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Steve J Sparks, 721430 County Road 127, Gaylesville, AL 35973

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1430 County Road 127, Gaylesville, AL 35973    256-6435517   

Dallas, TX   

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Company: Coldwell Banker Address: Mesquite, TX Phones: 972-6134100 (Phone)

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STEVE SPARKS, Mesquite TX - Agent

Work:
Coldwell Banker
Mesquite, TX
972-6134100 (Phone)

Publications & IP owners

Us Patents

Multi-Chip Module Testing

US Patent:
5321277, Jun 14, 1994
Filed:
Aug 26, 1993
Appl. No.:
8/112907
Inventors:
Steve E. Sparks - Plano TX
Darvin R. Edwards - Dallas TX
Katherine G. Heinen - Dallas TX
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
H01L 2348
H01L 2346
US Classification:
257 48
Abstract:
A base for a multi-chip module that provides for built-in testability. Active test components are embedded in a module substrate. These test components primarily consist of boundary scan cells that comply with the IEEE 1149. 1 test standard. The scan cells are connected to each other, and are connected to interconnection paths among chips and to individual chips, thereby partitioning the module into testable partitions. These partitions permit testing of chip interconnections, chip functionality, and module functionality. Scan cell connections may be mask programmable so that the same multi-chip module base can be used for many different multi-chip module configurations.

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