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William J Smurthwaite DeceasedDevault, PA

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Devault, PA   

Malvern, PA   

Collegeville, PA   

Landenberg, PA   

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William Smurthwaite

Location:
Greater Philadelphia Area
Industry:
Semiconductors

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Us Patents

Manually Driven Wheelchair

US Patent:
2008025, Oct 16, 2008
Filed:
Apr 10, 2007
Appl. No.:
11/786142
Inventors:
William J. Smurthwaite - Malvern PA, US
International Classification:
B62M 1/14
A61G 5/02
US Classification:
2802501
Abstract:
A wheelchair includes a standard foldable frame for supporting a seat with a first and second drive wheel driven by drive levers. Each wheel has a transmission providing for three forward speeds and a reverse speed, as well as a neutral position. The transmissions for the two wheels may be constructed of identical parts with the wheels being caused to rotate in opposite directions from the driving lever merely by reversing the direction of the pawls within the transmissions. The ratchet drive surfaces are provided with pawl engaging surfaces which may be driven in either of two directions. The wheelchair does not require any bulky equipment and the hub containing the transmission may be the size of a bicycle hub. The transmissions in both wheels are shifted by a single control. The wheelchair is provided with disk brakes.

Testing Asynchronous Circuits

US Patent:
6246971, Jun 12, 2001
Filed:
Jan 5, 1999
Appl. No.:
9/225654
Inventors:
Bahram Ghaffarzadeh Kermani - Whitehall PA
William James Smurthwaite - Collegeville PA
James Frank Vomero - Catasauqua PA
Assignee:
Lucent Technologies Inc. - Murray Hill NJ
International Classification:
G01R 3126
US Classification:
702119
Abstract:
A method and system for testing a circuit. A test program is downloaded into the circuit, which causes the circuit to provide a serial test output pattern comprising a series of identical signals to indicate whether the circuit passes the test. Signals of the test output pattern are compared against corresponding signals of an expected test output pattern only for non-masked signals of the expected test output pattern, wherein the expected test output pattern is masked for a maximum tolerable time period around an expected test output pattern start time.

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William Smurthwaite

Address:
1089 Rees Rd, Malvern, PA 19355
VIN:
5J6RE48317L014135
Make:
HONDA
Model:
CR-V
Year:
2007

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