BackgroundCheck.run
Search For

Loren N Pfeiffer, 8528 Longview Dr, Princeton, NJ 08540

Loren Pfeiffer Phones & Addresses

28 Longview Dr, Princeton, NJ 08540   

1 Red Gate Rd, Morristown, NJ 07960    973-5408911   

9 Red Gate Rd, Morristown, NJ 07960    973-5408911   

Princeton Junction, NJ   

Delafield, WI   

Summit, NJ   

9 Red Gate Rd, Morristown, NJ 07960    973-5380020   

Work

Position: Professional/Technical

Education

Degree: Graduate or professional degree

Mentions for Loren N Pfeiffer

Publications & IP owners

Us Patents

Method Of Making Thin Film Resonator Apparatus

US Patent:
6349454, Feb 26, 2002
Filed:
Jul 29, 1999
Appl. No.:
09/363527
Inventors:
Michael James Manfra - Short Hills NJ
Loren Neil Pfeiffer - Morristown NJ
Kenneth William West - Mendham NJ
Assignee:
Agere Systems Guardian Corp. - Orlando FL
International Classification:
H01L 4100
US Classification:
29 2535, 427100
Abstract:
A thin film resonator (TFR) is produced with an improved piezoelectric film which is epitaxially grown on a growing surface, resulting in a piezoelectric film with less grain boundaries. Epitaxial growth refers to the piezoelectric film having a crystallographic orientation take from or emulating the crystallographic orientation of a single crystal substrate or growing surface. For example, by epitaxially growing a piezoelectric film on a single crystal silicon substrate as the growing surface, an improved piezoelectric film is produced with little or no grain boundaries. Also provided is a method of making a TFR in which the piezoelectric film is grown on a substrate. Subsequently, a portion of the substrate is removed, and the electrodes are deposited on either side of the piezoelectric film.

Mos Transistor Having Aluminum Nitride Gate Structure And Method Of Manufacturing Same

US Patent:
6495409, Dec 17, 2002
Filed:
Dec 23, 1999
Appl. No.:
09/472331
Inventors:
Michael J. Manfra - Short Hills NJ
Loren N. Pfeiffer - Morristown NJ
Kenneth W. West - Mendham NJ
Assignee:
Agere Systems Inc. - Allentown PA
International Classification:
H01L 218238
US Classification:
438216, 438261, 438591, 438240, 438585, 257410, 257324
Abstract:
An MOS transistor comprising a substrate, a source, a drain, and a gate, wherein the gate comprises aluminum nitride. Aluminum nitride is epitaxially grown on the silicon substrate at a substrate temperature of about 600Â C. and subsequently annealed at a substrate temperature of about 950Â C.

Velocity-Cooled Hot-Electron Bolometric Mixer/Detector

US Patent:
6661039, Dec 9, 2003
Filed:
May 18, 2001
Appl. No.:
09/861055
Inventors:
Mark Lee - Berkeley Heights NJ
Loren Neil Pfeiffer - Morristown NJ
Kenneth William West - Mendham NJ
Assignee:
Lucent Technologies Inc. - Murray Hill NJ
International Classification:
H01L 31072
US Classification:
257201, 257194, 257192, 257183, 257189, 257 20, 257 24, 257195, 438285, 438590, 438 60
Abstract:
A hot-electron bolometric mixer/detector, which uses the nonlinearities of the heated two-dimensional electron gas medium, is described. Electrons in the illustrative embodiment of the present invention are âvelocity-cooledâ rather than âdiffusion-cooledâ or âphonon-cooledâ like hot-electron bolometric mixer/detectors in the prior art. The illustrative embodiment is velocity-cooled when the elastic mean-free path of the electrons is greater than the channel length, L, of the mixer/detector. In this case, the motion of the hot electrons is more accurately modeled by their speed rather than in accordance with diffusion models. This leads to a mixer/detector with a wider modulation bandwidth at a lower power than is exhibited by mixer/detectors in the prior art.

Growing Smooth Semiconductor Layers

US Patent:
6921726, Jul 26, 2005
Filed:
Mar 13, 2002
Appl. No.:
10/097092
Inventors:
Hidefumi Akiyama - Tokyo, JP
Loren Neil Pfeiffer - Morristown NJ, US
Kenneth William West - Mendham NJ, US
Assignee:
Lucent Technologies Inc. - Murray Hill NJ
International Classification:
H01L021/31
US Classification:
438767, 438493, 438761, 438763
Abstract:
A method includes epitaxially growing a semiconductor layer with a free surface and performing an anneal that reduces atomic roughness on the free surface. The free surface has an orientation with respect to lattice axes of the layer for which atoms in flat regions of the free surface have more chemical bonds to the layer than do, at least, some of the atoms at edges of monolayer steps on the free surface.

Detection Apparatus For Biological Materials And Methods Of Making And Using The Same

US Patent:
7341692, Mar 11, 2008
Filed:
Apr 30, 2005
Appl. No.:
11/119519
Inventors:
Robert L. Willett - Warren NJ, US
Kirk W. Baldwin - Springfield NJ, US
Loren N. Pfeiffer - Morristown NJ, US
Assignee:
Lucent Technologies Inc. - Murray Hill NJ
International Classification:
G01N 27/00
G01N 33/53
G01N 33/551
G01N 33/552
G01N 33/553
US Classification:
422 8201, 422 8202, 422 8203, 422 8204, 435 71, 436518, 436524, 436525, 436527, 436149
Abstract:
Apparatus comprising a surface site layer having a distal site end, wherein the distal site end includes a substantially inorganic surface having a chemical composition selected from a group consisting of metals, semiconductors, insulators, and mixtures thereof, the surface positioned within a polypeptide bonding region and having a selective bonding affinity for a polypeptide; a plurality of interlayers between which the surface site layer is interposed, wherein the distal site end is distanced from the interlayers, first and second supports, wherein the surface site layer and the interlayers are interposed between the first and second supports; and first and second conductors provided on the first and second supports and having respective first and second distal conductor ends positioned within the polypeptide bonding region; wherein the conductors are capable of applying an external voltage potential across the polypeptide bonding region.

Quantum Well Device

US Patent:
8633092, Jan 21, 2014
Filed:
Dec 12, 2012
Appl. No.:
13/712179
Inventors:
Kirk William Baldwin - Murray Hill NJ, US
Loren N. Pfeiffer - Morristown NJ, US
Kenneth William West - Mendham Township NJ, US
Assignee:
Alcatel Lucent - Paris
International Classification:
H01L 21/20
H01L 29/15
H01L 33/00
US Classification:
438468, 438478, 257 14, 257 17, 257E29072, 257E29076, 257E33008, 257E2109
Abstract:
An apparatus includes a primary planar quantum well and a planar distribution of dopant atoms. The primary planar quantum well is formed by a lower barrier layer, a central well layer on the lower barrier layer, and an upper barrier layer on the central well layer. Each of the layers is a semiconductor layer. One of the barrier layers has a secondary planar quantum well and is located between the planar distribution of dopant atoms and the central well layer. The primary planar quantum well may be undoped or substantially undoped, e. g. , intrinsic semiconductor.

Mos Transistor Having Aluminum Nitrade Gate Structure And Method Of Manufacturing Same

US Patent:
2003003, Feb 13, 2003
Filed:
Oct 7, 2002
Appl. No.:
10/265867
Inventors:
Michael Manfra - Short Hills NJ, US
Loren Pfeiffer - Morristown NJ, US
Kenneth West - Mendham NJ, US
International Classification:
H01L029/76
US Classification:
257/213000
Abstract:
An MOS transistor comprising a substrate, a source, a drain, and a gate, wherein the gate comprises aluminum nitride. Aluminum nitride is epitaxially grown on the silicon substrate at a substrate temperature of about 600 C. and subsequently annealed at a substrate temperature of about 950 C.

Optical Waveguide Utilizing An Antiresonant Layered Structure

US Patent:
4715672, Dec 29, 1987
Filed:
Jan 6, 1986
Appl. No.:
6/816199
Inventors:
Michel A. Duguay - Fair Haven NJ
Thomas L. Koch - Middletown NJ
Yasuo Kokubun - Yokohama, JP
Loren N. Pfeiffer - Morristown NJ
Assignee:
American Telephone and Telegraph Company - Murray Hill NJ
International Classification:
G02B 610
US Classification:
350 9612
Abstract:
A planar silicon dioxide waveguide with low loss for the TE mode has been built on a silicon wafer by separating the waveguide from the substrate with a relatively thin layer of polycrystalline silicon and a layer of silicon dioxide having a combined thickness less than that of the waveguide. The separating layers provide a high antiresonant reflectivity which is operative over a broad range of wavelengths.

NOTICE: You may not use BackgroundCheck or the information it provides to make decisions about employment, credit, housing or any other purpose that would require Fair Credit Reporting Act (FCRA) compliance. BackgroundCheck is not a Consumer Reporting Agency (CRA) as defined by the FCRA and does not provide consumer reports.