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Michael F Lathrope, 77Estero, FL

Michael Lathrope Phones & Addresses

Estero, FL   

919 Charles St, Naperville, IL 60540    630-3691469    630-4283622   

Chicago, IL   

Lee, FL   

Social networks

Michael F Lathrope

Linkedin

Skills

Bailey

Languages

English

Interests

Boating • Cooking • Exercise • Gardening • Traveling • Outdoors • Electronics • Home Improvement • Diet • Reading • Crafts • Fitness • Gourmet Cooking • Music • Sports • Travel • Movies • Home Decoration

Industries

Telecommunications

Mentions for Michael F Lathrope

Michael Lathrope resumes & CV records

Resumes

Michael Lathrope Photo 21

Michael F Lathrope

Location:
919 south Charles Ave, Naperville, IL 60540
Industry:
Telecommunications
Skills:
Bailey
Interests:
Boating
Cooking
Exercise
Gardening
Traveling
Outdoors
Electronics
Home Improvement
Diet
Reading
Crafts
Fitness
Gourmet Cooking
Music
Sports
Travel
Movies
Home Decoration
Languages:
English

Publications & IP owners

Us Patents

Low Transient Feedthru Fet Sample And Hold Gate

US Patent:
4323796, Apr 6, 1982
Filed:
Jan 30, 1980
Appl. No.:
6/116739
Inventors:
Michael F. Lathrope - Oak Forest IL
Assignee:
Motorola, Inc. - Schaumburg IL
International Classification:
H03K 1716
H03K 17687
G11C 2702
US Classification:
307353
Abstract:
An FET sample and hold switching circuit with low transient feedthru in a sample and hold phase detector. The FET OFF voltage is clamped to a value well below the supply voltage thus permitting reduction of stored charge on the interelectrode capacitances. This combined with FET capacitance compensation provides substantial reduction in feedthru and switching transients.

Full Duplex Digital Transmission Facility Loop-Back Test, Diagnostics And Maintenance System

US Patent:
5343461, Aug 30, 1994
Filed:
Aug 27, 1991
Appl. No.:
7/750407
Inventors:
John C. Barton - Naperville IL
William J. Hanby - Bloomingdale IL
Bruce R. Kuhn - Bollingbrook IL
Michael F. Lathrope - Naperville IL
Christopher F. Simanonis - Wheaton IL
Arthur J. Varga - West Dundee IL
Assignee:
Ameritech Services, Inc. - Hoffman Estates IL
International Classification:
H04J 314
US Classification:
370 13
Abstract:
A full duplex digital transmission, high-capacity digital, facility loop-back test, diagnostics and maintenance system having a digital transmission facility, transmission medium, and at least one microprocessor-based, full duplex facility loop-back diagnostics interface is located at predetermined end-user locations within the system. The system is capable of initiating a facility loop-back test and predetermined diagnostics for a predetermined digital transmission span and customer premises equipment at the location of the network interface for a specified end-user. The facility loop-back diagnostics interface has a performance monitoring mode of operation and a maintenance facility loop-back mode of operation. The diagnostics interface can be activated from a remote location and is compatible with and supports a particular protocol, specifically LAP-B protocol. The diagnostics interface has integral performance monitoring capabilities for nonintrusive multiple diagnostics testing and on-line monitoring of multiple predetermined performance characteristics for associated DS1 communications channels, or a specified DS1 communications channel, and customer premises equipment at the network interface.

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