Suresh Sharma, 72New York, NY

6683309, Jan 27, 2004

Dec 21, 2001

10/028353

Suresh C. Sharma - Arlington TX

Board of Regents, The University of Texas System - Austin TX

G01J 100

2503361, 2504741

Generally, and in one form, the present invention is a device for the measurement of radiant energy using a polymer dispersed liquid crystal cell. In another form, the present invention is a device for the detection of ionizing radiation that uses a polymer dispersed liquid crystal cell and a light source that is optically oriented toward the cell. The cell is connected to an electrical signal generator, and a light detector capable of producing output is optically aligned with the light source. Finally, a computer is connected to the light detector to analyze the output from the light detector.

7166851, Jan 23, 2007

Mar 19, 2003

10/392397

Suresh C. Sharma - Arlington TX, US

Board of Regents, The University of Texas System - Austin TX

G01T 1/06

2504741

The present invention is a self-contained device for measuring exposure to radiation which includes an integrated circuit device incorporating a polymer dispersed liquid crystal component that resides on a semiconductor substrate.

7625674, Dec 1, 2009

Oct 4, 2004

10/958669

Suresh C. Sharma - Arlington TX, US
Robert A. Ramsey - Fort Worth TX, US

Board of Regents, The University of Texas System - Austin TX

G03H 1/02

430 2, 430 1, 4302801, 430945, 359 3, 359 35

The present invention includes systems and compositions of holographic grating structures devices and methods for fabricating such holographic grating structures. The method comprises the steps of preparing a composite mixture comprising a polymerizable matrix, a liquid crystal, and a photo-oxidant dye, producing an interference pattern from two interference beams, wherein the two interference beams originate from a recording laser beam directed by a low energy laser, and projecting the interference pattern on the composite mixture to form a holographic grating structure. As described, the holographic grating structure yields a first-order diffraction efficiency of at least about 30% diffraction efficiency which may be adjusted by the application of an electric field.

5406085, Apr 11, 1995

Jul 7, 1993

8/088482

Suresh C. Sharma - Arlington TX

Board of Regents, The University of Texas System - Austin TX

G01N 2300
G01N 2318

2503581

A method and apparatus for rapidly yet nondestructively testing a semiconductor wafer is disclosed. A multi-spot positron source assembly directs positrons over an entire semiconductor wafer at one time. A pair of multi-detector assemblies are situated so that each detector within an assembly corresponds physically with a positron source. By measuring the characteristic emission and annihilation energies, the multi-detector assembly pair is capable of detecting the lifetimes of positrons from within each of the areas simultaneously. Longer lifetimes are indicative of defects within the semiconductor wafer. By accumulating and analyzing positron lifetimes from across the entire wafer substantially simultaneously, information about the existence and location of defects in the wafer may be more rapidly determined than is possible with known positron-emission techniques.