Zhiguo Zhang, 51Great Falls, VA
Zhiguo Zhang Phones & Addresses
Great Falls, VA
20898 Sandstone Sq, Sterling, VA 20165
Columbus, OH
Pensacola, FL
Gaithersburg, MD
Cleveland, OH
Metairie, LA
Mentions for Zhiguo Zhang
Publications & IP owners
Us Patents
Thermography Test Method And Apparatus For Bonding Evaluation In Sputtering Targets
US Patent:
2005014, Jul 7, 2005
Filed:
Jul 13, 2004
Appl. No.:
10/890378
Inventors:
Charles Wickersham - Columbus OH, US
Zhiguo Zhang - Columbus OH, US
Larry Ellison - Wellston OH, US
Mikhail Kachalov - Virginia Beach VA, US
John White - Columbus OH, US
Zhiguo Zhang - Columbus OH, US
Larry Ellison - Wellston OH, US
Mikhail Kachalov - Virginia Beach VA, US
John White - Columbus OH, US
International Classification:
G01K001/16
US Classification:
374120000
Abstract:
A method and apparatus for thermographically evaluating the bond integrity of a sputtering target assembly is described. The method includes applying a heating or cooling medium or energy to one surface of the assembly and acquiring a graphic recording of a corresponding temperature change on the opposing surface of the assembly using an imaging device. Also described is a method of mathematically analyzing the pixel data recorded in each frame to produce an integrated normalized temperature map that represents the bond integrity of the assembly.
Method And Apparatus For Surface Roughness Measurement
US Patent:
2006026, Nov 30, 2006
Filed:
Mar 1, 2006
Appl. No.:
11/365758
Inventors:
Zhiguo Zhang - Powell OH, US
Charles Wickersham - Columbus OH, US
Larry Ellison - Wellston OH, US
Charles Wickersham - Columbus OH, US
Larry Ellison - Wellston OH, US
International Classification:
G01B 11/30
G01B 21/30
G01B 21/30
US Classification:
356600000, 073105000
Abstract:
A non-contact system and method for measuring an article surface, like a surface (or portion thereof) of a sputtering target assembly, are provided. For instance, the method includes scanning a surface with a sensing beam, and measuring the distance traveled by the sensing beam reflected from the surface, to a sensing device. The system can include a sensing device for collecting surface data at a plurality of points on the surface, and an analyzing device for analyzing the collected data.
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