may indicate damage to the specimen. Another method includes scanning a polishing pad with a measurement device to generate output signals at measurement spots on the polishing pad. The method also includes determining a characteristic of the polishing pad from the output signals.

Isbn (Books And Publications)

Federal Rules Of Evidence: With Legislative History And Case Supplement

Author:
Ronald J. Allen
ISBN #:
0316034215

Preaching Is Believing: The Sermon As Theological Reflection

Author:
Ronald J. Allen
ISBN #:
0664223303

Preaching The Gospels Without Blaming The Jews: A Lectionary Commentary

Author:
Ronald J. Allen
ISBN #:
0664227635

The Homiletic Of All Believers: A Conversational Approach To Proclamation And Preaching

Author:
Ronald J. Allen
ISBN #:
0664228607

Preaching The Letters Without Dismissing The Law: A Lectionary Commentary

Author:
Ronald J. Allen
ISBN #:
0664230016

Preaching The Old Testament: A Lectionary Commentary

Author:
Ronald J. Allen
ISBN #:
0664230687

Preaching Without Prejudice

Author:
Ronald J. Allen
ISBN #:
0664231845

Teaching Minister

Author:
Ronald J. Allen
ISBN #:
0664251749

Possible Relatives

Cynthia M Allen  David A Allen  Cyril J Allen  Davida N Allen  Davie C Allen  Davone L Allen  Dawn Allen  Ronald W Johnson  Ronald R Stamps  Ronald L Stancill 

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