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Chia Te Chen, 47256 Alta Loma Ave, Daly City, CA 94015

Known as:
Chia T Chen Chia Min Chen Chia N Chen Chia M Chen Chi W Chen Chi A Chen Marcelo Chen
Related to:
Xi Chen

Chia Chen Phones & Addresses

Daly City, CA   

San Mateo, CA   

San Francisco, CA   

Salinas, CA   

Berkeley, CA   

Plainfield, NJ   

Holyoke, MA   

El Cerrito, CA   

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Resumes

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Chia H Chen

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Chia Hsin Eda Chen

Chia Chen Photo 44

Chia Chen

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Chia Chen

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Chia Ling Chen

Chia Chen Photo 47

Chia Chen

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Chia Hsiu Chen

Chia Chen Photo 49

Mechanical Design Engineer At Foxlink International Inc.

Position:
Mechanical Design Engineer at Foxlink International Inc.
Location:
San Francisco Bay Area
Industry:
Mechanical or Industrial Engineering
Work:
Foxlink International Inc. since May 2010
Mechanical Design Engineer Instrument Technology Research Center Oct 2003 - Jul 2008
Assistant Researcher
Education:
University of Southern California 2008 - 2009
Master, Product Development Engineering National Chiao Tung University 2001 - 2003
Master, Mechanical Engineering National Chung Cheng University 1997 - 2001
Bachelor, Mechanical Engineering The Affiliated Senior High School of National Taiwan Normal University （HSNU） 1994 - 1997

Publications & IP owners

Us Patents

Multi-Color Fluorescence Analysis With Single Wavelength Excitation

US Patent:
4745285, May 17, 1988
Filed:
Aug 21, 1986
Appl. No.:
6/898685
Inventors:
Diether J. Recktenwald - Cupertino CA
Chia H. Chen - San Jose CA
Assignee:
Becton Dickinson and Company - Franklin Lakes NJ
International Classification:
G01N 2164
US Classification:
2504581
Abstract:
A method for determining one or more characteristics of particles using multiple fluorescence analysis comprises directing an incident light beam at the particles under analysis. The particles include at least three fluorescent markers each having different emission spectra. The incident light beam causes the excitation of the markers by light at a single wavelength whereby different wavelengths of fluorescence are emitted from the particles. Different fluorescence emissions associated with the particles under analysis are simultaneously detected. This method further includes associating the detected fluorescence with one or more characteristics of the particles. An apparatus is also part of the present invention for carrying out the aforementioned method.

Method And Materials For Calibrating Flow Cytometers And Other Analysis Instruments

US Patent:
4704891, Nov 10, 1987
Filed:
Aug 29, 1986
Appl. No.:
6/901860
Inventors:
Diether J. Recktenwald - Cupertino CA
Rickie S. Kerndt - Cupertino CA
Michael R. Loken - Los Altos CA
Chia H. Chen - San Jose CA
Assignee:
Becton, Dickinson and Company - Franklin Lakes NJ
International Classification:
G06M 1100
US Classification:
73 1R
Abstract:
A method for calibrating an instrument for using that instrument to obtain at least one light-related signal from particles under analysis comprises directing an incident beam of light at calibration particles having one or more known characteristics related to the particles expected to be analyzed. Both a light signal and a noise signal from the calibration particles are detected. A measurement is made of the ratio of the detected light signal to the detected noise signal, and that measurement is reported. The measured ratio is then compared to a predetermined ratio which represents a threshold for minimum instrument performance. This method further includes adjusting, if the predetermined ratio has not been attained, the operation of the instrument, while the calibration particles are within the incident beam of light, until the measured ratio reaches the predetermined ratio whereby the instrument is calibrated for subsequently obtaining the light signal from particles to be analyzed. A kit of reagents for use in calibrating an instrument for performing two-color analysis of particles and particle standards for calibrating fluorescence analysis instruments are also part of the instant invention.

Method And Materials For Calibrating Flow Cytometers And Other Analysis Instruments

US Patent:
4867908, Sep 19, 1989
Filed:
Jun 4, 1987
Appl. No.:
7/058206
Inventors:
Diether J. Recktenwald - Cupertino CA
Rickie S. Kerndt - Cupertino CA
Michael R. Loken - Los Altos CA
Chia H. Chen - San Jose CA
Assignee:
Becton, Dickinson and Company - Franklin Lakes NJ
International Classification:
G01N 3348
US Classification:
2524081
Abstract:
A method for calibrating an instrument for using that instrument to obtain at least one light-related signal from particles under analysis comprises directing an incident beam of light at calibration particles having one or more known characteristics related to the particles expected to be analyzed. Both a light signal and a noise signal from the calibration particles are detected. A measurement is made of the ratio of the detected light signal to the detected noise signal, and that measurement is reported. The measured ratio is then compared to a predetermined ratio which represents a threshold for minimum instrument performance. This method further includes adjusting, if the predetermined ratio has not been attained, the operation of the instrument, while the calibration particles are within the incident beam of light, until the measured ratio reaches the predetermined ratio whereby the instrument is calibrated for subsequently obtaining the light signal from particles to be analyzed. A kit of reagents for use in calibrating an instrument for performing two-color analysis of particles and particle standars for calibrating fluorescence analysis instruments are also part of the instant invention.

Possible Relatives

Cynthia Chen  David Chen  Cyril X Chen  Cyrus Y Chen  Dawei W Chen  De T Chen  Dafang Chen  Chia L Lee  Chia K Lim  Chia Y Lin 

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