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Tian Xia, 5357 Pinnacle Dr, South Burlington, VT 05403

Tian Xia Phones & Addresses

South Burlington, VT   

Shelburne, VT   

16 Giles Dr, Essex Junction, VT 05452   

2900 Kingstown Rd, Kingston, RI 02881    401-7890948   

2590 Kingstown Rd, Kingston, RI 02881   

S Burlington, VT   

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Career records & work history

Medicine Doctors

Tian Xia

Specialties:
Anesthesiology
Work:
Fullerton Kimball Medical & Surgical Center
3412 W Fullerton Ave, Chicago, IL 60647
773-2358000 (phone) 773-2357018 (fax)
Kalina Pain Institute
5425 W Belmont Ave, Chicago, IL 60641
708-6288574 (phone) 866-2829069 (fax)
Integrated Pain Management
244 E Roosevelt Rd, Lombard, IL 60148
312-8424588 (phone) 620-4907255 (fax)
Integrated Pain Management
5569 W 95 St, Oak Lawn, IL 60453
708-5727990 (phone)
Education:
Medical School
Midwestern University/ Chicago College of Osteopathic Medicine
Graduated: 1998
Procedures:
Arthrocentesis, Osteopathic Manipulative Treatment
Conditions:
Carpel Tunnel Syndrome, Fractures, Dislocations, Derangement, and Sprains, Intervertebral Disc Degeneration, Migraine Headache, Osteoarthritis, Osteoporosis, Peripheral Nerve Disorders, Rotator Cuff Syndrome and Allied Disorders, Sciatica, Scoliosis or Kyphoscoliosis, Spinal Stenosis, Tempromandibular Joint Disorders (TMJ), Varicose Veins, Abdominal Hernia, Acute Sinusitis, Allergic Rhinitis, Alopecia Areata, Anemia, Anxiety Dissociative and Somatoform Disorders, Anxiety Phobic Disorders, Arterial Thromboembolic Disease, Bell's Palsy, Benign Paroxysmal Positional Vertigo, Bipolar Disorder, Bronchial Asthma, Bulimia Nervosa, Calculus of the Urinary System, Cardiac Arrhythmia, Chronic Pancreatitis, Chronic Sinusitis, Contact Dermatitis, Diabetes Mellitus (DM), Diabetic Peripheral Neuropathy, Disorders of Lipoid Metabolism, Epilepsy, Herpes Zoster, HIV Infection, Hypertension (HTN), Hypothyroidism, Internal Derangement of Knee Cartilage, Internal Derangement of Knee Ligaments, Irritable Bowel Syndrome (IBS), Lateral Epicondylitis, Multiple Sclerosis (MS), Overweight and Obesity, Plantar Fascitis, Restless Leg Syndrome, Rheumatoid Arthritis, Skin and Subcutaneous Infections, Substance Abuse and/or Dependency, Tension Headache, Venous Embolism and Thrombosis, Ventral Hernia
Languages:
English, Spanish
Description:
Dr. Xia graduated from the Midwestern University/ Chicago College of Osteopathic Medicine in 1998. He works in Oak Lawn, IL and 3 other locations and specializes in Anesthesiology. Dr. Xia is affiliated with Advocate Illinois Masonic Medical Center, Alexian Brothers Medical Center, Methodist Hospital Of Chicago, Presence Holy Family Medical Center, Weiss Memorial Hospital and Westlake

Tian Xia

Specialties:
Family Medicine, Internal Medicine
Work:
MedPost Urgent Care
12201 Hwy 92 STE D, Woodstock, GA 30188
770-5174621 (phone) 770-5176864 (fax)
Procedures:
Arthrocentesis, Destruction of Benign/Premalignant Skin Lesions, Electrocardiogram (EKG or ECG), Skin Tags Removal, Vaccine Administration
Conditions:
Abnormal Vaginal Bleeding, Acne, Acute Bronchitis, Acute Conjunctivitis, Acute Pharyngitis, Acute Sinusitis, Acute Upper Respiratory Tract Infections, Allergic Rhinitis, Anxiety Dissociative and Somatoform Disorders, Attention Deficit Disorder (ADD), Breast Disorders, Calculus of the Urinary System, Candidiasis, Contact Dermatitis, Depressive Disorders, Erectile Dysfunction (ED), Fractures, Dislocations, Derangement, and Sprains, Gastritis and Duodenitis, Gout, Hearing Loss, Hemorrhoids, Herpes Zoster, Hyperthyroidism, Migraine Headache, Otitis Media, Overweight and Obesity, Plantar Warts, Sciatica, Skin and Subcutaneous Infections, Substance Abuse and/or Dependency, Tinea Unguium, Abdominal Hernia, Acute Pancreatitis, Acute Renal Failure, Alcohol Dependence, Alopecia Areata, Alzheimer's Disease, Anal Fissure, Anal or Rectal Abscess, Anemia, Anxiety Phobic Disorders, Atopic Dermatitis, Atrial Fibrillation and Atrial Flutter, Bacterial Pneumonia, Bell's Palsy, Benign Paroxysmal Positional Vertigo, Benign Prostatic Hypertrophy, Benign Thyroid Diseases, Bipolar Disorder, Bronchial Asthma, Burns, Candidiasis of Vulva and Vagina, Cardiac Arrhythmia, Cardiomyopathy, Carpel Tunnel Syndrome, Cataract, Chickenpox, Cholelethiasis or Cholecystitis, Chronic Bronchitis, Chronic Fatigue Syndrome, Chronic Renal Disease, Chronic Sinusitis, Cirrhosis, Conduction Disorders, Constipation, Croup, Dermatitis, Diabetes Mellitus (DM), Disorders of Lipoid Metabolism, Diverticulitis, Emphysema, Endometriosis, Epilepsy, Female Infertility, Gastroesophageal Reflux Disease (GERD), Gastrointestinal Hemorrhage, Genital HPV, Gingival and Periodontal Diseases, Glaucoma, Gonorrhea, Hallux Valgus, Heart Failure, Herpes Genitalis, Herpes Simplex, HIV Infection, Hypertension (HTN), Hypothyroidism, Infectious Liver Disease, Infectious Mononucleosis, Inguinal Hernia, Intervertebral Disc Degeneration, Iron Deficiency Anemia, Irritable Bowel Syndrome (IBS), Ischemic Stroke, Lateral Epicondylitis, Male Infertility, Malignant Neoplasm of Female Breast, Menopausal and Postmenopausal Disorders, Multiple Sclerosis (MS), Non-Toxic Goiter, Obstructive Sleep Apnea, Orbital Infection, Osteoarthritis, Osteoporosis, Ovarian Dysfunction, Parkinson's Disease, Peptic Ulcer Disease, Peripheral Nerve Disorders, Plantar Fascitis, Pneumonia, Poisoning by Drugs, Meds, or Biological Substances, Premenstrual Syndrome (PMS), Prostatitis, Psoriasis, Pulmonary Embolism, Pulmonary Tuberculosis (TB), Rheumatoid Arthritis, Rosacea, Rotator Cuff Syndrome and Allied Disorders, Sarcoidosis, Schizophrenia, Spinal Stenosis, Sunburn, Systemic Lupus Erythematosus, Tempromandibular Joint Disorders (TMJ), Tinea Pedis, Transient Cerebral Ischemia, Urinary Incontinence, Urinary Tract Infection (UT), Varicose Veins, Venous Embolism and Thrombosis, Viral Pneumonia, Vitamin D Deficiency
Languages:
English
Description:
Dr. Xia works in Woodstock, GA and specializes in Family Medicine and Internal Medicine. Dr. Xia is affiliated with Wellstar North Fulton Hospital.

Tian Xia resumes & CV records

Resumes

Tian Xia Photo 29

Assistant Professor

Location:
Burlington, VT
Work:
Uvm
Assistant Professor
Tian Xia Photo 30

Tian Xia

Education:
University of Connecticut 2014 - 2016
Master of Science, Masters, Actuarial Science Beijing Institute of Technology 2010 - 2014
Bachelors, Bachelor of Science, Mathematics, Applied Mathematics
Tian Xia Photo 31

Professor

Location:
Burlington, VT
Industry:
Computer Hardware
Work:
University of Vermont
Professor University of Vermont May 2009 - Apr 2017
Associate Professor University of Vermont Sep 2003 - May 2009
Assistant Professor Ibm May 2002 - Aug 2002
Summer Internship
Education:
University of Rhode Island 2000 - 2003
Nanjing University of Posts and Telecommunications 1997 - 2000
Master of Science, Masters, Electrical Engineering Huazhong University of Science and Technology 1990 - 1994
Bachelors, Bachelor of Science, Engineering, Electronics
Skills:
Circuit Design, Simulations, Fpga, Cmos, Verilog, Cadence Virtuoso, Signal Processing, Matlab, Vlsi, Vhdl, Embedded Systems, Sensors, Microcontrollers, Image Processing, Pspice, Semiconductors, Computer Architecture, Digital Signal Processors, Labview, Latex, Mixed Signal, Analog, Characterization, Mathematica, Very Large Scale Integration, Analog Circuit Design, Simulink, Electrical Engineering, Pcb Design, Field Programmable Gate Arrays
Tian Xia Photo 32

Tian Xia

Tian Xia Photo 33

Tian Xia

Tian Xia Photo 34

Tian Xia

Tian Xia Photo 35

Tian Xia

Location:
United States
Tian Xia Photo 36

Tian Xia

Location:
United States

Publications & IP owners

Us Patents

Method And Apparatus For Diagnosing Broken Scan Chain Based On Leakage Light Emission

US Patent:
7426448, Sep 16, 2008
Filed:
Feb 3, 2004
Appl. No.:
10/771218
Inventors:
Peilin Song - Lagrangeville NY, US
Tian Xia - Burlington VT, US
Alan J. Weger - Mohegan Lake NY, US
Franco Stellari - Ho-Ho-Kus NJ, US
Stanislav V. Polonsky - Putnam Valley NY, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G06F 19/00
US Classification:
702117, 712 16
Abstract:
A mechanism for diagnosing broken scan chains based on leakage light emission is provided. An image capture mechanism detects light emission from leakage current in complementary metal oxide semiconductor (CMOS) devices. The diagnosis mechanism identifies devices with unexpected light emission. An unexpected amount of light emission may indicate that a transistor is turned off when it should be turned on or vice versa. All possible inputs may be tested to determine whether a problem exists with transistors in latches or with transistors in clock buffers. Broken points in the scan chain may then be determined based on the locations of unexpected light emission.

High Output Resistance, Wide Swing Charge Pump

US Patent:
7583116, Sep 1, 2009
Filed:
Aug 3, 2007
Appl. No.:
11/833500
Inventors:
Stephen D. Wyatt - Jericho VT, US
Tian Xia - Essex Junction VT, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H03L 7/06
US Classification:
327157, 327149, 327536
Abstract:
Disclosed are current sink and source circuits, a charge pump that incorporates them, and a phase locked loop that incorporates the charge pump. The current sink and source circuits each have a current mirror that biases a transistor connected to an output node. These circuits each further have a two-stage feedback amplifier to sense the current mirror drain voltage and to control the transistor gate voltage in order to stabilize the current mirror drain voltage independent of output voltage at the output node. The amplifier also increases output resistance at the output node. This configuration allows for a wide operation voltage range and ensures good circuit performance under a very low power supply. A charge pump that incorporates these circuits generates highly matched charging and discharging currents. A PLL that incorporates this charge pump exhibits minimal bandwidth shifts and minimal locking speed and jitter performance degradation.

Structure For A High Output Resistance, Wide Swing Charge Pump

US Patent:
7701270, Apr 20, 2010
Filed:
Aug 27, 2007
Appl. No.:
11/845249
Inventors:
Stephen D. Wyatt - Jericho VT, US
Tian Xia - Essex Junction VT, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H03L 7/06
US Classification:
327157, 327148
Abstract:
Disclosed are design structures for current sink and source circuits, a charge pump, and a phase locked loop. The current sink and source circuits each have a current mirror that biases a transistor connected to an output node. These circuits each further have a two-stage feedback amplifier to sense the current mirror drain voltage and to control the transistor gate voltage in order to stabilize the current mirror drain voltage independent of output voltage at the output node. The amplifier also increases output resistance at the output node. This configuration allows for a wide operation voltage range and ensures good circuit performance under a very low power supply. A charge pump that incorporates these circuits generates highly matched charging and discharging currents. A PLL that incorporates this charge pump exhibits minimal bandwidth shifts and minimal locking speed and jitter performance degradation.

Method And Apparatus For Diagnosing Broken Scan Chain Based On Leakage Light Emission

US Patent:
7788058, Aug 31, 2010
Filed:
May 6, 2008
Appl. No.:
12/115768
Inventors:
Peilin Song - Lagrangeville NY, US
Tian Xia - Burlington VT, US
Alan J. Weger - Mohegan Lake NY, US
Franco Stellari - Ho-Ho-Kus NJ, US
Stanislav V. Polonsky - Putnam Valley NY, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G06F 19/00
US Classification:
702117
Abstract:
A mechanism for diagnosing broken scan chains based on leakage light emission is provided. An image capture mechanism detects light emission from leakage current in complementary metal oxide semiconductor (CMOS) devices. The diagnosis mechanism identifies devices with unexpected light emission. An unexpected amount of light emission may indicate that a transistor is turned off when it should be turned on or vice versa. All possible inputs may be tested to determine whether a problem exists with transistors in latches or with transistors in clock buffers. Broken points in the scan chain may then be determined based on the locations of unexpected light emission.

Image Sensor Monitor Structure In Scribe Area

US Patent:
7915056, Mar 29, 2011
Filed:
Mar 20, 2008
Appl. No.:
12/051868
Inventors:
John J. Ellis-Monaghan - Grand Isle VT, US
Mark D. Jaffe - Shelburne VT, US
Sambasivan Narayan - Essex Junction VT, US
Anthony J. Perri - Jericho VT, US
Richard J. Rassel - Colchester VT, US
Tian Xia - Essex Junction VT, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G01R 31/26
US Classification:
438 14, 438 15, 438 17, 438 18, 257 48, 257E21521, 257E23179, 257E21524
Abstract:
A semiconductor die including a semiconductor chip and a test structure, located in a scribe area, is designed and manufactured. The test structure includes an array of complementary metal oxide semiconductor (CMOS) image sensors that are of the same type as CMOS image sensors employed in another array in the semiconductor chip and having a larger array size. Such a test structure is provided in a design phase by providing a design structure in which the orientations of the CMOS image sensors match between the two arrays. The test structure provides effective and accurate monitoring of manufacturing processes through in-line testing before a final test on the semiconductor chip.

Method And Apparatus For Increased Effectiveness Of Delay And Transition Fault Testing

US Patent:
8381050, Feb 19, 2013
Filed:
Nov 25, 2009
Appl. No.:
12/625703
Inventors:
Pamela S. Gillis - Jericho VT, US
Jack R. Smith - South Burlington VT, US
Tad J. Wilder - South Hero VT, US
Francis Woytowich - Charlotte VT, US
Tian Xia - Essex Junction VT, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G01R 31/28
G06F 11/00
US Classification:
714731, 714741, 714744
Abstract:
The invention disclosed herein provides increased effectiveness of delay and transition fault testing. The method of delay fault testing integrated circuits comprises the steps of creating a plurality of test clock gating groups. The plurality of test clock gating groups comprising elements defining inter-element signal paths within the integrated circuit. Each of the elements of the plurality of test clock gating groups share clock frequency and additional shared characteristics. At least one test signal is commonly and selectively connected through at least one low-speed gate transistor to each of the elements comprising each of the plurality of test clock gating groups based on membership in the test clock gating group. This invention can also be practiced using scan-enable gating groups for the same purposes.

Programmable Jitter Signal Generator

US Patent:
2005011, Jun 2, 2005
Filed:
Dec 2, 2003
Appl. No.:
10/725847
Inventors:
Keith Jenkins - Sleepy Hollow NY, US
Jien-Chung Lo - Kingston RI, US
Peilin Song - Lagrangeville NY, US
Tian Xia - Burlington VT, US
International Classification:
G06F001/04
US Classification:
327291000
Abstract:
A programmable jitter signal generator is provided that includes a jitter distribution control unit, a selection unit in signal communication with the jitter distribution control unit, and a delay unit in signal communication with the selection unit; and a corresponding method of generating a programmable jitter signal includes programming a control unit, receiving a reference signal, delaying the received reference signal by a multiple of a base time increment, and selecting a delayed reference signal delayed by a desired multiple of the base time increment in accordance with the programmed control unit.

Circuit Test System And Method Using A Wideband Multi-Tone Test Signal

US Patent:
2013022, Aug 29, 2013
Filed:
Feb 29, 2012
Appl. No.:
13/407811
Inventors:
Timothy M. Platt - Williston VT, US
Mustapha Slamani - South Burlington VT, US
Tian Xia - Essex Junction VT, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G06F 19/00
US Classification:
702117
Abstract:
Disclosed are a testing system and method incorporating a test signal generator for generating a test signal with multiple tones uniformly distributed across a wideband having a specific bandwidth. This test signal is generated based on user-specified test signal parameter(s) (e.g., using an orthogonal frequency-division multiplexing (OFDM) spread spectrum technique) and processed (e.g., converted from digital to analog or shifted to a different wideband having the same bandwidth), as necessary, so that it is suitable for application to a specific device under test and so that the tones account for the full range of frequencies with the wideband operation of that device under test. After it is applied to the device under test, the resulting output signal is captured, processed (e.g., converted back to digital or shifted back to the initial wideband), as necessary, and analyzed in order to determine the frequency responses associated with each of the tones.

Possible Relatives

Eva Xia  Hua C Xia  Hui Z Xia  Jennifer Xia  Jin Xia  Katie Xia  Leon E Xia  Tian L Lee  Tian S Lim  Tian R Richards 

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