Gyeong Seon Hwang, 68Anaheim, CA
Gyeong Hwang Phones & Addresses
Anaheim, CA
Vernon Hills, IL
Mundelein, IL
Los Angeles, CA
El Centro, CA
Mentions for Gyeong Seon Hwang
Publications & IP owners
Us Patents
De Novo Processing Of Electronic Materials
US Patent:
2002018, Dec 12, 2002
Filed:
Mar 28, 2002
Appl. No.:
10/113919
Inventors:
William Goddard - Pasadena CA, US
Gyeong Hwang - Austin TX, US
Gyeong Hwang - Austin TX, US
International Classification:
B29C045/00
US Classification:
700/200000
Abstract:
Computer programs and computer-implemented methods for predicting from first principles the behavior of dopants and defects in the processing of electronic materials. The distribution of dopant and defect components in a substrate lattice is predicted based on external conditions and fundamental data for a set of microscopic processes that can occur during material processing operations. The concentration behavior of one or more fast components is calculated in two stages, by solving a first relationship for a time period before the fast component reaches a pseudo steady state at which the concentration of the fast component is determined by concentrations of one or more second components, and by solving a second relationship for a time period after the first component reaches the pseudo steady state. Application of these methods to modeling ultrashallow junction processing is also described.
NOTICE: You may not use BackgroundCheck or the information it provides to make decisions about employment, credit, housing or any other purpose that would require Fair Credit Reporting Act (FCRA) compliance. BackgroundCheck is not a Consumer Reporting Agency (CRA) as defined by the FCRA and does not provide consumer reports.