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Steven S Valle, 64PO Box 521633, Longwood, FL 32752

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Longwood, FL   

1827 Normandy Blvd, Deltona, FL 32725    386-5742142   

2515 Ainsworth Ave, Deltona, FL 32738    386-5325563   

791 Dan River Ave, Deltona, FL 32725    386-5747758   

Richmond Hill, NY   

Honolulu, HI   

14203 Spring Knoll Ln, Rosharon, TX 77583   

Orange City, FL   

Daytona Beach, FL   

Sherman Oaks, CA   

Canoga Park, CA   

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Publications & IP owners

Us Patents

Mass Spectrometer Particle Counter

US Patent:
2002006, May 30, 2002
Filed:
Nov 30, 2000
Appl. No.:
09/727014
Inventors:
Erik Houge - Orlando FL, US
John Mclntosh - Orlando FL, US
Fred Stevie - Orlando FL, US
Steven Valle - Orlando FL, US
Catherine Vartuli - Orlando FL, US
International Classification:
H01J049/00
B01D059/44
US Classification:
250/228000
Abstract:
The present invention relates to a device for testing particles for composition and concentration. The device includes a particle counter, a collector screen, and a mass spectrometer. In one embodiment, the collector screen is positioned to receive particles received by the particle counter, and the mass spectrometer is positioned to receive counted particles retained on the collector screen.

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