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Qian Zhao, 42College Park, MD

Known as:
Qing Zhao Qui Zhao
Related to:
Qin Zhao 50 Qing Zhu 51

Qian Zhao Phones & Addresses

College Park, MD   

Santa Cruz, CA   

Atlanta, GA   

Titusville, FL   

Rockville, MD   

247 Rollins Ave APT 203, Rockville, MD 20852   

Education

School / High School: New York University School of Law

Ranks

Licence: New York - Due to reregister within 30 days of birthday Date: 1999
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Mentions for Qian Zhao

Career records & work history

Lawyers & Attorneys

Qian Zhao Photo 1

Qian Zhao - Lawyer

Address:
Skadden Arps Slate Meagher & Flom LLP
106-5055511 (Office)
Licenses:
New York - Due to reregister within 30 days of birthday 1999
Education:
New York University School of Law

Medicine Doctors

Qian Zhao

Specialties:
Cardiovascular Disease
Work:
Interventional Heart GroupCardiac Interventional Group
100 Prt Washington Blvd STE 105, Roslyn, NY 11576
516-3909640 (phone) 516-3909650 (fax)
Site
Education:
Medical School
The Fourth Military Med Univ, Xian City, Shaanxi, China
Graduated: 1995
Procedures:
Cardiac Stress Test, Continuous EKG, Echocardiogram, Electrocardiogram (EKG or ECG)
Conditions:
Acute Myocardial Infarction (AMI), Atrial Fibrillation and Atrial Flutter, Cardiac Arrhythmia, Conduction Disorders, Diabetes Mellitus (DM), Disorders of Lipoid Metabolism, Gastrointestinal Hemorrhage, Heart Failure, Hypertension (HTN), Ischemic Heart Disease, Overweight and Obesity, Pulmonary Embolism, Substance Abuse and/or Dependency, Acute Bronchitis, Acute Pancreatitis, Anemia, Angina Pectoris, Aortic Valvular Disease, Attention Deficit Disorder (ADD), Bipolar Disorder, Bronchial Asthma, Cardiomyopathy, Cholelethiasis or Cholecystitis, Chronic Renal Disease, Congenital Anomalies of the Heart, Diverticulitis, Epilepsy, Gastroesophageal Reflux Disease (GERD), Hypothyroidism, Infectious Liver Disease, Inguinal Hernia, Ischemic Stroke, Mitral Valvular Disease, Obstructive Sleep Apnea, Paroxysmal Supreventricular Tachycardia (PSVT), Peptic Ulcer Disease, Pneumonia, Poisoning by Drugs, Meds, or Biological Substances, Rheumatoid Arthritis, Septicemia, Sickle-Cell Disease, Skin and Subcutaneous Infections, Thoracid Aortic Aneurysm, Transient Cerebral Ischemia, Urinary Tract Infection (UT), Ventral Hernia
Languages:
English, Spanish
Description:
Dr. Zhao graduated from the The Fourth Military Med Univ, Xian City, Shaanxi, China in 1995. She works in Roslyn, NY and specializes in Cardiovascular Disease. Dr. Zhao is affiliated with Mid Hudson Regional Hospital Of Westchester Medical Center.
Qian Zhao Photo 2

Qian DR Zhao

Specialties:
Internal Medicine
Cardiovascular Disease
Cardiology
Education:
The Fourth Military Med Univ (1995)

License Records

Qian Zhao

Licenses:
License #: 40249 - Active
Category: Professional
Issued Date: Dec 11, 2003
Expiration Date: Dec 31, 2018

Resumes & CV records

Resumes

Qian Zhao Photo 39

Field Engineer  - Lwd, Drilling Service

Work:

Field Engineer  - Lwd, Drilling Service
Qian Zhao Photo 40

Qian Zhao

Qian Zhao Photo 41

Qian Zhao

Qian Zhao Photo 42

Qian Zhao

Qian Zhao Photo 43

Qian Zhao

Location:
United States
Qian Zhao Photo 44

Qian Zhao

Location:
United States
Qian Zhao Photo 45

Qian Zhao - San Jose, CA

Work:
UNIVERSITY OF EAST-WEST MEDICINE Nov 2013 to 2000
Primary Designated School Official UNIVERSITY OF EAST-WEST MEDICINE Nov 2013 to 2000
Registrar YT Consulting INC - Saratoga, CA May 2011 to 2013
Executive Assistant Dream Creation INC - Los Angeles, CA Jun 2009 to Aug 2010
Manager Assistant Silicon Valley Results Team - San Jose, CA Jan 2007 to Apr 2009
Real Estate Office Manager Silicon Valley Results Team - San Jose, CA Sep 2005 to Jan 2007
listing Coordinator
Education:
UCLA - Los Angeles, CA Mar 2011
Bachelor in Business Econ and Minor Accounting De Anza College - Cupertino, CA Jun 2009
Associate in Business and Computer Information Systems
Qian Zhao Photo 46

Qian Zhao - Ann Arbor, MI

Work:
Sharma Law Offices, LLC - Atlanta, GA Mar 2011 to Aug 2012
Law Clerk The Fogle Law Firm, LLC - Atlanta, GA Jul 2010 to Feb 2011
Law Clerk Henan Lunheng Law Firm Nov 2008 to Jul 2009
Legal Assistant
Education:
Emory University School of Law Aug 2009 to May 2010
Master of Laws Jilin University School of Law Sep 2003 to Jul 2007
Bachelor of Laws
Skills:
Experience on H-1B (off-site positions), PERM, I-140, I-485, I-131, I-765, RFE response, and PERM Audit response; Proficiency in Inszoom, iCERT Portal, FLC Permanent Online System, O*NET Online, Outlook, and MS Office; Fluency in English and Mandarin

Publications & IP owners

Us Patents

Triazolopyridine Compounds As Pim Kinase Inhibitors

US Patent:
2014004, Feb 13, 2014
Filed:
Oct 18, 2013
Appl. No.:
14/057882
Inventors:
Laura L. Celeste - Gaithersburg MD, US
T. Gregg Davis - Boulder CO, US
Robert Kirk DeLisle - Lyons CO, US
Julie Marie Hicks - Erie CO, US
Stefan D. Gross - Sudbury MA, US
Erik James Hicken - Boulder CO, US
Leila J. Jackson - Aurora CO, US
Nicholas C. Kallan - Louisville CO, US
Joseph P. Lyssikatos - Piedmont CA, US
Fredrik P. Marmsater - Boulder CO, US
Mark C. Munson - Acton MA, US
Jed Pheneger - Boulder CO, US
Bryson Rast - Westminster CO, US
John E. Robinson - Boulder CO, US
Stephen T. Schlachter - Dallas TX, US
George T. Topalov - Pittsburg PA, US
A. Dale Wright - Boulder CO, US
Qian Zhao - El Cerrito CA, US
Assignee:
Array BioPharma Inc. - Boulder CO
International Classification:
C07D 471/04
C07D 451/06
US Classification:
51421021, 51421707, 5142332, 514272, 514303
Abstract:
Provided herein is a method of treating a PIM-1 and/or PIM-2 and/or PIM-3 kinase-mediated condition in a mammal, which comprises administering to said mammal a therapeutically effective amount of a compound of Formula I:in which A, B, R, R, R, R, R, R, R, and Rhave the meanings given in the specification.

Prediction Data Selection For Model Calibration To Reduce Model Prediction Uncertainty

US Patent:
2022027, Sep 1, 2022
Filed:
Jun 15, 2020
Appl. No.:
17/625125
Inventors:
- Veldhoven, NL
Mu FENG - San Jose CA, US
Qian ZHAO - San Jose CA, US
Assignee:
ASML NETHERLANDS B.V. - Veldhoven
International Classification:
G03F 7/20
G03F 1/68
G03F 1/36
Abstract:
Systems and methods for reducing prediction uncertainty in a prediction model associated with a patterning process are described. These may be used in calibrating a process model associated with the patterning process, for example. Reducing the uncertainty in the prediction model may include determining a prediction uncertainty parameter based on prediction data. The prediction data may be determined using the prediction model. The prediction model may have been calibrated with calibration data. The prediction uncertainty parameter may be associated with variation in the prediction data. Reducing the uncertainty in the prediction model may include selecting a subset of process data based on the prediction uncertainty parameter; and recalibrating the prediction model using the calibration data and the selected subset of the process data.

Modeling Post-Exposure Processes

US Patent:
2021029, Sep 23, 2021
Filed:
Jul 27, 2017
Appl. No.:
16/324933
Inventors:
- Veldhoven, NL
Mu FENG - San Jose CA, US
Qian ZHAO - San Jose CA, US
Assignee:
ASML NETHERLANDS B.V. - Veldhoven
International Classification:
G03F 7/20
Abstract:
A process to model post-exposure effects in patterning processes, the process including: obtaining values based on measurements of structures formed on one or more substrates by a post-exposure process and values of a pair of process parameters by which process conditions were varied; modeling, by a processor system, as a surface, correlation between the values based on measurements of the structures and the values of the pair of process parameters; and storing the model in memory.

Method For Improving A Process For A Patterning Process

US Patent:
2021020, Jul 8, 2021
Filed:
May 14, 2019
Appl. No.:
17/059771
Inventors:
- Veldhoven, NL
Qian Zhao - San Jose CA, US
Yunbo GUO - San Jose CA, US
Yen-Wen LU - Saratoga CA, US
Mu FENG - San Jose CA, US
Qiang ZHANG - Campbell CA, US
Assignee:
ASML NETHERLANDS B.V. - Veldhoven
International Classification:
G03F 7/20
Abstract:
A method for improving a process model for a patterning process, the method including obtaining a) a measured contour from an image capture device, and b) a simulated contour generated from a simulation of the process model. The method also includes aligning the measured contour with the simulated contour by determining an offset between the measured contour and the simulated contour. The process model is calibrated to reduce a difference, computed based on the determined offset, between the simulated contour and the measured contour.

Measurement Method And Apparatus

US Patent:
2020015, May 21, 2020
Filed:
May 28, 2018
Appl. No.:
16/615207
Inventors:
- Veldhoven, NL
Qian ZHAO - San Jose CA, US
International Classification:
G03F 7/20
G03F 1/86
Abstract:
A method involving obtaining a simulation of a contour of a pattern to be formed on a substrate using a patterning process, determining a location of an evaluation point on the simulated contour of the pattern, the location spatially associated with a location of a corresponding evaluation point on a design layout for the pattern, and producing electronic information corresponding to a spatial bearing between the location of the evaluation point on the simulated contour and the location of the corresponding evaluation point on the design layout, wherein the information corresponding to the spatial bearing is configured for determining a location of an evaluation point on a measured image of at least part of the pattern, the evaluation point on the measured image spatially associated with the corresponding evaluation point on the design layout.

Etch Bias Characterization And Method Of Using The Same

US Patent:
2019035, Nov 21, 2019
Filed:
Feb 21, 2018
Appl. No.:
16/484582
Inventors:
- Veldhoven, NL
Mu FENG - San Jose CA, US
Qian ZHAO - San Jose CA, US
Assignee:
ASML NETHERLANDS B.V. - Veldhoven
International Classification:
G03F 7/20
H01L 21/66
G03F 1/80
Abstract:
A method involving determining an etch bias for a pattern to be etched using an etch step of a patterning process based on an etch bias model, the etch bias model including a formula having a variable associated with a spatial property of the pattern or with an etch plasma species concentration of the etch step, and including a mathematical term including a natural exponential function to the power of a parameter that is fitted or based on an etch time of the etch step; and adjusting the patterning process based on the determined etch bias.

High Aspect Ratio Capacitive Sensor Panel

US Patent:
2017009, Mar 30, 2017
Filed:
Aug 4, 2016
Appl. No.:
15/228942
Inventors:
- Cupertino CA, US
Sudip MONDAL - Santa Clara CA, US
Sagar Rajiv VAZE - Cupertino CA, US
Albert LIN - Cupertino CA, US
Qian ZHAO - Santa Clara CA, US
Chun-Hao TUNG - San Jose CA, US
Sunggu KANG - San Jose CA, US
John Z. ZHONG - Saratoga CA, US
International Classification:
G06F 3/044
Abstract:
High aspect ratio touch sensor panels are disclosed in which multiple row electrode blocks can be formed in a single row within an active area of the touch sensor panel, each row electrode block including a plurality of vertically adjacent row electrodes, or in some instances only one row electrode. In addition, each column electrode can be separated into multiple column electrode segments, each column electrode segment being vertically oriented and formed in a different column. The column electrode segments associated with any one column electrode can be spread out so that each of these column electrodes segments can be co-located and associated with a different row electrode block.

Device And Method For Classifying A Condition Based On Image Analysis

US Patent:
2017006, Mar 9, 2017
Filed:
Sep 13, 2016
Appl. No.:
15/264386
Inventors:
- Washington DC, US
Qian ZHAO - Hyattsville MD, US
Kenneth Rosenbaum - Silver Spring MD, US
Marshall Summar - Washington DC, US
Kazunori Okada - Los Angeles CA, US
Assignee:
Children's National Medical Center - Washington DC
International Classification:
G06K 9/00
Abstract:
An image analysis device includes circuitry that receives one or more input images and detects a plurality of anatomical landmarks on the one or more input images using a pre-determined face model. The circuitry extracts a plurality of geometric and local texture features based on the plurality of anatomical landmarks. The circuitry selects one or more condition-specific features from the plurality of geometric and local texture features. The circuitry classifies the one or more input images into one or more conditions based on the one or more condition-specific features.

Possible Relatives

Dayu C Zhao  Daisy Zhao  Danan Q Zhao  Ding J Zhao  Dong Zhao  Dongsheng Zhao  Elaine Zhao  Qian Lin  Qian Liu  Qian C Chen 

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