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Steven C Richter, 71622 S Lake St, Neenah, WI 54956

Known as:
Steven Craig Richter Steve C Richter Steve C Richer
Related to:
Regina Lang 55

Steven Richter Phones & Addresses

Neenah, WI   

Appleton, WI   

Menasha, WI   

Alvin, TX   

Onalaska, TX   

Tomball, TX   

Education

School / High School: Graduates of Institutions Not Listed As Medical Schools

Languages

English
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Mentions for Steven C Richter

Career records & work history

Medicine Doctors

Steven Richter Photo 1

Dr. Steven J Richter - DDS (Doctor of Dental Surgery)

Specialties:
Oral & Maxillofacial Surgery
Languages:
English
Education:
Medical School
Graduates of Institutions Not Listed As Medical Schools

License Records

Steven S Richter

Licenses:
License #: 4021 - Active
Issued Date: Aug 10, 1976
Renew Date: Dec 1, 2015
Expiration Date: Nov 30, 2017
Type: Certified Public Accountant

Steven Richter resumes & CV records

Resumes

Steven Richter Photo 41

Steven Richter

Steven Richter Photo 42

Steven Richter

Steven Richter Photo 43

Chief, Medical Logistics At Us Army

Position:
Chief, Medical Logistics at US Army
Location:
US Military Posts in the Pacific
Industry:
Military
Work:
US Army
Chief, Medical Logistics
Steven Richter Photo 44

Steven Richter

Location:
United States

Publications & IP owners

Us Patents

Particle Analysis System And Method

US Patent:
7187441, Mar 6, 2007
Filed:
Nov 7, 1997
Appl. No.:
09/297895
Inventors:
Joseph Pierce - Appleton WI, US
Steven Richter - Brunswick GA, US
Rajesh Shinde - West Lafayette IN, US
Ganesh Balgi - Lebanon IN, US
Jeffrey Kao - Lake Jackson TX, US
Huabei Jiang - Clemson SC, US
Assignee:
The Texas A&M University System - College Station TX
International Classification:
G01N 21/51
US Classification:
356336, 356342
Abstract:
A system () and method are disclosed for the self-calibrating, on-line determination of size distribution f(x) and volume fraction φ of a number of particles (P) dispersed in a medium () by detecting one or more propagation characteristics of multiply scattered light from the particles (P). The multiply scattered light is re-emitted in response to exposure to a light source () configured to provide light at selected wavelengths. The determination includes calculating the isotropic scattering and absorption coefficients for the particles (P) by comparing the incident and detected light to determine a measurement corresponding to the propagation time through the scattering medium (), and iteratively estimating the size distribution f(x) and volume fraction φ as a function of the coefficients for each of the wavelengths. An estimation approach based on an expected form of the distribution and the mass of the particles is also disclosed. Furthermore, techniques to determine a particle structure factor indicative of particle-to-particle interactions which vary with particle concentration and influence light scattering at high concentrations is disclosed.

Amazon

Steven Richter Photo 47

The Comparative Effectiveness Of Conventional School-House Training Vs. Interactive Courseware

Author:
Steven L. Richter
Publisher:
PN
Binding:
Paperback

Possible Relatives

Cynthia Richter  David M Richter  Dawn F Richter  Dean D Richter  Dale M Richter  Deanne L Richter  Deborah Richter  Steven D Johnson  Steven B Standiford  Steven B Standley 

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