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Tom X Nguyen, 50San Jose, CA

Known as:
Xuan Tung Nguyen Tung X Nguyen To M Nguyen Nguyen Tom
Related to:
Alan Tom Lim 58 Steven L Vo 58 Tam Nguyen 74 Carol Nguyen 35 Hung Nguyen 69 Lisa T Nguyen 67

Tom Nguyen Phones & Addresses

San Jose, CA   

Shillington, PA   

Silver Spring, MD   

Santa Clara, CA   

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Career records & work history

Medicine Doctors

Tom Nguyen Photo 1

Dr. Tom P Nguyen, Santa Clara CA - MD (Doctor of Medicine)

Specialties:
Internal Medicine
Address:
Kaiser Prmnnt Mdcl Ctr Hsptlst
700 Lawrence Expy Suite 3502, Santa Clara, CA 95051
408-8511000 (Phone)
Languages:
English
Vietnamese
Education:
Medical School
University of California At San Diego
Medical School
Santa Clara Valley Med Center
Tom Nguyen Photo 2

Dr. Tom C Nguyen, Houston TX - MD (Doctor of Medicine)

Specialties:
Thoracic Surgery
Address:
6400 Fannin St Suite 2850, Houston, TX 77030
713-5127200 (Fax)
5925 Almeda Rd Suite 12117, Houston, TX 77004
650-3875543 (Phone)
EMORY UNIVERSITY HOSPITAL
1364 Clifton Rd Ne, Atlanta, GA 30322
404-7787777 (Phone) 404-7785194 (Fax)
STANFORD CARDIOVASCULAR MEDICAL CENTER
300 Pasteur Dr Suite A265, Stanford, CA 94305
650-7256954 (Phone) 650-7255489 (Fax)
300 Pasteur Dr Suite H3591, Stanford, CA 94305
650-7234000 (Phone)
Languages:
English
Hospitals:
6400 Fannin St Suite 2850, Houston, TX 77030
5925 Almeda Rd Suite 12117, Houston, TX 77004
300 Pasteur Dr Suite H3591, Stanford, CA 94305
EMORY UNIVERSITY HOSPITAL
1364 Clifton Rd Ne, Atlanta, GA 30322
STANFORD CARDIOVASCULAR MEDICAL CENTER
300 Pasteur Dr Suite A265, Stanford, CA 94305
Stanford Hospital and Clinics
300 Pasteur Drive, Stanford, CA 94305
Education:
Medical School
Johns Hopkins University / School of Medicine

Tom T. Nguyen

Specialties:
Obstetrics & Gynecology
Work:
Sugarland Advanced Obstetrics & Gynecology Center
9722 Hwy 90 Alt STE 207, Sugar Land, TX 77478
281-9694162 (phone) 281-2650928 (fax)
Education:
Medical School
Baylor College of Medicine
Graduated: 1983
Conditions:
Abnormal Vaginal Bleeding, Breast Disorders, Candidiasis of Vulva and Vagina, Complicating Pregnancy or Childbirth, Conditions of Pregnancy and Delivery, Diabetes Mellitus Complicating Pregnancy or Birth, Endometriosis, Female Infertility, Hemorrhoids, Herpes Genitalis, Menopausal and Postmenopausal Disorders, Polycystic Ovarian Syndrome (PCOS), Premenstrual Syndrome (PMS), Uncomplicated or Low Risk Pregnancy and Delivery, Uterine Leiomyoma, Vitamin D Deficiency
Languages:
English, Spanish, Vietnamese
Description:
Dr. Nguyen graduated from the Baylor College of Medicine in 1983. He works in Sugar Land, TX and specializes in Obstetrics & Gynecology. Dr. Nguyen is affiliated with Memorial Hermann Southwest Hospital and Memorial Hermann Sugar Land Hospital.

Tom T. Nguyen

Specialties:
Diagnostic Radiology
Work:
Kaiser Permanente Medical GroupKaiser Permanente Sacramento Medical Center
2025 Morse Ave, Sacramento, CA 95825
916-9735000 (phone) 916-7463640 (fax)
Site
Languages:
English
Description:
Dr. Nguyen works in Sacramento, CA and specializes in Diagnostic Radiology. Dr. Nguyen is affiliated with Kaiser Permanente Sacramento Medical Center.

Tom Nguyen

Specialties:
Family Medicine
Work:
Better Health Medical Group
3985 Steve Reynolds Blvd STE K102, Norcross, GA 30093
678-3670390 (phone) 678-2453391 (fax)
Languages:
English, Spanish, Vietnamese
Description:
Dr. Nguyen works in Norcross, GA and specializes in Family Medicine. Dr. Nguyen is affiliated with Childrens Heathcare Of Atlanta At Scottish Rite and Gwinnett Medical Center.
Tom Nguyen Photo 3

Tom T Nguyen

Specialties:
Hospitalist
Internal Medicine
Education:
Vanderbilt University (1997)
Tom Nguyen Photo 4

Tom Phuc Nguyen, Santa Clara CA

Specialties:
Internal Medicine
Hospitalist
Work:
Kaiser Foundation Hospital - Santa Clara
900 Kiely Blvd, Santa Clara, CA 95051
Education:
University of California at San Diego (1995)
Tom Nguyen Photo 5

Tom Thanh Trung Nguyen

Specialties:
Radiology
Diagnostic Radiology
Education:
University of California at Davis (2001)

License Records

Tom Nguyen

Licenses:
License #: 807 - Expired
Category: Nail Technology
Issued Date: Jan 1, 2000
Effective Date: Feb 13, 2004
Expiration Date: Dec 31, 2003
Type: Nail Technician

Tom Viet Nguyen Rp

Licenses:
License #: 13537 - Expired
Category: Pharmacy
Issued Date: Nov 17, 2010
Effective Date: Jan 7, 2014
Expiration Date: Jan 1, 2014
Type: Pharmacist

Tom Nguyen resumes & CV records

Resumes

Tom Nguyen Photo 49

Tom Nguyen - Sacramento, CA

Work:
CalPERS 2013 to 2000
Actuarial Assistant Trainee Drogin, Kakigi & Associates - Berkeley, CA May 2012 to Jul 2013
Data Analyst
Education:
California State University - Hayward, CA 2011 to 2013
Master of Science in Statistics University of Bridgeport - Bridgeport, CT 2005 to 2007
Bachelor of Science in Mathematics
Skills:
Excel, Access, VBA, SAS, R, SQL
Tom Nguyen Photo 50

Tom Nguyen - Clarksburg, MD

Work:
Unisys Jul 2014 to 2000
Analyst - Competitive Analytics American University Student Investment Fund - Washington, DC Jan 2014 to May 2014
Investment Analyst Intern L-3 Communication May 2013 to Sep 2013
Corporate Strategy Intern United States Marine Corps Jul 2006 to Jul 2010
Corporal, Warehouse Logistics Operation Manager
Education:
American University, Kogod School of Business - Washington, DC 2012 to 2014
Bachelor of Science in Finance
Skills:
Equity Research, Investment Research,Competitive Analysis, Advance excel, power point, financial modeling
Tom Nguyen Photo 51

Tom Nguyen - San Jose, CA

Work:
The Fly Program Jun 2012 to 2000
Volunteer Worker The Home Depot 2010 to 2000
Asset Protection Specialist Best Buy - Milpitas, CA Sep 2007 to Sep 2010
Asset Protection Specialists
Education:
Evergreen Valley College - San Jose, CA 2007
Associate of Arts in Administration of Justice San Jose State University - San Jose, CA
Justice Studies
Skills:
8 years of loss prevention experience
Tom Nguyen Photo 52

Tom Nguyen - San Jose, CA

Work:
GalaSys Solutions 2013 to 2000
CMO/VP International Sales MISUMI - San Jose, CA 2011 to 2013
Account Manager SMC CORPORATION OF AMERICA - San Jose, CA 2005 to 2011
Account Manager VALIN CORPORATION 2004 to 2005
Inside Senior OEM Account Manager VALIN CORPORATION - Sunnyvale, CA 1997 to 2005
Customer Service Representative VALIN CORPORATION - Sunnyvale, CA 2003 to 2004
Mechanical Technical Support Representative VALIN CORPORATION 1999 to 2004
Key Account Specialist VALIN CORPORATION 1997 to 1999
Inside Sales Representative
Education:
California State University, Chico - Chico, CA 1990 to 1994
Bachelor of Science in Business Administration
Tom Nguyen Photo 53

Tom Nguyen - Sacramento, CA

Work:
Slakey Brothers 2006 to 2000
Network Engineer (Contractor) Blue Shield of California - El Dorado Hills, CA 2011 to 2014
Network Engineer (Contractor) Payment Processing Inc - Newark, CA 2003 to 2006
Business Development Inzap - Mountain View, CA 2001 to 2003
Business Development, Supervisor
Education:
Sacramento City College - Sacramento, CA 2011
Associate Degree in Network Administration and Design (two degrees) California State University Sonoma - Rohnert Park, CA 2010
Computer Science Diablo Valley College - Pleasant Hill, CA 2002
Associate Degree in Computer Science
Tom Nguyen Photo 54

Tom Nguyen - San Jose, CA

Work:
WhiteHat Security Aug 2011 to 2000
Application Security Researcher ATR/Credence Systems - Milpitas, CA Mar 2007 to Sep 2008
Software QA Engineer Intern/Software Technician II Videonline - Redwood City, CA Mar 2006 to Sep 2006
Intern
Education:
San Jose State University - San Jose, CA Jun 2010
Bachelor of Science in Computer Science

Publications & IP owners

Us Patents

Structures For Testing Circuits And Methods For Fabricating The Structures

US Patent:
6924654, Aug 2, 2005
Filed:
Apr 16, 2003
Appl. No.:
10/418441
Inventors:
Konstantine N. Karavakis - Pleasanton CA, US
Tom T. Nguyen - San Jose CA, US
Assignee:
Celerity Research, Inc. - San Jose CA
International Classification:
G01R031/02
H01R012/00
US Classification:
324754, 3241581, 439 66
Abstract:
One embodiment of the present invention is a structure useful for testing circuits that includes: (a) a flexible substrate having contactors on a first side and pads on a second side; (b) a rigid substrate having vias aligned with the pads on the second side of the flexible substrate; (c) an adhesive layer comprised of a compliant adhesive material having vias aligned with the pads on the second side of the flexible substrate; the adhesive layer being affixed to the flexible substrate and the rigid substrate; (d) a card; (e) electrical connectors that are retained in the vias of the rigid substrate and the adhesive layer, which electrical connectors have first and second retractable ends, wherein the first retractable ends contact pads on the substrate, and the second retractable ends contact pads on the card; and (f) a clamp that is adapted to fit over the substrate and the adhesive layer, the clamp having an opening to provide access to the contactors, wherein the clamp is connected to the card.

Probe Structures Using Clamped Substrates With Compliant Interconnectors

US Patent:
6946859, Sep 20, 2005
Filed:
Apr 16, 2003
Appl. No.:
10/418512
Inventors:
Konstantine N. Karavakis - Pleasanton CA, US
Tom T. Nguyen - San Jose CA, US
Assignee:
Celerity Research, Inc. - San Jose CA
International Classification:
G01R031/02
H01R012/00
US Classification:
324755, 324754, 439 66
Abstract:
One embodiment of the present invention is a structure useful for testing circuits that includes: (a) a substrate having contactors on a first side and pads on a second side; (b) a card having pads on a first side; and (c) interconnectors that electrically connect the pads on the second side of the substrate with the pads on the card; wherein at least one of the interconnectors includes at least a portion that does not melt at temperatures in a range from about 183 C. to about 230 C. , and the distance between the substrate and the card is determined by a dimension of the at least a portion.

Structures For Testing Circuits And Methods For Fabricating The Structures

US Patent:
6998864, Feb 14, 2006
Filed:
Jun 28, 2005
Appl. No.:
11/169987
Inventors:
Konstantine N. Karavakis - Pleasanton CA, US
Tom T. Nguyen - San Jose CA, US
Assignee:
Celerity Research, Inc. - San Jose CA
International Classification:
G01R 31/02
US Classification:
324761, 324754
Abstract:
One embodiment of the present invention is a structure useful for testing circuits that includes: (a) a flexible substrate having contactors on a first side and pads on a second side; (b) a rigid substrate having vias aligned with the pads on the second side of the flexible substrate; (c) an adhesive layer comprised of a compliant adhesive material having vias aligned with the pads on the second side of the flexible substrate; the adhesive layer being affixed to the flexible substrate and the rigid substrate; (d) a card; (e) electrical connectors that are retained in the vias of the rigid substrate and the adhesive layer, which electrical connectors have first and second retractable ends, wherein the first retractable ends contact pads on the substrate, and the second retractable ends contact pads on the card; and (f) a clamp that is adapted to fit over the substrate and the adhesive layer, the clamp having an opening to provide access to the contactors, wherein the clamp is connected to the card.

Discovery And Isolation Of Misbehaving Devices In A Data Storage System

US Patent:
7036042, Apr 25, 2006
Filed:
Aug 16, 2002
Appl. No.:
10/222390
Inventors:
Tom Nguyen - San Jose CA, US
Assignee:
3PARdata - Fremont CA
International Classification:
G06F 11/00
US Classification:
714 7, 714 4, 398 2, 398 3, 370221, 370222, 370223
Abstract:
A data storage system includes controller nodes and a storage component. The controller nodes couple the storage component to a host. The storage component includes a controller and sleds with disk drives. The host and the storage component form an arbitrated loop. When the arbitrated loop is down, the controller removes the storage component from the arbitrated loop so the controller, the sleds, and the disk drives form an internal loop. When the internal loop is also down, the controller tests each of the sleds individually and marks those that are not responding properly. If a sled is responding properly the controller tests each of the drives in that sled individually and marks those that are not responding properly. The controller adds back into the internal loop the sleds and the drives that are not marked as bad, and then the storage component back into the arbitrated loop.

Preventing Damage Of Storage Devices And Data Loss In A Data Storage System

US Patent:
7146521, Dec 5, 2006
Filed:
Aug 21, 2002
Appl. No.:
10/226823
Inventors:
Tom Nguyen - San Jose CA, US
Assignee:
3PARdata, Inc. - Fremont CA
International Classification:
G06F 11/00
US Classification:
714 2, 714 1, 714 25, 702130, 718105
Abstract:
A data storage system and method capable of reducing the operating temperature of the data storage system, removing any overheating storage devices from operation, reconstructing data, and evacuating data from the overheating storage devices before the devices and the data are damaged or lost.

Connecting A Probe Card And An Interposer Using A Compliant Connector

US Patent:
7170306, Jan 30, 2007
Filed:
Mar 12, 2003
Appl. No.:
10/386875
Inventors:
Konstantine N. Karavakis - Pleasanton CA, US
Tom T. Nguyen - San Jose CA, US
Assignee:
Celerity Research, Inc. - San Jose CA
International Classification:
G01R 31/02
H01R 43/00
US Classification:
324755, 29825, 29831
Abstract:
One embodiment of the present invention is a method for fabricating a structure useful for testing circuits that includes steps of: (a) aligning a first side of a connector-holder comprised of electrical connectors having retractable ends that are extendable out of the first side of the connector-holder and having retractable ends that are extendable out of a second side of the connector-holder with a substrate; and (b) connecting ends extendable out of the first side to pads on the substrate to form the structure.

Structures For Testing Circuits And Methods For Fabricating The Structures

US Patent:
2004017, Sep 16, 2004
Filed:
Apr 16, 2003
Appl. No.:
10/418440
Inventors:
Konstantine Karavakis - Pleasanton CA, US
Tom Nguyen - San Jose CA, US
Assignee:
Nexcleon, Inc. - Sunnyvale CA
International Classification:
H01L023/02
US Classification:
174/052400
Abstract:
One embodiment of the present invention is a structure useful for testing circuits that includes: (a) a substrate having contactors on a first side and pads on a second side; (b) a card having pads on a first side; (c) an interconnector that electrically connects the pads on the second side of the substrate with the pads on the card, the interconnector comprising a connector-holder comprised of electrical connectors having first and second retractable ends that are extendable out of a first and second side of the connector-holder, respectively, wherein the first retractable ends contact pads on the substrate, and the second retractable ends contact pads on the card; and (d) a clamp that is adapted to fit over the substrate and the connector-holder, the clamp having an opening to provide access to the contactors, and which clamp is connected to the card.

Structures For Testing Circuits And Methods For Fabricating The Structures

US Patent:
2004017, Sep 16, 2004
Filed:
Mar 12, 2003
Appl. No.:
10/387216
Inventors:
Konstantine Karavakis - Pleasanton CA, US
Tom Nguyen - San Jose CA, US
Assignee:
Nexcleon, Inc. - Sunnyvale CA
International Classification:
H05K001/00
US Classification:
174/250000
Abstract:
One embodiment of the present invention is a method for fabricating a structure useful for testing circuits that includes steps of: (a) aligning interconnectors with a Probe Card; (b) aligning a substrate with the interconnectors; and (c) connecting the interconnectors to the Probe Card and the substrate; wherein the interconnectors are electrical conductors that have at least a core that does not change shape as a result of applying heat during the step of connecting.

Possible Relatives

Cynthia N Nguyen  David Nguyen  Dawn Nguyen  De V Nguyen  Deana P Nguyen  Dai V Nguyen  Daisy P Nguyen  Tom A Johnson  Tom Johnston  Tom J White 

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