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Zhaohui E Li, 5439711 Trinity Way, Fremont, CA 94538

Known as:
Zhao Hui Li Yang Zhao Li Eric L Li Eric Z Li Zhaohui Li Eric Haohui Li Li Zhaohui Li Haohui Hui Li Zhao
Related to:
Fen Li 36

Zhaohui Li Phones & Addresses

39711 Trinity Way, Fremont, CA 94538    408-7122692   

46703 Crawford St, Fremont, CA 94539   

245 Wenatchee Cmn, Fremont, CA 94539   

Alameda, CA   

Laie, HI   

Union City, CA   

Work

Company: Samsung info systems amer inc Address: 75 W Plumeria Dr, San Jose, CA 95134 Phones: 408-5445700 Position: Professional engineer Industries: Electronic Computers

Education

Degree: JD School / High School: University of Pennsylvania Law School

Ranks

Licence: New York - Currently registered Date: 2003
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Mentions for Zhaohui E Li

Career records & work history

Lawyers & Attorneys

Zhaohui Li Photo 1

Zhaohui Li - Lawyer

Licenses:
New York - Currently registered 2003
Education:
University of Pennsylvania Law SchoolDegree JD
Seattle University School of LawDegree JD
Specialties:
Project Finance - 34%
Employment / Labor - 33%
Mergers / Acquisitions - 33%

Medicine Doctors

Zhaohui Li

Specialties:
Cardiovascular Disease
Work:
University Medical Center Cardiology
2000 Canal St, New Orleans, LA 70112
504-9035700 (phone)
Languages:
English
Description:
Dr. Li works in New Orleans, LA and specializes in Cardiovascular Disease.
Zhaohui Li Photo 2

Zhaohui Li

Zhaohui Li resumes & CV records

Resumes

Zhaohui Li Photo 29

Zhaohui Li

Zhaohui Li Photo 30

Zhaohui Li

Zhaohui Li Photo 31

Zhaohui Li

Publications & IP owners

Us Patents

Method For Magneto-Resistive Head Electrostatic Popping Detection

US Patent:
6556006, Apr 29, 2003
Filed:
Nov 21, 2001
Appl. No.:
09/990631
Inventors:
Zhaohui Li - Santa Clara CA
Andrew Kao - Freemont CA
Keung Youn Cho - San Jose CA
Assignee:
Samsung Electronics Co., Ltd.
International Classification:
G01R 3312
US Classification:
324210, 360 31
Abstract:
A method and system for detecting electrostatic noise in a magneto-resistive head which may be caused by a plurality of conditions manifesting in the frequency domain as either an amplitude spike or an unstable baseline. In one embodiment, the signals generated by the head when reading a DC-erased track are compared. When viewed in the frequency domain the spectrum gap between the signals is used to determine if the head being tested suffers from defects causing an unstable baseline or from defects causing an amplitude spike.

Method And Apparatus To Distinguish Effects Of Adjacent Track Encroachment From Head Thermal Movement

US Patent:
6791775, Sep 14, 2004
Filed:
Oct 15, 2001
Appl. No.:
09/981464
Inventors:
Zhaohui Li - Santa Clara CA
Geng Wang - San Jose CA
Keung Youn Cho - San Jose CA
Assignee:
Samsung Electronics, Co., Inc.
International Classification:
G11B 2736
US Classification:
360 31, 360 53, 360 66
Abstract:
The present invention is a method and system to determine a quality of a head in a hard disk drive. The method comprises providing a disk having a at least one side with a plurality of tracks, writing on a predetermined track on the plurality of tracks and reading a profile of the predetermined track to provide a first profile value. The head is then moved to an adjacent track where it writes on the adjacent track. A profile of the predetermined track is then read to provide a second profile value. A quality of the head can then be determined based on the first and second values.

Novel Method To Detect Junction Induced Signal Instability From Gmr/Mr Heads

US Patent:
2002015, Oct 31, 2002
Filed:
Apr 26, 2001
Appl. No.:
09/844897
Inventors:
Geng Wang - San Jose CA, US
Zhaohui Li - Santa Clara CA, US
Hyung Lee - Cupertino CA, US
International Classification:
G01R033/12
US Classification:
324/210000
Abstract:
A method to test an instability of a magneto-resistive (MR) head. The instability is tested by first writing a signal onto a track. The junctions of the MR head are aligned with various track edges and the head characteristics are then measured. The characteristics may include determining a maximum amplitude covarian and a maximum base line popping noise.

Possible Relatives

Cynthia M Li  David Li  Dawei Li  Dayu W Li  De Li  Dean Li  Da Li  Zhaohui Lin  Zhaohui Liu  Zhaohui Xu 

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