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Shawn P Mckenney, 464512 Shore Dr, Menominee, MI 49858

Shawn Mckenney Phones & Addresses

4512 Shore Dr, Menominee, MI 49858    906-8632328    906-8633955   

Ramona, CA   

Los Alamos, NM   

Prescott, AZ   

Espanola, NM   

4512 N Shore Dr, Menominee, MI 49858    906-8632328   

Work

Position: Clerical/White Collar

Education

Degree: Associate degree or higher

Mentions for Shawn P Mckenney

Shawn Mckenney resumes & CV records

Resumes

Shawn Mckenney Photo 30

Lead Software Engineer

Location:
1327 1St St, Menominee, MI 49858
Industry:
Computer Software
Work:
Knuedge
Software Engineer
Emmion
Chief Executive Officer and Chief Software Architect
Decision Sciences International Corporation Jan 2013 - Jul 2016
Vice President, Technical Operations
Decision Sciences International Corporation 2008 - Jan 2013
Director of Software Engineering
Los Alamos National Laboratory 2004 - 2007
Computer Technician
Devvio Inc 2004 - 2007
Lead Software Engineer
Education:
Embry - Riddle Aeronautical University
Skills:
Python, Software Engineering, Linux, C++, Matlab, C, Embedded Software, Software Development, Algorithms, Integration, Distributed Systems, Visual Studio, Program Management, Embedded Systems, Unix, Testing, System Architecture, Cross Functional Team Leadership, Programming, Project Management, Leadership, Systems Engineering, Java, Eclipse, Process Improvement, Management
Shawn Mckenney Photo 31

Shawn Mckenney

Shawn Mckenney Photo 32

Shawn Mckenney

Shawn Mckenney Photo 33

Shawn Mckenney

Shawn Mckenney Photo 34

Shawn Mckenney

Shawn Mckenney Photo 35

Shawn Mckenney

Publications & IP owners

Us Patents

Detection Of An Object Within A Volume Of Interest

US Patent:
2016006, Mar 3, 2016
Filed:
Aug 28, 2015
Appl. No.:
14/839883
Inventors:
- Poway CA, US
Shawn McKenney - Ramona CA, US
Sean Simon - Vista CA, US
Peter Lam - San Diego CA, US
International Classification:
G01N 23/04
G01N 23/201
Abstract:
Techniques, systems, and devices are disclosed for analyzing a point of closest approach (PoCA) image of a volume of interest (VOI) comprising a set of recorded PoCA points from charged particle detector measurements to detect an object within the VOI. The VOI is partitioned into a set of equally-sized bins with each bin including a subset of the PoCA points. A bin metric is determined for each bin. A subset of the bins is selected based on the detected bin metric with the subset of bins being most likely to contain objects. A potential object for each selected bin is determined by determining a location and a size for the potential object based at least on the PoCAs inside the bin. A figure of merit (FOM) of the potential object is determined as a measure of the likelihood that the potential object is truly a threat object.

Calibrating Modular Charged Particle Detector Arrays

US Patent:
2016005, Feb 25, 2016
Filed:
Aug 19, 2015
Appl. No.:
14/830590
Inventors:
- Poway CA, US
Michael James Sossong - Ramona CA, US
Shawn McKenney - Ramona CA, US
Thomas Taylor - St. Johns FL, US
Kolo Wamba - San Diego CA, US
International Classification:
G01T 7/00
G01T 1/29
Abstract:
A charged particle detector array includes one or more pairs of super modules, one super module in a pair of super modules is positioned above a volume of interest (VOI), and the other super module in the pair of super modules is positioned below the VOI. This calibration technique first calibrates individual super modules in the one or more pairs of super modules while treating each super module being calibrated as a rigid body. Each super module in the one or more pairs of super modules further includes multiple vertically-stacked modules, and each module in the multiple vertically-stacked modules is composed of multiple layers of drift tubes. The calibration technique then calibrates individual modules in each of the super modules while treating each module being calibrated as a rigid body. Next, the calibration technique calibrates individual drift tubes in each layer of the modules.

Primary And Secondary Scanning In Muon Tomography Inspection

US Patent:
2015021, Jul 30, 2015
Filed:
Aug 21, 2013
Appl. No.:
14/423381
Inventors:
- Poway CA, US
Shawn McKenney - Ramona CA, US
Robert Whalen - La Jolla CA, US
Gary Blanpied - Ramona CA, US
Andre Lehovich - San Diego CA, US
Priscilla Kurnadi - San Diego CA, US
Assignee:
Decision Sciences International Corporation - Poway CA
International Classification:
G01N 23/04
G01N 23/20
G01T 1/167
Abstract:
Techniques and systems for using cosmic ray-produced muons to inspect objects based on an initial scanning of all objects and an additional scanning of objects that are determined by the initial scanning to potentially include one or more suspect regions. In one implementation, a system can include a primary scanner for performing the initial or primary scanning and a smaller secondary scanner for the additional or secondary scanning to provide efficient and accurate inspection of objects while maintaining a desired throughput of the inspection. In another implementation, a single scanner can be used to perform both the initial scanning and the additional scanning while maintaining a sufficient throughput of a line of objects under inspection.

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