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Timothy W Kiser, 73121 Mainview Dr, Mooresville, NC 28117

Timothy Kiser Phones & Addresses

Mooresville, NC   

Cornelius, NC   

Mesa, AZ   

N Charleston, SC   

Concord, NC   

Landis, NC   

Denver, NC   

N Charleston, SC   

7675 Flowes Store Rd, Concord, NC 28025    704-4336273   

Work

Company: L. gordons iron & metal - Statesville, NC Sep 2012 Position: Weigh master

Education

School / High School: Mitchell Community College- Statesville, NC 2003 Specialities: GED in Diploma

Mentions for Timothy W Kiser

Career records & work history

License Records

Timothy M Kiser

Licenses:
License #: BAA02427 - Expired
Category: Cosmetology/Barbering
Issued Date: Jul 2, 1996
Expiration Date: Jun 2, 1998
Type: Barber Apprentice

Timothy Kiser resumes & CV records

Resumes

Timothy Kiser Photo 32

Senior Vice President At Keck & Wood, Inc.

Location:
Charlotte, North Carolina Area
Industry:
Civil Engineering
Timothy Kiser Photo 33

Electronic Technician At At&T

Location:
Charlotte, North Carolina Area
Industry:
Telecommunications
Timothy Kiser Photo 34

Timothy Kiser

Location:
United States
Timothy Kiser Photo 35

Timothy Kiser - Statesville, NC

Work:
L. Gordons Iron & Metal - Statesville, NC Sep 2012 to Jan 2015
Weigh Master
Mike Dagenhart Builders - Stony Point, NC Aug 2006 to Jun 2012
Lead Carpenter
Education:
Mitchell Community College - Statesville, NC 2003 to 2003
GED in Diploma
North Iredell High School - Olin, NC 1985 to 1989
Carpentry

Publications & IP owners

Us Patents

Integrated Circuit Test System

US Patent:
5146161, Sep 8, 1992
Filed:
Apr 5, 1991
Appl. No.:
7/681803
Inventors:
Timothy J. Kiser - Tempe AZ
Assignee:
VLSI Technology, Inc. - San Jose CA
International Classification:
G01R 3128
US Classification:
324158R
Abstract:
A programmable clamping circuit is operated under the control of a tester comparator/driver circuit used to test the bi-directional input/output pins of an integrated circuit. The clamping circuit is operated during the floating or tri-state mode of operation of the pin undergoing test to clamp the potential on the input/output pin to a pre-determined voltage during any floating or tri-state mode in the test signal pattern. Control of the clamping circuit is effected in synchronism with the operation of the tester comparator/driver circuit.

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