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Rebecca Y Chen, 473409 Crescent Ct, Plano, TX 75093

Related to:
Liuyan Chen 72 Cai F Chen 59 Yung Kong Chan 63

Rebecca Chen Phones & Addresses

3409 Crescent Ct, Plano, TX 75093   

Boston, MA   

Dallas, TX   

Education

School / High School: Plano Senior High School- Plano, TX 2011

Languages

English
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Mentions for Rebecca Y Chen

Career records & work history

Medicine Doctors

Rebecca Chen Photo 1

Rebecca Y Chen, Boston MA - BDS

Specialties:
Dentistry
Address:
706 Huntington Ave Suite 401, Boston, MA 02115
214-2334260 (Phone)
Languages:
English

Rebecca Chen

Specialties:
Internal Medicine
Work:
Penn-Del Medical Associates
2325 Macdade Blvd, Holmes, PA 19043
610-5321882 (phone) 610-5349580 (fax)
Pen-Del Medical Associates
1541 Chichester Ave, Marcus Hook, PA 19061
610-4851176 (phone) 610-4856780 (fax)
Languages:
English, Spanish
Description:
Ms. Chen works in Holmes, PA and 1 other location and specializes in Internal Medicine. Ms. Chen is affiliated with Riddle Hospital and Taylor Hospital.

Rebecca Chen resumes & CV records

Resumes

Rebecca Chen Photo 47

Rebecca Chen - Plano, TX

Publications & IP owners

Us Patents

Systems And Methods For Object Measurement

US Patent:
2021009, Mar 25, 2021
Filed:
Nov 30, 2020
Appl. No.:
17/107325
Inventors:
- Stamford CT, US
Trevor Glenn Elkins - Watertown MA, US
Lauren Anne Ko - Somerville MA, US
Rebecca Chen - Cambridge MA, US
Giorgos C. Zacharia - Winchester MA, US
International Classification:
G06T 7/62
G01B 11/02
G06K 9/00
G06K 9/22
Abstract:
Systems and methods for object measurement in accordance with aspects of the disclosure are described. One embodiment of the invention includes a system including a processor, a memory in communication with the processor, an input device, and an image capture device, wherein the processor obtains image data using the image capture device in response to input received from the input device indicating that image data should be captured, identifies a set of feature points within the obtained image data, completes the obtaining of the image data based on the set of feature points identified and in response to input received from the input device indicating that image data should no longer be captured, generates a model based on the set of feature points, measures the generated model with respect to a reference plane, and provides an indication of the measured size of the generated model.

Systems And Methods For Object Measurement

US Patent:
2020006, Feb 27, 2020
Filed:
Nov 9, 2018
Appl. No.:
16/186074
Inventors:
- Stamford CT, US
Trevor Glenn Elkins - Watertown MA, US
Lauren Anne Ko - Somerville MA, US
Rebecca Chen - Cambridge MA, US
Giorgos C. Zacharia - Winchester MA, US
International Classification:
G06T 7/62
G06K 9/22
G06K 9/00
G01B 11/02
Abstract:
Systems and methods for object measurement in accordance with aspects of the disclosure are described. One embodiment of the invention includes a system including a processor, a memory in communication with the processor, an input device, and an image capture device, wherein the processor obtains image data using the image capture device in response to input received from the input device indicating that image data should be captured, identifies a set of feature points within the obtained image data, completes the obtaining of the image data based on the set of feature points identified and in response to input received from the input device indicating that image data should no longer be captured, generates a model based on the set of feature points, measures the generated model with respect to a reference plane, and provides an indication of the measured size of the generated model.

Isbn (Books And Publications)

Patterns: Soa Client - Access Integration Solutions

Author:
Rebecca Chen
ISBN #:
0738496421

Possible Relatives

Cynthia Chen  David Chen  Cyril X Chen  Cyrus Y Chen  Dawei W Chen  De T Chen  Dafang Chen  Rebecca L Johnson  Rebecca L Standish  Rebecca L Johnston 

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