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Hui L WanCharlotte, MI

Known as:
Hui Lin Wan Wan Hui Lin Hui Wan Lin Lin Wan Hui Wan Lin Lin Wan Hui Lin Won Li Wan Lin Won Lin Wam

Hui Wan Phones & Addresses

Charlotte, MI   

New York, NY   

Ann Arbor, MI   

Brooklyn, NY   

Flushing, NY   

Eaton Rapids, MI   

261 Broome St APT 5D, New York, NY 10002    212-9257818   

Education

Degree: Associate degree or higher

Emails

h***[email protected]
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Mentions for Hui L Wan

Resumes & CV records

Resumes

Hui Wan Photo 19

Hui Hua Ada Wan

Work:
Bread for the World
Hunger Justice Leader New Sector Alliance since Sep 2010
Resident in Social Enterprise Legal Advocacy & Resource Center (AmeriCorps) Sep 2009 - Jul 2010
Paralegal Google Jan 2008 - Aug 2009
Account Coordinator InterVarsity Christian Fellowship/USA Sep 2007 - May 2008
Volunteer Staff Cambridge Community Fellowship Church Sep 2007 - Jan 2008
Administrator United Way of Central Indiana Jun 2004 - Aug 2004
Youth Leadership Initiative Intern
Education:
Harvard University 2003 - 2007
BA, Psychology Carmel High School
Hui Wan Photo 20

Hui Wan

Hui Wan Photo 21

Hui Wan

Publications & IP owners

Us Patents

Ranking Related Objects Using Blink Model Based Relation Strength Determinations

US Patent:
2017001, Jan 12, 2017
Filed:
Jul 6, 2015
Appl. No.:
14/791789
Inventors:
- Armonk NY, US
Hui Wan - White Plains NY, US
International Classification:
G06F 17/30
Abstract:
Mechanisms are provided for performing a cognitive operation. An input graph is received having a plurality of first nodes, where subsets of first nodes are coupled to one another via first edges and each first edge has an associated weight. A blinking graph model is generated based on the graph, where blink rates are associated with second edges and are calculated based on weights of corresponding first edges in the input graph. The blink rate specifies a fraction of time a corresponding second edge is determined to be present in the blinking graph model. A relatedness metric is calculated for a target node relative to a node of interest based on the blink rates of the second edges. The relatedness metric indicates a degree of relatedness of the target node to the node of interest. A cognitive operation is then performed based on the relatedness metric.

Possible Relatives

Danny H Wan  Evelyn Y Wan  Hong S Wan  Jane L Wan  Ji L Wan  Jie Wan  Jiangwen Z Wan  Hui S Jun  Hui T Lee  Hui Li 

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