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Yuqing Zhu14 Korinthian Way, Andover, MA 01810

Yuqing Zhu Phones & Addresses

14 Korinthian Way, Andover, MA 01810    978-4092468   

Laconia, NH   

Work

Position: Professional/Technical

Education

Degree: Graduate or professional degree

Emails

y***[email protected]
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Yuqing Zhu resumes & CV records

Resumes

Yuqing Zhu Photo 19

Optical Engineer

Location:
Andover, MA
Industry:
Defense & Space
Work:
General Dynamics Advanced Information Systems Apr 2006 - Oct 2012
Senior Advance Engineer Flir Systems Apr 2006 - Oct 2012
Optical Engineer Dimensional Photonics International Nov 2004 - Apr 2006
Senior Optical Engineer Corning Incorporated Oct 2000 - Apr 2003
Senior Engineer University of Virginia Jul 1999 - Oct 2000
Research Associate University of Maryland Jun 1998 - Jul 1999
Postdoctoral Research Associate
Education:
Nankai High School
Xi'an Jiaotong University
Bachelors, Bachelor of Science, Electrical Engineering Institute of Semiconductor, Chinese Academy of Sciences
Doctorates, Doctor of Philosophy
Skills:
Optics, Photonics, Laser, Metrology, Sensors, Optoelectronics, Zemax, Optical Engineering, Semiconductors, Characterization, Mems, Optical Fiber, Signal Processing, Fiber Optics, Optical Communications, Labview, Interferometry, Nonlinear Optics, Laser Physics, Electro Optics
Yuqing Zhu Photo 20

Yuqing Zhu

Yuqing Zhu Photo 21

Yuqing Zhu

Yuqing Zhu Photo 22

Yuqing Zhu

Yuqing Zhu Photo 23

Yuqing Zhu

Publications & IP owners

Us Patents

Multiple Channel Interferometric Surface Contour Measurement System

US Patent:
2008016, Jul 10, 2008
Filed:
Apr 4, 2006
Appl. No.:
11/910638
Inventors:
Robert F. Dillon - Chelmsford MA, US
Neil Judell - Newtonville MA, US
Yi Qian - Acton MA, US
Yuqing Zhu - Andover MA, US
D. Scott Ackerson - Windham NH, US
Gurpreet Singh - Providence RI, US
Assignee:
DIMENSIONAL PHOTONICS INTERNATIONAL, INC. - Wilmington MA
International Classification:
G01C 11/12
G02B 27/00
G02B 7/00
G01N 21/00
US Classification:
356 2, 359578, 359896, 356 73
Abstract:
Described is a multiple channel interferometric surface contour measurement system. The measurement system includes a multiple channel interferometer projector, a digital camera and a processor. The projector includes two or more interferometer channels. Each channel has an optical axis spatially separate from the optical axes of the other channels. Each channel projects a fringe pattern onto the surface of an object to be measured. Image data for the fringe patterns projected on the object surface are acquired by the digital camera. The processor controls the projection of the fringe patterns of different spatial frequencies, adjusts the phase of each fringe pattern and generates surface contour data in response to the camera image data. The multiple channel interferometric surface contour measurement system provides numerous advantages over conventional single channel interferometric systems, including reduced sensitivity to optical noise, improved stability and increased measurement accuracy.

Multiple Channel Interferometric Surface Contour Measurement System

US Patent:
2009032, Dec 31, 2009
Filed:
Sep 3, 2009
Appl. No.:
12/553526
Inventors:
Robert F. Dillon - Chelmsford MA, US
Neil Judell - Newtonville MA, US
Yi Qian - Acton MA, US
Yuqing Zhu - Andover MA, US
D. Scott Ackerson - Windham NH, US
Gurpreet Singh - Providence RI, US
Assignee:
DIMENSIONAL PHOTONICS INTERNATIONAL, INC. - Wilmington MA
International Classification:
G03B 17/00
US Classification:
396428
Abstract:
Described is a multiple channel interferometric surface contour measurement system. The measurement system includes a multiple channel interferometer projector, a digital camera and a processor. The projector includes two or more interferometer channels. Each channel has an optical axis spatially separate from the optical axes of the other channels. Each channel projects a fringe pattern onto the surface of an object to be measured. Image data for the fringe patterns projected on the object surface are acquired by the digital camera. The processor controls the projection of the fringe patterns of different spatial frequencies, adjusts the phase of each fringe pattern and generates surface contour data in response to the camera image data. The multiple channel interferometric surface contour measurement system provides numerous advantages over conventional single channel interferometric systems, including reduced sensitivity to optical noise, improved stability and increased measurement accuracy.

Possible Relatives

Dawei I Zhu  Dehua Zhu  Di Zhu  Dian C Zhu  Diana Zhu  Dong Zhu  Dongming Zhu  Yuqing Li  Yuqing Q Lin  Yuqing Liu 

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