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Pradip D Patel, 5328 Harvard Dr, Kent Lakes, NY 10512

Known as:
Prsdip Patel Pradip Paatel
Related to:
Jignesh M Patel 56 Pragnaben V Patel 58

Pradip Patel Phones & Addresses

28 Harvard Dr, Carmel, NY 10512   

Philadelphia, PA   

Pine Hill, NJ   

Chalfont, PA   

Work

Company: Kennedy health system inc Address: 2201 Chapel Ave W, Cherry Hill, NJ 08002 Phones: 856-4886500 Position: Family practice Industries: General Medical and Surgical Hospitals
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Career records & work history

Medicine Doctors

Pradip Patel Photo 1

Dr. Pradip N Patel, Lindenwold NJ - MD (Doctor of Medicine)

Specialties:
Family Medicine
Internal Medicine
Address:
Clementon Family Practice
657 Blackwood Clementon Rd, Lindenwold, NJ 08021
856-5668325 (Phone)
Languages:
English
Gujarati
Hospitals:
Clementon Family Practice
657 Blackwood Clementon Rd, Lindenwold, NJ 08021
Virtua Marlton
90 Brick Road, Marlton, NJ 08053
Education:
Medical School
N.H.L. Municipal Medical College
Pradip Patel Photo 2

Dr. Pradip M Patel, Columbus NJ - MD (Doctor of Medicine)

Specialties:
Internal Medicine
Address:
12 Lincoln Dr, Columbus, NJ 08022
609-2911459 (Phone)
Languages:
English

Pradip N. Patel

Specialties:
Family Medicine
Work:
Clementon Family Practice
657 Blackwood Clementon Rd, Clementon, NJ 08021
856-5668325 (phone) 856-5668326 (fax)
Education:
Medical School
M P Shah Med Coll, Saurashtra Univ, Jamnagar, Gujarat, India
Graduated: 1978
Conditions:
Abnormal Vaginal Bleeding, Acne, Acute Bronchitis, Acute Conjunctivitis, Acute Pharyngitis, Acute Sinusitis, Acute Upper Respiratory Tract Infections, Allergic Rhinitis, Anemia, Anxiety Dissociative and Somatoform Disorders, Anxiety Phobic Disorders, Atopic Dermatitis, Atrial Fibrillation and Atrial Flutter, Attention Deficit Disorder (ADD), Benign Paroxysmal Positional Vertigo, Benign Prostatic Hypertrophy, Bipolar Disorder, Breast Disorders, Bronchial Asthma, Calculus of the Urinary System, Candidiasis, Candidiasis of Vulva and Vagina, Cardiac Arrhythmia, Chronic Bronchitis, Chronic Fatigue Syndrome, Chronic Renal Disease, Chronic Sinusitis, Constipation, Contact Dermatitis, Croup, Depressive Disorders, Dermatitis, Diabetes Mellitus (DM), Disorders of Lipoid Metabolism, Diverticulitis, Epilepsy, Erectile Dysfunction (ED), Esophagitis, Female Infertility, Fractures, Dislocations, Derangement, and Sprains, Gastritis and Duodenitis, Gastroesophageal Reflux Disease (GERD), Glaucoma, Gout, Hemorrhoids, Herpes Simplex, Herpes Zoster, Hypertension (HTN), Hyperthyroidism, Hypothyroidism, Insomnia, Intervertebral Disc Degeneration, Iron Deficiency Anemia, Irritable Bowel Syndrome (IBS), Malignant Neoplasm of Female Breast, Menopausal and Postmenopausal Disorders, Migraine Headache, Osteoarthritis, Osteoporosis, Otitis Media, Overweight and Obesity, Peripheral Nerve Disorders, Pneumonia, Polycystic Ovarian Syndrome (PCOS), Psoriasis, Restless Leg Syndrome, Rheumatoid Arthritis, Rotator Cuff Syndrome and Allied Disorders, Sciatica, Skin and Subcutaneous Infections, Substance Abuse and/or Dependency, Tension Headache, Tinea Unguium, Urinary Incontinence, Urinary Tract Infection (UT), Vitamin D Deficiency
Languages:
English, Spanish
Description:
Dr. Patel graduated from the M P Shah Med Coll, Saurashtra Univ, Jamnagar, Gujarat, India in 1978. He works in Lindenwold, NJ and specializes in Family Medicine. Dr. Patel is affiliated with Kennedy Health System Cherry Hill.

Pradip D. Patel

Specialties:
Cardiovascular Disease
Education:
Medical School
B J Med Coll, Gujarat Univ, Ahmedabad, Gujarat, India
Graduated: 1980
Procedures:
Cardiac Rehabilitation, Angioplasty, Cardiac Catheterization, Cardiac Stress Test, Cardioversion, Echocardiogram, Electrocardiogram (EKG or ECG)
Conditions:
Angina Pectoris, Heart Failure, Acute Bronchitis, Acute Myocardial Infarction (AMI), Acute Sinusitis, Acute Upper Respiratory Tract Infections, Anxiety Phobic Disorders, Aortic Valvular Disease, Atrial Fibrillation and Atrial Flutter, Benign Prostatic Hypertrophy, Bronchial Asthma, Cardiac Arrhythmia, Cardiomyopathy, Chronic Renal Disease, Diabetes Mellitus (DM), Disorders of Lipoid Metabolism, Esophagitis, Fractures, Dislocations, Derangement, and Sprains, Gastroesophageal Reflux Disease (GERD), Hypertension (HTN), Hypothyroidism, Iron Deficiency Anemia, Ischemic Heart Disease, Migraine Headache, Mitral Valvular Disease, Overweight and Obesity, Paroxysmal Supreventricular Tachycardia (PSVT), Peptic Ulcer Disease, Skin and Subcutaneous Infections, Transient Cerebral Ischemia, Valvular Heart Disease
Description:
Dr. Patel graduated from the B J Med Coll, Gujarat Univ, Ahmedabad, Gujarat, India in 1980. He works in Terre Haute, IN and specializes in Cardiovascular Disease. Dr. Patel is affiliated with Terre Haute Regional Hospital.
Pradip Patel Photo 3

Pradip N Patel, Clementon NJ

Specialties:
Family Medicine
Pediatrics
Work:
Clementon Family Practice
657 Blackwood - Clementon Rd, Clementon, NJ 08021Clementon Family Practice
657 Blackwood Clementon Rd, Lindenwold, NJ 08021
Education:
M. P. Shah Medical College (1978)
Pradip Patel Photo 4

Pradip M Patel

Specialties:
Internal Medicine
Education:
Ross University
Pradip Patel Photo 5

Pradip Diwakar Patel

Specialties:
Family Medicine
Internal Medicine
Cardiology
Cardiovascular Disease
Interventional Cardiology
Education:
Smt. N.H.L. Municipal Medical College (1980)
Pradip Patel Photo 6

Pradip N Patel, Lindenwold NJ

Specialties:
Family Physician
Address:
657 Blackwood Clementon Rd, Lindenwold, NJ 08021

Pradip Patel resumes & CV records

Resumes

Pradip Patel Photo 43

Computer & Network Security Professional

Location:
United States
Industry:
Computer & Network Security
Pradip Patel Photo 44

Pradip Patel

Location:
United States
Pradip Patel Photo 45

Pradip Patel

Location:
United States
Pradip Patel Photo 46

Pradip Patel

Location:
United States
Pradip Patel Photo 47

Pradip Patel

Location:
United States
Pradip Patel Photo 48

Vp Strategic Operations- Bioscrip Inc.

Position:
Division President - SE Region at BioScrip
Location:
Saint Simons Island, Georgia
Industry:
Hospital & Health Care
Work:
BioScrip since Jul 2006
Division President - SE Region
Pradip Patel Photo 49

Pradip Patel

Location:
United States
Pradip Patel Photo 50

At Patels Airtemp (India) Ltd.

Position:
Design Engineer at Patels Airtemp (India) ltd.
Location:
United States
Industry:
Mechanical or Industrial Engineering
Work:
Patels Airtemp (India) ltd. since May 2008
Design Engineer

Publications & IP owners

Us Patents

Method And Apparatus For Delaying Abist Start

US Patent:
6629280, Sep 30, 2003
Filed:
Sep 25, 2000
Appl. No.:
09/669462
Inventors:
Timothy J. Koprowski - Newburgh NY
William V. Huott - Holmes NY
Timothy G. McNamara - Fishkill NY
Pradip Patel - Poughkeepsie NY
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G01B 3128
US Classification:
714733, 324763
Abstract:
An exemplary embodiment of the invention is a method and apparatus for delaying the start of an array built-in self-test (ABIST) until after the ABIST memory arrays have been started. The length of the delay is determined by the value in a programmable delay located on the integrated circuit. The initiation of the ABIST test is delayed by the time specified in the programmable delay.

Array Self Repair Using Built-In Self Test Techniques

US Patent:
7257745, Aug 14, 2007
Filed:
Jan 31, 2005
Appl. No.:
11/047419
Inventors:
William V. Huott - Holmes NY, US
Franco Motika - Hopewell Junction NY, US
Pradip Patel - Poughkeepsie NY, US
Daniel Rodko - Wappingers Falls NY, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 29/00
G01R 31/28
G11C 17/18
US Classification:
714710, 714733, 714726, 714718, 365201, 3652257
Abstract:
A soft-fust test algorithm is distributed on-chip from an ABSIT engine through an LSSD shift register chain to dynamically evaluate a plurality of arrays with redundancy compensation for bad elements and repair those that are fixable. Using single-bit MISR error evaluation an ABSIT test sequence is executed concurrently on all arrays through the shift register chain. If any arrays are in error, redundancy compensation is employed and the ABIST test is repeated for all possible array redundant combinations until a functional configuration for each array is identified or all possible redundant combinations have been tried. Once functioning array configurations are verified, the associated soft-fuse states can be used to blow fuses and/or extracted for further system setup, permanent fuse-blowing and yield analysis. Multiple shift register chains driven by separate ABIST engines may be required to test all arrays on a chip.

Clock Duty Cycle Based Access Timer Combined With Standard Stage Clocked Output Register

US Patent:
7275194, Sep 25, 2007
Filed:
Feb 11, 2005
Appl. No.:
11/057318
Inventors:
William V. Huott - Holmes NY, US
Pradip Patel - Poughkeepsie NY, US
Daniel Rodko - Wappingers Falls NY, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G01R 31/28
US Classification:
714731, 714724, 714744
Abstract:
An output of an element under test is captured and stored, through a multiplexer, in a capture register. At a clock edge (either rising or falling edge) the element under test catches the “edge” and “strobes” the output. The multiplexer is strobed, and the delay and duty cycle are measured. Both the rising and falling edge are used as the timer.

Merged Misr And Output Register Without Performance Impact For Circuits Under Test

US Patent:
7305602, Dec 4, 2007
Filed:
Feb 11, 2005
Appl. No.:
11/056575
Inventors:
Yuen H. Chan - Poughkeepsie NY, US
William V. Huott - Holmes NY, US
Pradip Patel - Poughkeepsie NY, US
Daniel Rodko - Wappingers Falls NY, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G01R 31/28
US Classification:
714726
Abstract:
The output register of an array and the Multiple Input Signature Register (MISR) logic is implemented with one set of L/L master/slave latches and single additional slave latch. This new combined logic uses less critical area on a chip without a performance impact on the array access time or circuit testing.

Self Test Method And Apparatus For Identifying Partially Defective Memory

US Patent:
7366953, Apr 29, 2008
Filed:
Dec 9, 2004
Appl. No.:
11/008371
Inventors:
William V. Huott - Holmes NY, US
David J. Lund - Staatsburg NY, US
Kenneth H. Marz - Poughkeepsie NY, US
Bryan L. Mechtly - Red Hook NY, US
Pradip Patel - Poughkeepsie NY, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G06F 11/00
US Classification:
714 36, 714733
Abstract:
A computing system is provided which includes a processor having a cache memory. The cache memory includes a plurality of independently configurable subdivisions, each subdivision including a memory array. A service element (SE) of the computing system is operable to cause a built-in-self-test (BIST) to be executed to test the cache memory, the BIST being operable to determine whether any of the subdivisions is defective. When it is determined that one of the subdivisions of the cache memory determined defective by the BIST is non-repairable, the SE logically deletes the defective subdivision from the system configuration, and the SE is operable to permit the processor to operate without the logically deleted subdivision. The SE is further operable to determine that the processor is defective when a number of the defective subdivisions exceeds a threshold.

Merged Misr And Output Register Without Performance Impact For Circuits Under Test

US Patent:
7478297, Jan 13, 2009
Filed:
Oct 22, 2007
Appl. No.:
11/876036
Inventors:
Yuen H. Chan - Poughkeepsie NY, US
William V. Huott - Holmes NY, US
Pradip Patel - Poughkeepsie NY, US
Daniel Rodko - Wappingers Falls NY, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G01R 31/28
US Classification:
714726
Abstract:
The output register of an array and the Multiple Input Signature Register (MISR) logic is implemented with one set of L1/L2 master/slave latches and single additional slave latch. This new combined logic uses less critical area on a chip without a performance impact on the array access time or circuit testing.

Method For Self-Correcting Cache Using Line Delete, Data Logging, And Fuse Repair Correction

US Patent:
7529997, May 5, 2009
Filed:
Mar 14, 2005
Appl. No.:
11/079816
Inventors:
Patrick J. Meaney - Poughkeepsie NY, US
William V. Huott - Holmes NY, US
Thomas J. Knips - Wappingers Falls NY, US
David J. Lund - Staatsburg NY, US
Bryan L. Mechtly - Red Hook NY, US
Pradip Patel - Poughkeepsie NY, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G01R 31/28
US Classification:
714733, 714734, 714726, 714710, 365200
Abstract:
An apparatus and method for protecting a computer system from array reliability failures uses Array Built-In Self-Test logic along with code and hardware to delete cache lines or sets that are defective, identify corresponding fuse repair values, proactively call home if spare fuses are not available, schedule soft fuse repairs for the next system restart, schedule line deletes at the next restart, store delete and fuse repairs in a table (tagged with electronic serial id, timestamp of delete or ABIST fail event, address, and type of failure) and proactively call home if there were any missed deletes that were not logged. Fuse information can also be more permanently stored into hardware electronic fuses and/or EPROMs. During a restart, previous repairs are able to be applied to the machine so that ABIST will run successfully and previous deletes to be maintained with checking to allow some ABIST failures which are protected by the line deletes to pass.

Bist Address Generation Architecture For Multi-Port Memories

US Patent:
7536613, May 19, 2009
Filed:
May 11, 2004
Appl. No.:
10/843608
Inventors:
William Vincent Huott - Holmes NY, US
Pradip Patel - Poughkeepsie NY, US
Daniel Rodko - Wappingers Falls NY, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 29/00
G11C 7/10
US Classification:
714718, 36518904, 365201
Abstract:
Disclosed is testing multi-port array macros where latches and logic are used to control the relationship between the write and read port of the array. This makes allowance for many different configurations of reading and writing the array. This also allows for greater test coverage than the previous method, which simply inverted one of the write address bits to form the read address.

Isbn (Books And Publications)

Encyclopedia Of Food Microbiology

Author:
Pradip Patel
ISBN #:
0122270703

Possible Relatives

David Patel  Dawood M Patel  Daxa R Patel  Daxaben C Patel  Daxesh T Patel  Daxeshkumar B Patel  Dayalji D Patel  Pradip K Pramanik  Pradip K Das  Pradip V Jani 

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