Inventors:
John C. Barton - Naperville IL
William J. Hanby - Bloomingdale IL
Bruce R. Kuhn - Bollingbrook IL
Michael F. Lathrope - Naperville IL
Christopher F. Simanonis - Wheaton IL
Arthur J. Varga - West Dundee IL
Assignee:
Ameritech Services, Inc. - Hoffman Estates IL
International Classification:
H04J 314
Abstract:
A full duplex digital transmission, high-capacity digital, facility loop-back test, diagnostics and maintenance system having a digital transmission facility, transmission medium, and at least one microprocessor-based, full duplex facility loop-back diagnostics interface is located at predetermined end-user locations within the system. The system is capable of initiating a facility loop-back test and predetermined diagnostics for a predetermined digital transmission span and customer premises equipment at the location of the network interface for a specified end-user. The facility loop-back diagnostics interface has a performance monitoring mode of operation and a maintenance facility loop-back mode of operation. The diagnostics interface can be activated from a remote location and is compatible with and supports a particular protocol, specifically LAP-B protocol. The diagnostics interface has integral performance monitoring capabilities for nonintrusive multiple diagnostics testing and on-line monitoring of multiple predetermined performance characteristics for associated DS1 communications channels, or a specified DS1 communications channel, and customer premises equipment at the network interface.