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Jingjing J ZhangRedwood City, CA

Known as:
Jingjing Jing Zhang Jingjing N Zhang Jing Zhang

Jingjing Zhang Phones & Addresses

Redwood City, CA   

813 Shell Blvd, Foster City, CA 94404    650-3763404   

6737 Dartmouth Ave, Richmond, VA 23226    804-2821855   

594 Shoal Cir, Redwood City, CA 94065    650-3763404   

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Career records & work history

Medicine Doctors

Jingjing Zhang

Specialties:
Nephrology
Work:
Jefferson University PhysiciansJefferson Renal Associates
833 Chestnut St STE 700, Philadelphia, PA 19107
215-3098638 (phone) 215-5034099 (fax)
Site
Education:
Medical School
Beijing Med Univ, Beijing City, Beijing, China
Graduated: 1993
Conditions:
Chronic Renal Disease, Hypertension (HTN)
Languages:
English, Spanish
Description:
Dr. Zhang graduated from the Beijing Med Univ, Beijing City, Beijing, China in 1993. She works in Philadelphia, PA and specializes in Nephrology. Dr. Zhang is affiliated with Thomas Jefferson University Hospital.

Jingjing Zhang resumes & CV records

Resumes

Jingjing Zhang Photo 33

Assistant Professor At University Of Zurich

Location:
Zürich Area, Switzerland
Industry:
Forschung
Work:
University of Zurich - Zurich, Switzerland since Aug 2010
Assistant Professor McMaster University - Ontario, Canada Aug 2008 - Jul 2010
Postdoctoral Fellow Purdue University - Lafayette, Indiana Area Sep 2003 - Aug 2008
Instructor, Research and Teaching Assistant
Education:
Purdue University 2003 - 2008
Doctor of Philosophy (Ph.D.), Economics
Languages:
Chinese
English
Jingjing Zhang Photo 34

Software Engineer

Location:
11364 Cadence Grove Way, San Diego, CA 92130
Industry:
Computer Networking
Work:
Facebook
Software Engineer Huawei Technologies
Staff Engineer Epic Jan 2014 - May 2015
Software Engineer Arista Networks Apr 1, 2012 - Dec 2013
Software Engineer Nec Laboratories America, Inc. Jun 2010 - Apr 2012
Postdoc Scientist New Jersey Institute of Technology Sep 2006 - May 2011
Research Assistant
Education:
New Jersey Institute of Technology 2006 - 2011
Doctorates, Doctor of Philosophy, Electrical Engineering
Skills:
C/C++ Stl, Matlab, Ip Networking, Systems Programming, Network Programming, Wireless Networking, Mathematical Modeling, Linux, Ofdm, Signal Processing, Optical Communications, Tcp/Ip, Lte, Ip, Wireless, C, Asp.net Mvc, Html, Xml, Javascript, Json, Algorithm Design, Algorithm Analysis, Data Structures, Databases, Sqlite, Mysql, Testing, Routing, Algorithms, Programming, Operating Systems, Software Defined Networking, Network Function Virtualization, Cloud, Cloud Computing
Jingjing Zhang Photo 35

Jingjing Jj Zhang

Publications & IP owners

Us Patents

Process Aware Metrology

US Patent:
8468471, Jun 18, 2013
Filed:
Mar 2, 2012
Appl. No.:
13/411433
Inventors:
Xuefeng Liu - San Jose CA, US
Yung-Ho Alex Chuang - Cupertino CA, US
John Fielden - Los Altos CA, US
Jingjing Zhang - San Jose CA, US
Assignee:
KLA-Tencor Corp. - Milpitas CA
International Classification:
G06F 19/00
G06F 17/50
US Classification:
716 54, 716 52, 716 53, 716 55, 716136, 700110, 700120, 700121
Abstract:
Systems and methods for process aware metrology are provided.

Process Aware Metrology

US Patent:
2013028, Oct 24, 2013
Filed:
Jun 17, 2013
Appl. No.:
13/919577
Inventors:
Yung-Ho Alex Chuang - Cupertino CA, US
John Fielden - Los Altos CA, US
Jingjing Zhang - San Jose CA, US
International Classification:
G06F 17/50
US Classification:
703 1
Abstract:
Systems and methods for process aware metrology are provided. One method includes selecting nominal values and one or more different values of process parameters for one or more process steps used to form the structure on the wafer, simulating one or more characteristics of the structure that would be formed on the wafer using the nominal values, and determining parameterization of the optical model based on how the one or more characteristics of the structure vary between at least two of the nominal values and the one or more different values.

System, Method, And Computer Program Product For Determining A Control Account That Corresponds To An Exposed Account

US Patent:
2022018, Jun 16, 2022
Filed:
Mar 2, 2022
Appl. No.:
17/684483
Inventors:
- San Francisco CA, US
Tanya Soluk - San Carlos CA, US
Qingyuan Zhang - Los Altos CA, US
Jingjing Zhang - Redwood City CA, US
Bingxin Mao - Shanghai, CN
Jiaqi Xu - Foster City CA, US
Linjun Chen - San Jose CA, US
International Classification:
G06Q 30/02
G06F 16/245
G06Q 40/02
G06N 5/04
Abstract:
Provided is a method including determining a combined plurality of accounts, determining, for each account of the combined plurality of accounts, aggregate transaction data associated with a plurality of transactions involving the account; determining a first cohort level group including a group of exposed accounts and controls accounts; determining a first segment level group of accounts from the first cohort level group of accounts; generating a prediction model based on a plurality of control accounts that are included in the first segment level group of accounts; identifying a first exposed account of a plurality of exposed accounts; determining a first control account of the plurality of control accounts that corresponds to a first exposed account using the prediction model; and outputting a report comprising data associated with the first control account that corresponds to the first exposed account. Systems and computer program products are also provided.

System, Method, And Computer Program Product For Determining A Control Account That Corresponds To An Exposed Account

US Patent:
2020029, Sep 17, 2020
Filed:
Mar 16, 2020
Appl. No.:
16/820074
Inventors:
- San Francisco CA, US
Tanya Soluk - San Carlos CA, US
Qingyuan Zhang - Los Altos CA, US
Jingjing Zhang - Redwood City CA, US
Bingxin Mao - Shanghai, CN
Linjun Chen - San Jose CA, US
Jiaqi Xu - Foster City CA, US
International Classification:
G06Q 30/02
G06F 16/245
G06N 5/04
G06Q 40/02
Abstract:
Provided is a method including determining a combined plurality of accounts, determining, for each account of the combined plurality of accounts, aggregate transaction data associated with a plurality of transactions involving the account; determining a first cohort level group including a group of exposed accounts and controls accounts; determining a first segment level group of accounts from the first cohort level group of accounts; generating a prediction model based on a plurality of control accounts that are included in the first segment level group of accounts; identifying a first exposed account of a plurality of exposed accounts; determining a first control account of the plurality of control accounts that corresponds to a first exposed account using the prediction model; and outputting a report comprising data associated with the first control account that corresponds to the first exposed account. Systems and computer program products are also provided.

Back-Illuminated Sensor And A Method Of Manufacturing A Sensor

US Patent:
2020019, Jun 18, 2020
Filed:
Sep 5, 2019
Appl. No.:
16/562396
Inventors:
- Milpitas CA, US
John Fielden - Los Altos CA, US
Jingjing Zhang - San Jose CA, US
David L. Brown - Los Gatos CA, US
Sisir Yalamanchili - Milpitas CA, US
International Classification:
H01L 27/146
H01L 27/148
Abstract:
An image sensor utilizes a pure boron layer and a second epitaxial layer having a p-type dopant concentration gradient to enhance sensing DUV, VUV or EUV radiation. Sensing (circuit) elements and associated metal interconnects are fabricated on an upper surface of a first epitaxial layer, then the second epitaxial layer is formed on a lower surface of the first epitaxial layer, and then a pure boron layer is formed on the second epitaxial layer. The p-type dopant concentration gradient is generated by systematically increasing a concentration of p-type dopant in the gas used during deposition/growth of the second epitaxial layer such that a lowest p-type dopant concentration of the second epitaxial layer occurs immediately adjacent to the interface with the first epitaxial layer, and such that a highest p-type dopant concentration of the second epitaxial layer occurs immediately adjacent to the interface with pure boron layer.

Multiple Column Per Channel Ccd Sensor Architecture For Inspection And Metrology

US Patent:
2019031, Oct 10, 2019
Filed:
Jun 12, 2019
Appl. No.:
16/439297
Inventors:
- Milpitas CA, US
Jingjing Zhang - San Jose CA, US
Sharon Zamek - Sunnyvale CA, US
John Fielden - Los Altos CA, US
Devis Contarato - San Carlos CA, US
David L. Brown - Los Gatos CA, US
International Classification:
H04N 5/378
G01N 21/956
H04N 5/361
H04N 5/372
G06T 7/00
H01L 27/148
G01N 21/95
Abstract:
A multiple-column-per-channel image CCD sensor utilizes a multiple-column-per-channel readout circuit including connected transfer gates that alternately transfer pixel data (charges) from a group of adjacent pixel columns to a shared output circuit at high speed with low noise. Charges transferred along the adjacent pixel columns at a line clock rate are alternately passed by the transfer gates to a summing gate that is operated at multiple times the line clock rate to pass the image charges to the shared output circuit. A symmetrical fork-shaped diffusion is utilized in one embodiment to merge the image charges from the group of related pixel columns. A method of driving the multiple-column-per-channel CCD sensor with line clock synchronization is also described. A method of inspecting a sample using the multiple-column-per-channel CCD sensor is also described.

Dual-Column-Parallel Ccd Sensor And Inspection Systems Using A Sensor

US Patent:
2019025, Aug 15, 2019
Filed:
Apr 29, 2019
Appl. No.:
16/397072
Inventors:
- Milpitas CA, US
Jingjing Zhang - San Jose CA, US
Sharon Zamek - Sunnyvale CA, US
John Fielden - Los Altos CA, US
Devis Contarato - San Carlos CA, US
David L. Brown - Los Gatos CA, US
International Classification:
H04N 5/378
G01N 21/956
H04N 5/361
H04N 5/372
G06T 7/00
H01L 27/148
G01N 21/95
Abstract:
A dual-column-parallel image CCD sensor utilizes a dual-column-parallel readout circuit including two pairs of cross-connected transfer gates to alternately transfer pixel data (charges) from a pair of adjacent pixel columns to a shared output circuit at high speed with low noise. Charges transferred along the two adjacent pixel columns at a line clock rate are alternately passed by the transfer gates to a summing gate that is operated at twice the line clock rate to pass the image charges to the shared output circuit. A symmetrical Y-shaped diffusion is utilized in one embodiment to merge the image charges from the two pixel columns. A method of driving the dual-column-parallel CCD sensor with line clock synchronization is also described. A method of inspecting a sample using the dual-column-parallel CCD sensor is also described.

Sensor With Electrically Controllable Aperture For Inspection And Metrology Systems

US Patent:
2018007, Mar 8, 2018
Filed:
Nov 8, 2017
Appl. No.:
15/806913
Inventors:
- Milpitas CA, US
John Fielden - Los Altos CA, US
David L. Brown - Los Gatos CA, US
Jingjing Zhang - San Jose CA, US
Keith Lyon - Mountain View CA, US
Mark Shi Wang - San Ramon CA, US
International Classification:
H04N 5/3722
Abstract:
Pixel aperture size adjustment in a linear sensor is achieved by applying more negative control voltages to central regions of the pixel's resistive control gate, and applying more positive control voltages to the gate's end portions. These control voltages cause the resistive control gate to generate an electric field that drives photoelectrons generated in a selected portion of the pixel's light sensitive region into a charge accumulation region for subsequent measurement, and drives photoelectrons generated in other portions of the pixel's light sensitive region away from the charge accumulation region for subsequent discard or simultaneous readout. A system utilizes optics to direct light received at different angles or locations from a sample into corresponding different portions of each pixel's light sensitive region. Multiple aperture control electrodes are selectively actuated to collect/measure light received from either narrow or wide ranges of angles or locations, thereby enabling rapid image data adjustment.

Possible Relatives

David Zhang  Dawei Zhang  Dazhi Zhang  De K Zhang  Da Q Zhang  Dachuan Zhang  Daijun Zhang  Jingjing Liu  Jingjing J Pang  Jingjing Xu 

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