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Yu GuanFremont, CA

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Yue Guan 37

Yu Guan Phones & Addresses

Fremont, CA   

Redwood City, CA   

North Bergen, NJ   

Jersey City, NJ   

Corona, NY   

New York, NY   

Arlington, VA   

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Lawyers & Attorneys

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Yu Guan - Lawyer

Address:
Norton Rose Hong Kong
687-13256xx (Office)
Licenses:
New York - Delinquent 2010
Education:
Columbia Law School

Medicine Doctors

Yu Guan

Specialties:
Family Medicine
Work:
Tidewater Physician Multi SpecialtyTidewater Physicians Multispecialty Group
307 Cook Rd, Yorktown, VA 23690
757-8987261 (phone) 757-8900139 (fax)
Site
Tidewater Physician Multi Specialty
2 Bernardine Dr, Newport News, VA 23602
757-8866877 (phone) 757-9473232 (fax)
Site
Education:
Medical School
Hunan Med Univ, Changsha City, Hunan, China
Graduated: 1992
Procedures:
Cardiac Stress Test, Lumbar Puncture, Vaccine Administration, Electrocardiogram (EKG or ECG)
Conditions:
Acute Sinusitis, Atrial Fibrillation and Atrial Flutter, Pneumonia, Abnormal Vaginal Bleeding, Acne, Acute Bronchitis, Acute Conjunctivitis, Acute Myocardial Infarction (AMI), Acute Pharyngitis, Acute Renal Failure, Acute Upper Respiratory Tract Infections, Allergic Rhinitis, Anemia, Angina Pectoris, Anxiety Dissociative and Somatoform Disorders, Anxiety Phobic Disorders, Atopic Dermatitis, Attention Deficit Disorder (ADD), Bacterial Pneumonia, Benign Paroxysmal Positional Vertigo, Benign Prostatic Hypertrophy, Benign Thyroid Diseases, Bronchial Asthma, Burns, Calculus of the Urinary System, Candidiasis, Candidiasis of Vulva and Vagina, Cardiac Arrhythmia, Cervical Cancer, Chronic Bronchitis, Chronic Renal Disease, Chronic Sinusitis, Cirrhosis, Constipation, Contact Dermatitis, Dehydration, Dementia, Dermatitis, Diabetes Mellitus (DM), Disorders of Lipoid Metabolism, Diverticulosis, Endometriosis, Erectile Dysfunction (ED), Fractures, Dislocations, Derangement, and Sprains, Gastritis and Duodenitis, Gastroesophageal Reflux Disease (GERD), Gastrointestinal Hemorrhage, Genital HPV, Gout, Hallux Valgus, Heart Failure, Hemolytic Anemia, Hemorrhoids, Herpes Simplex, Herpes Zoster, HIV Infection, Hypertension (HTN), Hyperthyroidism, Hypothyroidism, Infectious Liver Disease, Infectious Mononucleosis, Inflammatory Bowel Disease (IBD), Intervertebral Disc Degeneration, Intestinal Obstruction, Irritable Bowel Syndrome (IBS), Ischemic Heart Disease, Ischemic Stroke, Leukemia, Lung Cancer, Malignant Neoplasm of Female Breast, Meningitis, Menopausal and Postmenopausal Disorders, Migraine Headache, Multiple Sclerosis (MS), Obstructive Sleep Apnea, Osteoarthritis, Osteomyelitis, Osteoporosis, Otitis Media, Overweight and Obesity, Peripheral Nerve Disorders, Plantar Fascitis, Polycystic Ovarian Syndrome (PCOS), Psoriasis, Pulmonary Embolism, Rheumatoid Arthritis, Sarcoidosis, Sciatica, Septicemia, Skin and Subcutaneous Infections, Substance Abuse and/or Dependency, Tempromandibular Joint Disorders (TMJ), Tension Headache, Tinea Unguium, Urinary Tract Infection (UT), Varicose Veins, Venous Embolism and Thrombosis, Vitamin D Deficiency
Languages:
English, Spanish
Description:
Dr. Guan graduated from the Hunan Med Univ, Changsha City, Hunan, China in 1992. She works in Newport News, VA and 1 other location and specializes in Family Medicine. Dr. Guan is affiliated with Bon Secours Mary Immaculate Hospital.

Yu Guan resumes & CV records

Resumes

Yu Guan Photo 45

Yu Guan

Yu Guan Photo 46

Yu Guan

Yu Guan Photo 47

Planner At Spectra-Physics

Location:
San Francisco Bay Area
Industry:
Electrical/Electronic Manufacturing
Yu Guan Photo 48

Student At The University Of Connecticut School Of Medicine

Location:
United States
Industry:
Consumer Goods
Education:
The University of Connecticut School of Medicine 2008 - 2010
Yu Guan Photo 49

Yu Guan - New York, NY

Work:
Loan Department - New York, NY Aug 2013 to Sep 2013
Mortgage Loan Officer Assistant Carey Business School - Baltimore, MD Oct 2012 to Jul 2013
Member of Honor Coucil Human Resource, Agricultural Bank of China (Jilin) - Changchun, China Nov 2011 to Nov 2011
Recruitment Assistant Department of Accounting, Finance Bureau of Changchun Oct 2011 to Nov 2011
Accountant Assistant Enactus - Changchun, China Oct 2008 to May 2011
President
Education:
Johns Hopkins University Carey Business School - Washington, DC 2012 to 2013
Master of Science in Finance Jilin University - Changchun, Jilin, China 2008 to 2012
Bachelor of Business Administration in Accounting Hong Kong Baptist University - Hong Kong 2010 to 2010
Accounting
Skills:
MS Office (Word, Excel, PowerPoint, Publisher), SPSS, Adobe Photoshop, PowerPoint, Microsoft Word, Microsoft Excel, Financial Reporting, Corporate Finance, Financial Analysis, Accounting, Cross-cultural Teams, Monte Carlo Simulation
Yu Guan Photo 50

Yu Guan

Location:
United States

Publications & IP owners

Wikipedia

Yu Guan Photo 51

Guan Yu

Guan Yu (died 220) was a general serving under the warlord Liu Bei during the late Eastern Han Dynasty of China. He played a significant role in the civil war that led

Us Patents

Apparatus And Methods For Reducing Thin Film Color Variation In Optical Inspection Of Semiconductor Devices And Other Surfaces

US Patent:
6570650, May 27, 2003
Filed:
Sep 7, 2001
Appl. No.:
09/948974
Inventors:
Yu Guan - San Jose CA
Hong Fu - Fremont CA
Steven R. Lange - Alamo CA
Assignee:
KLA-Tenor Corporation - San Jose CA
International Classification:
G01N 2188
US Classification:
3562374, 3562371, 3562372, 3562373, 3562375, 250205, 25055926
Abstract:
Disclosed are methods and apparatus for designing an optical spectrum of an illumination light beam within an optical inspection system. A set of conditions for inspecting a film on a sample by directing an illumination light beam at the sample is determined. At least a portion of the illumination light beam is reflected off the sample and used to generate an image of at least a portion of the film on the sample. A plurality of peak wavelength values are determined for the optical spectrum of the illumination light beam so as to control color variation in the image of the film portion. The determination of the peak wavelengths is based on the determined set of conditions and a selected thickness range of the film. In one specific embodiment, the color variation is reduced, while in another embodiment the color variation is increased to enhance pattern contrast. An apparatus which implements the designed optical spectrum is also disclosed.

Monitoring Substrate Processing Using Reflected Radiation

US Patent:
6831742, Dec 14, 2004
Filed:
Oct 23, 2000
Appl. No.:
09/695577
Inventors:
Zhifeng Sui - Milpitas CA
Hongqing Shan - Cupertino CA
Nils Johansson - Los Gatos CA
Hamid Noorbakhsh - Fremont CA
Yu Guan - San Jose CA
Assignee:
Applied Materials, Inc - Santa Clara CA
International Classification:
G01J 400
US Classification:
356369, 356364, 356630, 438700, 216 2
Abstract:
A substrate processing apparatus comprises a chamber capable of processing a substrate , a radiation source to provide a radiation, a radiation polarizer adapted to polarize the radiation to one or more polarization angles that are selected in relation to an orientation of a feature being processed on the substrate , a radiation detector to detect radiation reflected from the substrate during processing and generate a signal, and a controller to process the signal.

Methods For Forming A Calibration Standard And Calibration Standards For Inspection Systems

US Patent:
7027146, Apr 11, 2006
Filed:
Jun 27, 2002
Appl. No.:
10/185308
Inventors:
Ian Smith - Los Gatos CA, US
Christian Wolters - Campbell CA, US
Yu Guan - San Jose CA, US
Don Brayton - Sunland CA, US
Assignee:
KLA-Tencor Technologies Corp. - Milpitas CA
International Classification:
G01N 21/88
US Classification:
3562436
Abstract:
Methods for forming calibration standards for an inspection system and calibration standards are provided. One method includes scanning a first and a second specimen with an optical system. Master standard particles having a lateral dimension traceable to a national or international authority or first principles measurements are deposited on the first specimen. Product standard particles are deposited on the second specimen. In addition, the method includes determining a lateral dimension of the product standard particles by comparing data generated by scanning the two specimens. One calibration standard includes particles having a lateral dimension of less than about 100 nm deposited on a specimen. A distribution of the lateral dimension has a full width at half maximum of less than about 3%. The uncertainty of the lateral dimension is less than about 2%.

Determination Of Absolute Dimensions Of Particles Used As Calibration Standards For Optical Measurement System

US Patent:
2013000, Jan 3, 2013
Filed:
Jun 15, 2012
Appl. No.:
13/524147
Inventors:
Yu Guan - Pleasanton CA, US
Assignee:
KLA-TENCOR CORPORATION - Milpitas CA
International Classification:
G01N 21/84
G06F 15/00
US Classification:
3562434, 702150
Abstract:
The present invention includes providing a plurality of standard particles; providing a substantially crystalline material having one or more characteristic spatial parameters, disposing the plurality of standard particles proximate to a portion of the substantially crystalline material, acquiring imagery data of the plurality of standard particles and the portion of the substantially crystalline material, establishing a spatial relationship between the plurality of standard particles and the portion of the substantially crystalline material utilizing the acquired imagery data, and determining one or more spatial parameters of the plurality of standard particles utilizing the one or more characteristic spatial parameters of the substantially crystalline material and the established spatial relationship between the plurality of standard particles and the portion of the substantially crystalline material.

Plasma Processing Apparatus

US Patent:
2022041, Dec 29, 2022
Filed:
May 23, 2022
Appl. No.:
17/751048
Inventors:
- Beijing, CN
- Fremont CA, US
Yu Guan - Pleasanton CA, US
International Classification:
H01J 37/32
Abstract:
A plasma processing apparatus including a processing chamber having one or more sidewalls and a dome is provided. The plasma processing apparatus includes a workpiece support disposed in the processing chamber configured to support a workpiece during processing, an induction coil assembly for producing a plasma in the processing chamber, a Faraday shield disposed between the induction coil assembly and the dome, the Faraday shield comprising an inner portion and an outer portion, and a thermal management system. The thermal management system including one or more heating elements configured to heat the dome, and one or more thermal pads disposed between an outer surface of the dome and the heating elements, wherein the one or more thermal pads are configured to facilitate heat transfer between the one or more heating elements and the dome. Thermal management systems and methods for processing workpieces are also provided.

Method And System For Intrinsic Led Heating For Measurement

US Patent:
2015031, Nov 5, 2015
Filed:
Apr 29, 2015
Appl. No.:
14/699880
Inventors:
- Milpitas CA, US
Yu Guan - Pleasanton CA, US
James George - Berkeley CA, US
International Classification:
G01J 1/18
G01J 1/04
G01J 3/02
H05B 33/08
Abstract:
The present disclosure provides methods and apparatus for testing light-emitting diodes (LEDs), for example, measuring the optical radiation of an LED. In a method, a pulse-width modulated signal is provided to the LED. One or more characteristics of the PWM signal are varied so as to provide a forward voltage, V, corresponding to a target junction temperature, T, of the LED. The optical radiation of the LED is measured when the LED obtains the target junction temperature.

Light-Emitting Device Test Systems

US Patent:
2015031, Nov 5, 2015
Filed:
Apr 27, 2015
Appl. No.:
14/696891
Inventors:
- Milpitas CA, US
Alan BRODIE - Palo Alto CA, US
James GEORGE - Berkeley CA, US
Yu GUAN - Pleasanton CA, US
Ralph NYFFENEGGER - Palo Alto CA, US
International Classification:
G01R 31/26
Abstract:
Light-emitting devices, such as LEDs, are tested using a photometric unit. The photometric unit, which may be an integrating sphere, can measure flux, color, or other properties of the devices. The photometric unit may have a single port or both an inlet and outlet. Light loss through the port, inlet, or outlet can be reduced or calibrated for. These testing systems can provide increased reliability, improved throughput, and/or improved measurement accuracy.

Possible Relatives

Dong P Guan  Donna S Guan  Eddie S Guan  Edward D Guan  Eric Y Guan  Fei Y Guan  Frank C Guan  Yu H Lam  Yu Lee  Yu D Li 

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