Career records & work history
Lawyers & Attorneys
Wei Cai - Lawyer
ISLN:
1000248872
Admitted:
2017
University:
Columbia Law School
Wei Cai, 5712059 Crestfield Ct, Cincinnati, OH 45249
Wei Cai Phones & Addresses
12059 Crestfield Ct, Cincinnati, OH 45249
Culver City, CA
Canoga Park, CA
431 Savoy St, Los Angeles, CA 90012
Work
Position:
Service Occupations
Education
Degree:
High school graduate or higher
Mentions for Wei Cai
Wei Cai resumes & CV records
Resumes
Wei Ming Jimmy Cai
Wei Cai
Wei Cai
Wei Hao Cai
Wei Cai
Wei Cai
Wei Cai
Publications & IP owners
Us Patents
Methods, Systems, And Devices For Burn-In Testing Of Optoelectronic Devices
US Patent:
2004013, Jul 15, 2004
Filed:
Oct 29, 2003
Appl. No.:
10/696759
Inventors:
Wei Cai - Arcadia CA, US
John Chen - Rowland Heights CA, US
Chun Lei - Arcadia CA, US
Robert Shih - Arcadia CA, US
John Chen - Rowland Heights CA, US
Chun Lei - Arcadia CA, US
Robert Shih - Arcadia CA, US
Assignee:
Finisar Corporation
International Classification:
G01R031/26
G01R031/02
G01R031/02
US Classification:
324/767000, 324/760000
Abstract:
System and methods for life testing laser diodes is disclosed. The system includes a burn-in rack having a plurality of optoelectronic devices mounted within respective holders and electrical signal connectors that electrically couple the optoelectronic devices to a first electrical connector. A test apparatus holds the burn-in rack and has optical detectors arranged to receive electromagnetic radiation from the mounted optoelectronic devices and couple the output signals from the optical detectors to a second electrical connector. A computer electrically communicates with the connectors and generates a drive current deliverable to each optoelectronic device and receives data from the optical detectors that is based upon the output from each optoelectronic device. The measured optical power output from each optoelectronic device is stored at the computer and following analysis the optoelectronic devices are either removed from the rack or subjected to additional burn-in processes.
Isbn (Books And Publications)
Computer Simulations Of Dislocations
Author:
Wei Cai
ISBN #:
0198526148
Random Processes In Physics And Finance
Author:
Wei Cai
ISBN #:
0198567766
Possible Relatives
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