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Thomas R Hofacker, 68173 Biery St, Emmaus, PA 18049

Thomas Hofacker Phones & Addresses

Emmaus, PA   

920 Race St, Allentown, PA 18103    610-7971479    484-7642346   

Williamsport, PA   

920 S Race St #1, Allentown, PA 18103   

Work

Position: Food Preparation and Serving Related Occupations

Education

Degree: Associate degree or higher

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Thomas Hofacker resumes & CV records

Resumes

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Thomas Hofacker

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Thomas Hofacker

Publications & IP owners

Us Patents

Method For Quality And Reliability Assurance Testing Of Integrated Circuits Using Differential Iddq Screening In Lieu Of Burn-In

US Patent:
6230293, May 8, 2001
Filed:
Jul 24, 1998
Appl. No.:
9/121991
Inventors:
Sailesh Chittipeddi - Allentown PA
Daryl E. Diehl - Bethlehem PA
Thomas N. Hofacker - Northampton PA
Richard J. Jenkins - Allentown PA
Mamata Patnaik - Windmere FL
Robert T. Smith - Coopersburg PA
Michael J. Toth - New Ringgold PA
Keelathur N. Vasudevan - Macungie PA
Michael Washko - Barto PA
Assignee:
Lucent Technologies Inc. - Murray Hill NJ
International Classification:
G01R 3128
US Classification:
714724
Abstract:
A method for quality and reliability assurance testing a lot of fabricated ICs comprising the steps of testing the differential I. sub. ddq of a sample of ICs at a plurality of different voltages, burning-in a sample of ICs, and then testing the functionality of the sample of ICs. The method of the present invention enables the reliability of an entire lot of ICs to be tested by determining an effective screening voltage for differential I. sub. ddq testing of the ICs, thereby eliminating the need both to burn-in and conduct post burn-in testing of all future lots of the ICs. The method of the present invention also enables fabrication facilities and workers to be engaged in other tasks rather than testing of ICs.

Isbn (Books And Publications)

Preisvorschriften Fur Sogenannten Preisfreien Wohnraum: Eine Juristische Sowie Preis- Und Allokationstheoretische Untersuchung

Author:
Thomas M. Hofacker
ISBN #:
3631357206

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